{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T21:00:31Z","timestamp":1773954031066,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":14,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,1,15]],"date-time":"2024-01-15T00:00:00Z","timestamp":1705276800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,1,15]]},"DOI":"10.1145\/3658835.3658843","type":"proceedings-article","created":{"date-parts":[[2024,6,12]],"date-time":"2024-06-12T12:19:06Z","timestamp":1718194746000},"page":"42-47","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Latent Bias Mitigation via Contrastive Learning"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3832-6861","authenticated-orcid":false,"given":"Yue","family":"Gao","sequence":"first","affiliation":[{"name":"Fujitsu R&D Center CO., Ltd, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8860-5885","authenticated-orcid":false,"given":"Shu","family":"Zhang","sequence":"additional","affiliation":[{"name":"Fujitsu R&D Center CO., Ltd, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0967-4859","authenticated-orcid":false,"given":"Jun","family":"Sun","sequence":"additional","affiliation":[{"name":"Fujitsu R&D Center CO., Ltd, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9804-9766","authenticated-orcid":false,"given":"Shan Shan","family":"Yu","sequence":"additional","affiliation":[{"name":"Research Center for AI Ethics, Fujitsu Limited., Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4138-7251","authenticated-orcid":false,"given":"Akihito","family":"Yoshii","sequence":"additional","affiliation":[{"name":"Research Center for AI Ethics, Fujitsu Limited., Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2024,6,12]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/3287560.3287594"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/3457607"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/MIS.2020.3000681"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1147\/JRD.2019.2942287"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/3278721.3278779"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSAA.2018.00029"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00922"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v35i3.16341"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.5555\/3524938.3525087"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.5555\/3495724.3497291"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01014"},{"key":"e_1_3_2_1_12_1","volume-title":"Proceedings of the 34th International Conference on Neural Information Processing Systems (NIPS\u201920)","author":"Nam Junhyun","year":"2020","unstructured":"Junhyun Nam, Hyuntak Cha, Sungsoo Ahn, Jaeho Lee, and Jinwoo Shin. 2020. Learning from failure: training debiased classifier from biased classifier. In Proceedings of the 34th International Conference on Neural Information Processing Systems (NIPS\u201920), NY, USA, 20673\u201320684. https:\/\/dl.acm.org\/doi\/abs\/10.5555\/3495724.3497460"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.5555\/3540261.3541186"},{"key":"e_1_3_2_1_14_1","volume-title":"Proceedings of the 32nd International Conference on Neural Information Processing Systems (NIPS\u201918)","author":"Zhang Zhilu","unstructured":"Zhilu Zhang and Mert R. Sabuncu. 2018. Generalized cross entropy loss for training deep neural networks with noisy labels. In Proceedings of the 32nd International Conference on Neural Information Processing Systems (NIPS\u201918), Montr\u00e9al Canada, 8792\u20138802. https:\/\/dl.acm.org\/doi\/abs\/10.5555\/3327546.3327555"}],"event":{"name":"AIEE 2024: 2024 5th International Conference on Artificial Intelligence in Electronics Engineering","location":"Bangkok Thailand","acronym":"AIEE 2024"},"container-title":["2024 5th International Conference on Artificial Intelligence in Electronics Engineering (AIEE)"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3658835.3658843","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3658835.3658843","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,26]],"date-time":"2025-08-26T13:25:20Z","timestamp":1756214720000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3658835.3658843"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,1,15]]},"references-count":14,"alternative-id":["10.1145\/3658835.3658843","10.1145\/3658835"],"URL":"https:\/\/doi.org\/10.1145\/3658835.3658843","relation":{},"subject":[],"published":{"date-parts":[[2024,1,15]]},"assertion":[{"value":"2024-06-12","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}