{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T05:05:02Z","timestamp":1750309502743,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":20,"publisher":"ACM","license":[{"start":{"date-parts":[[2025,1,20]],"date-time":"2025-01-20T00:00:00Z","timestamp":1737331200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2025,1,20]]},"DOI":"10.1145\/3658617.3697753","type":"proceedings-article","created":{"date-parts":[[2025,3,4]],"date-time":"2025-03-04T14:32:21Z","timestamp":1741098741000},"page":"622-627","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Learning Gate-level Netlist Testability in the Presence of Unknowns through Graph Neural Networks"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5498-0030","authenticated-orcid":false,"given":"Thai-Hoang","family":"Nguyen","sequence":"first","affiliation":[{"name":"Samsung Electronics, Hwaseong, Gyeonggi-do, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7787-4180","authenticated-orcid":false,"given":"Youngjin","family":"Ju","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Gyeonggi-do, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-2619-6386","authenticated-orcid":false,"given":"Dongsub","family":"Yoon","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Gyeonggi-do, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5380-0199","authenticated-orcid":false,"given":"Hyojin","family":"Choi","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, Gyeonggi-do, Republic of Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2025,3,4]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"2006 15th Asian Test Symposium. IEEE, 401--408","author":"Arai Masayuki","year":"2006","unstructured":"Masayuki Arai, Satoshi Fukumoto, and Kazuhiko Iwasaki. 2006. Expansion of convolutional compactors over Galois field. In 2006 15th Asian Test Symposium. IEEE, 401--408."},{"key":"e_1_3_2_1_2_1","volume-title":"Inductive representation learning on large graphs. Advances in neural information processing systems 30","author":"Hamilton Will","year":"2017","unstructured":"Will Hamilton, Zhitao Ying, and Jure Leskovec. 2017. Inductive representation learning on large graphs. Advances in neural information processing systems 30 (2017)."},{"key":"e_1_3_2_1_3_1","volume-title":"Inductive Representation Learning on Large Graphs. CoRR abs\/1706.02216","author":"Hamilton William L.","year":"2017","unstructured":"William L. Hamilton, Rex Ying, and Jure Leskovec. 2017. Inductive Representation Learning on Large Graphs. CoRR abs\/1706.02216 (2017). arXiv:1706.02216 http:\/\/arxiv.org\/abs\/1706.02216"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.098"},{"key":"e_1_3_2_1_5_1","volume-title":"Kipf and Max Welling","author":"Thomas","year":"2016","unstructured":"Thomas N. Kipf and Max Welling. 2016. Semi-Supervised Classification with Graph Convolutional Networks. CoRR abs\/1609.02907 (2016). arXiv:1609.02907 http:\/\/arxiv.org\/abs\/1609.02907"},{"key":"e_1_3_2_1_6_1","volume-title":"Proceedings of the 59th ACM\/IEEE Design Automation Conference. 667--672","author":"Li Min","year":"2022","unstructured":"Min Li, Sadaf Khan, Zhengyuan Shi, Naixing Wang, Huang Yu, and Qiang Xu. 2022. Deepgate: Learning neural representations of logic gates. In Proceedings of the 59th ACM\/IEEE Design Automation Conference. 667--672."},{"key":"e_1_3_2_1_7_1","volume-title":"Proceedings of the 56th Annual Design Automation Conference","author":"Ma Yuzhe","year":"2019","unstructured":"Yuzhe Ma, Haoxing Ren, Brucek Khailany, Harbinder Sikka, Lijuan Luo, Karthikeyan Natarajan, and Bei Yu. 2019. High performance graph convolutional networks with applications in testability analysis. In Proceedings of the 56th Annual Design Automation Conference 2019. 1--6."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.823341"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7548-5"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012631"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2878169"},{"key":"e_1_3_2_1_12_1","volume-title":"23rd IEEE VLSI Test Symposium (VTS'05)","author":"Rajski Janusz","year":"2005","unstructured":"Janusz Rajski and Jerzy Tyszer. 2005. Synthesis of X-tolerant convolutional compactors. In 23rd IEEE VLSI Test Symposium (VTS'05). IEEE, 114--119."},{"key":"e_1_3_2_1_13_1","volume-title":"International Test Conference. 745--754","author":"Rajski Janusz","year":"2003","unstructured":"Janusz Rajski, Jerzy Tyszer, Chen Wang, and Sudhakar M Reddy. 2003. Convolutional compaction of test responses. In International Test Conference. 745--754."},{"volume-title":"Machine Learning Applications in Electronic Design Automation","author":"Ren Haoxing","key":"e_1_3_2_1_14_1","unstructured":"Haoxing Ren and Jiang Hu. 2022. Machine Learning Applications in Electronic Design Automation. Springer."},{"key":"e_1_3_2_1_15_1","volume-title":"Fabrizio Frasca, Stephan G\u00fcnnemann, and Michael Bronstein.","author":"Rossi Emanuele","year":"2023","unstructured":"Emanuele Rossi, Bertrand Charpentier, Francesco Di Giovanni, Fabrizio Frasca, Stephan G\u00fcnnemann, and Michael Bronstein. 2023. Edge Directionality Improves Learning on Heterophilic Graphs. arXiv:2305.10498 [cs.LG] https:\/\/arxiv.org\/abs\/2305.10498"},{"key":"e_1_3_2_1_16_1","volume-title":"Automation & Test in Europe Conference & Exhibition (DATE). 972--977","author":"Scheibler Karsten","year":"2016","unstructured":"Karsten Scheibler, Dominik Erb, and Bernd Becker. 2016. Accurate CEGAR-based ATPG in presence of unknown values for large industrial designs. In 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE). 972--977."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","unstructured":"Yuyi Tang H.-J. Wunderlich H. Vranken F. Hapke M. Wittke P. Engelke I. Polian and B. Becker. 2004. X-masking during logic BIST and its impact on defect coverage. In 2004 International Conferce on Test. 442--451. 10.1109\/TEST.2004.1386980","DOI":"10.1109\/TEST.2004.1386980"},{"key":"e_1_3_2_1_18_1","unstructured":"Petar Veli\u010dkovi\u0107 Guillem Cucurull Arantxa Casanova Adriana Romero Pietro Li\u00f2 and Yoshua Bengio. 2018. Graph Attention Networks. arXiv:1710.10903 [stat.ML] https:\/\/arxiv.org\/abs\/1710.10903"},{"volume-title":"VLSI test principles and architectures: design for testability","author":"Wang Laung-Terng","key":"e_1_3_2_1_19_1","unstructured":"Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen. 2006. VLSI test principles and architectures: design for testability. Elsevier."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530410"}],"event":{"name":"ASPDAC '25: 30th Asia and South Pacific Design Automation Conference","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEICE","IPSJ","IEEE CAS","IEEE CEDA"],"location":"Tokyo Japan","acronym":"ASPDAC '25"},"container-title":["Proceedings of the 30th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3658617.3697753","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3658617.3697753","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T01:17:50Z","timestamp":1750295870000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3658617.3697753"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1,20]]},"references-count":20,"alternative-id":["10.1145\/3658617.3697753","10.1145\/3658617"],"URL":"https:\/\/doi.org\/10.1145\/3658617.3697753","relation":{},"subject":[],"published":{"date-parts":[[2025,1,20]]},"assertion":[{"value":"2025-03-04","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}