{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T02:10:50Z","timestamp":1755828650483,"version":"3.44.0"},"publisher-location":"New York, NY, USA","reference-count":35,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,12,22]],"date-time":"2023-12-22T00:00:00Z","timestamp":1703203200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,12,22]]},"DOI":"10.1145\/3660043.3660164","type":"proceedings-article","created":{"date-parts":[[2024,5,30]],"date-time":"2024-05-30T10:18:07Z","timestamp":1717064287000},"page":"678-683","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["A Framework of Operational Profile for AI Systems"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4955-7761","authenticated-orcid":false,"given":"Cong","family":"Pan","sequence":"first","affiliation":[{"name":"China Electronics Product Reliability and Environmental Testing Research Institute, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7642-9581","authenticated-orcid":false,"given":"Ai","family":"Gu","sequence":"additional","affiliation":[{"name":"China Electronics Product Reliability and Environmental Testing Research Institute, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-2256-5323","authenticated-orcid":false,"given":"Yan","family":"Gao","sequence":"additional","affiliation":[{"name":"China Electronics Product Reliability and Environmental Testing Research Institute, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2024,5,30]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"2021 IEEE\/ACIS 20th International Fall Conference on Computer and Information Science (ICIS Fall). IEEE","author":"Zhao Yi","year":"2021","unstructured":"Zhao, Yi, Yun Hu, and Jiayu Gong. \"Research on International Standardization of Software Quality and Software Testing.\" 2021 IEEE\/ACIS 20th International Fall Conference on Computer and Information Science (ICIS Fall). IEEE, 2021."},{"key":"e_1_3_2_1_2_1","unstructured":"Stoica Ion \"A berkeley view of systems challenges for ai.\" arXiv preprint arXiv:1712.05855 2017."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2020.1003021"},{"key":"e_1_3_2_1_4_1","volume-title":"safe and reliable machine learning.\" arXiv preprint arXiv:1904.07204","author":"Saria Suchi","year":"2019","unstructured":"Saria, Suchi, and Adarsh Subbaswamy. \"Tutorial: safe and reliable machine learning.\" arXiv preprint arXiv:1904.07204, 2019."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2022.2089854"},{"key":"e_1_3_2_1_6_1","volume-title":"Artificial Intelligence Incident Database: https:\/\/ incidentdatabase.ai, accessed","author":"Incident","year":"2023","unstructured":"AI Incident. [Online]. Artificial Intelligence Incident Database: https:\/\/ incidentdatabase.ai, accessed: July 24, 2023."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/52.199724"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/151299.151326"},{"key":"e_1_3_2_1_9_1","volume-title":"IEEE","author":"Ai Jun","year":"2012","unstructured":"Ai, Jun, Feng Zheng, and Jingwei Shang. \"A scenario modeling method for software reliability testing.\" 2012 International Conference on Systems and Informatics (ICSAI2012). IEEE, 2012."},{"key":"e_1_3_2_1_10_1","first-page":"452","article-title":"RELAI testing: a technique to assess and improve software reliability","volume":"5","author":"Cotroneo Domenico","year":"2015","unstructured":"Cotroneo, Domenico, Roberto Pietrantuono, and Stefano Russo. \"RELAI testing: a technique to assess and improve software reliability.\" IEEE Transactions on Software Engineering 42.5, 2015: 452-475.","journal-title":"IEEE Transactions on Software Engineering 42"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00766-022-00395-3"},{"key":"e_1_3_2_1_12_1","volume-title":"IEEE","author":"Belani Hrvoje","year":"2019","unstructured":"Belani, Hrvoje, Marin Vukovic, and \u017deljka Car. \"Requirements engineering challenges in building AI-based complex systems.\" 2019 IEEE 27th International Requirements Engineering Conference Workshops (REW). IEEE, 2019."},{"key":"e_1_3_2_1_13_1","volume-title":"A framework for Requirements specification of machine-learning systems.\" Conference on Software Engineering and Knowledge Engineering (SEKE)","author":"Wang Xi","year":"2022","unstructured":"Wang, Xi, and M. K. Miao. \"A framework for Requirements specification of machine-learning systems.\" Conference on Software Engineering and Knowledge Engineering (SEKE). Vol. 143. 2022."