{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T15:55:29Z","timestamp":1765209329139,"version":"3.46.0"},"publisher-location":"New York, NY, USA","reference-count":22,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,9,22]]},"DOI":"10.1145\/3655532.3655574","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T18:34:17Z","timestamp":1719599657000},"page":"243-247","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Fuzzing for Deep Learning Models"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-0318-1150","authenticated-orcid":false,"given":"Bo","family":"Wu","sequence":"first","affiliation":[{"name":"Hubei Key Laboratory of Intelligent Robotics, Wuhan Institute of Technology, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6359-801X","authenticated-orcid":false,"given":"Deng","family":"Chen","sequence":"additional","affiliation":[{"name":"Hubei Key Laboratory of Intelligent Robotics, Wuhan Institute of Technology, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2024,6,28]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"1","article-title":"Machine learning testing: Survey, landscapes and horizons","volume":"2022","author":"Zhang JM","unstructured":"Zhang JM, Harman M, Ma L, Liu Y. Machine learning testing: Survey, landscapes and horizons. IEEE Trans. on Software Engineering,2022, 48(1): 1\u201336.","journal-title":"IEEE Trans. on Software Engineering"},{"key":"e_1_3_2_1_2_1","volume-title":"Testing deep neural networks. arXiv:1803.04792","author":"Sun YC","year":"2018","unstructured":"Sun YC, Huang XW, Kroening D, Sharp J, Hill M, Ashmore R. Testing deep neural networks. arXiv:1803.04792, 2018."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosrev.2020.100270"},{"volume-title":"Proc. of the 2018 IEEE\/CVF Conf. on Computer Vision and Pattern Recognition. Salt Lake City: IEEE,2018","author":"Eykholt K","key":"e_1_3_2_1_4_1","unstructured":"Eykholt K, Evtimov I, Fernandes E, Li B, Rahmati A, Xiao CW, Prakash A, Kohno T, Song D. Robust physical-world attacks on deeplearning visual classification. In: Proc. of the 2018 IEEE\/CVF Conf. on Computer Vision and Pattern Recognition. Salt Lake City: IEEE,2018. 1625\u20131634."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-NIER.2019.00030"},{"key":"e_1_3_2_1_6_1","first-page":"67","article-title":"State of the Art","author":"Hongliang Liang","year":"2018","unstructured":"Hongliang Liang and Xiaoxiao Pei and Xiaodong Jia and Wuwei Shen and Jian Zhang Fuzzing: State of the Art IEEE Transactions on Reliability (2018):67.","journal-title":"IEEE Transactions on Reliability ("},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377811.3380415"},{"key":"e_1_3_2_1_8_1","volume-title":"Proc. of the 28th ACM SIGSOFT Int \u2019l Symp. on Software Testing and Analysis. Beijing: ACM","author":"DeepHunter","year":"2019","unstructured":"Xie XF, Ma L, Xu FJ, Xue MH, Chen HX, Liu Y, Zhao JJ, Li B, Yin JX, See S. DeepHunter: A coverage-guided fuzz testing framework for deep neural networks. In: Proc. of the 28th ACM SIGSOFT Int \u2019l Symp. on Software Testing and Analysis. Beijing: ACM, 2019.146\u2013157."},{"key":"e_1_3_2_1_9_1","first-page":"1162","article-title":"fuzzing for feedforward neural networks.In: Proc.of the 34th IEEE\/ACM Int'l Conf.on AutomatedSoftware Engineering (ASE).","author":"Xie XF","year":"2019","unstructured":"Xie XF,Chen HX, Li Y,Ma L, Liu Y, Zhao JJ.Coverage-guided fuzzing for feedforward neural networks.In: Proc.of the 34th IEEE\/ACM Int'l Conf.on AutomatedSoftware Engineering (ASE).San Diego:IEEE,2019.1162\u20131165.","journal-title":"San Diego:IEEE"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/3132747.3132785"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/3236024.3264835"},{"key":"e_1_3_2_1_12_1","volume-title":"Proc. of the 36th Int'l Conf. on Machine Learning. Long Beach: ICML","author":"Odena A","year":"2019","unstructured":"Odena A, Olsson C, Andersen D, Goodfellow I. Tensorfuzz: Debugging neural networks with coverage-guided fuzzing. In: Proc. of the 36th Int'l Conf. on Machine Learning. Long Beach: ICML, 2019. 4901\u20134911."},{"key":"e_1_3_2_1_13_1","volume-title":"Proc. of the 27th ACM SIGSAC Conf. on Computer and Communications Security. London: ACM","author":"Park LH","year":"2019","unstructured":"Park LH, Oh S, Kim J, Chung S, Kwon T. Poster: Effective layers in coverage metrics for deep neural networks. In: Proc. of the 27th ACM SIGSAC Conf. on Computer and Communications Security. London: ACM, 2019. 2681\u20132683."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/3238147.3238202"},{"key":"e_1_3_2_1_15_1","volume-title":"Proc. of the 27th ACM SIGSAC Conf. on Computer and Communications Security. London: ACM","author":"Park LH","year":"2019","unstructured":"Park LH, Oh S, Kim J, Chung S, Kwon T. Poster: Effective layers in coverage metrics for deep neural networks. In: Proc. of the 27th ACM SIGSAC Conf. on Computer and Communications Security. London: ACM, 2019. 2681\u20132683."},{"volume-title":"Proc. of the 2009 Conf. On","author":"Deng J","key":"e_1_3_2_1_16_1","unstructured":"Deng J, Dong W, Socher R, Li LJ, Li K, Li FF. ImageNet: A large-scale hierarchical image database. In: Proc. of the 2009 Conf. On"},{"key":"e_1_3_2_1_17_1","first-page":"248","author":"Computer Vision","year":"2009","unstructured":"Computer Vision and Pattern Recognition. Miami: IEEE, 2009. 248\u2013255.","journal-title":"IEEE"},{"key":"e_1_3_2_1_18_1","volume-title":"MNIST handwritten digit database. AT&T Labs","author":"LeCun Y","year":"2010","unstructured":"LeCun Y, Cortes C, Burges C. MNIST handwritten digit database. AT&T Labs. 2010."},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1016\/bs.adcom.2018.03.015"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/QRS-C.2018.00032"},{"volume-title":"An empirical study on TensorFlow program bugs[C]\/\/Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis. 2018: 129-140","author":"Zhang Y","key":"e_1_3_2_1_21_1","unstructured":"Zhang Y, Chen Y, Cheung S C, An empirical study on TensorFlow program bugs[C]\/\/Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis. 2018: 129-140."},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2019.00126"}],"event":{"name":"ICRSA 2023: 2023 the 6th International Conference on Robot Systems and Applications","acronym":"ICRSA 2023","location":"Wuhan China"},"container-title":["Proceedings of the 2023 6th International Conference on Robot Systems and Applications"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3655532.3655574","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3655532.3655574","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T15:18:07Z","timestamp":1765207087000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3655532.3655574"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,22]]},"references-count":22,"alternative-id":["10.1145\/3655532.3655574","10.1145\/3655532"],"URL":"https:\/\/doi.org\/10.1145\/3655532.3655574","relation":{},"subject":[],"published":{"date-parts":[[2023,9,22]]},"assertion":[{"value":"2024-06-28","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}