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00766-017-0278-6"},{"key":"e_1_3_2_1_15_1","volume-title":"Volume A-Volume A","author":"Cleland-Huang Jane","year":"2020","unstructured":"Cleland-Huang, Jane, \"Requirements-driven configuration of emergency response missions with small aerial vehicles.\" Proceedings of the 24th ACM Conference on Systems and Software Product Line: Volume A-Volume A. 2020."},{"key":"e_1_3_2_1_16_1","volume-title":"IEEE","author":"Pei Zhongyi","year":"2022","unstructured":"Pei, Zhongyi, \"Requirements engineering for machine learning: a review and reflection.\" 2022 IEEE 30th International Requirements Engineering Conference Workshops (REW). IEEE, 2022."},{"key":"e_1_3_2_1_17_1","volume-title":"IEEE","author":"Vogelsang Andreas","year":"2019","unstructured":"Vogelsang, Andreas, and Markus Borg. \"Requirements engineering for machine learning: Perspectives from data scientists.\" 2019 IEEE 27th International Requirements Engineering Conference Workshops (REW). IEEE, 2019."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.3390\/en12091696"},{"key":"e_1_3_2_1_19_1","volume-title":"IEEE","author":"Nakamichi Koji","year":"2020","unstructured":"Nakamichi, Koji, \"Requirements-driven method to determine quality characteristics and measurements for machine learning software and its evaluation.\" 2020 IEEE 28th International Requirements Engineering Conference (RE). IEEE, 2020."},{"key":"e_1_3_2_1_20_1","first-page":"265","article-title":"Requirements-driven test generation for autonomous vehicles with machine learning components","volume":"2","author":"Tuncali Cumhur Erkan","year":"2019","unstructured":"Tuncali, Cumhur Erkan, \"Requirements-driven test generation for autonomous vehicles with machine learning components.\" IEEE Transactions on Intelligent Vehicles 5.2, 2019: 265-280.","journal-title":"IEEE Transactions on Intelligent Vehicles 5"},{"key":"e_1_3_2_1_21_1","volume-title":"A systematic mapping study.\" Information and Software Technology","author":"Ahmad Khlood","year":"2023","unstructured":"Ahmad, Khlood, \"Requirements engineering for artificial intelligence systems: A systematic mapping study.\" Information and Software Technology, 2023: 107176."},{"key":"e_1_3_2_1_22_1","volume-title":"IEEE","author":"Bosio Alberto","year":"2019","unstructured":"Bosio, Alberto, \"A reliability analysis of a deep neural network.\" 2019 IEEE Latin American Test Symposium (LATS). IEEE, 2019."},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.3390\/app11146455"},{"key":"e_1_3_2_1_24_1","unstructured":"Tan Samson \"Reliability testing for natural language processing systems.\" arXiv preprint arXiv:2105.02590 2021."},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"crossref","unstructured":"Li Zenan \"Boosting operational DNN testing efficiency through conditioning.\" Proceedings of the 2019 27th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering. 2019.","DOI":"10.1145\/3338906.3338930"},{"key":"e_1_3_2_1_26_1","unstructured":"Zhao Xingyu \"Assessing the reliability of deep learning classifiers through robustness evaluation and operational profiles.\" arXiv preprint arXiv:2106.01258 2021."},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"crossref","unstructured":"Gladisch Christoph \"Leveraging combinatorial testing for safety-critical computer vision datasets.\" Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition Workshops. 2020.","DOI":"10.1109\/CVPRW50498.2020.00170"},{"key":"e_1_3_2_1_28_1","first-page":"1","article-title":"DeepGuard: a framework for safeguarding autonomous driving systems from inconsistent behaviour","volume":"1","author":"Hussain Manzoor","year":"2022","unstructured":"Hussain, Manzoor, Nazakat Ali, and Jang-Eui Hong. \"DeepGuard: a framework for safeguarding autonomous driving systems from inconsistent behaviour.\" Automated Software Engineering 29.1, 2022: 1.","journal-title":"Automated Software Engineering 29"},{"key":"e_1_3_2_1_29_1","volume-title":"PMLR","author":"Croce Francesco","year":"2020","unstructured":"Croce, Francesco, and Matthias Hein. \"Reliable evaluation of adversarial robustness with an ensemble of diverse parameter-free attacks.\" International conference on machine learning. PMLR, 2020."},{"key":"e_1_3_2_1_30_1","volume-title":"Automated whitebox testing of deep learning systems.\" proceedings of the 26th Symposium on Operating Systems Principles","author":"Pei Kexin","year":"2017","unstructured":"Pei, Kexin, \"Deepxplore: Automated whitebox testing of deep learning systems.\" proceedings of the 26th Symposium on Operating Systems Principles. 2017."},{"key":"e_1_3_2_1_31_1","volume-title":"Multi-granularity testing criteria for deep learning systems.\" Proceedings of the 33rd ACM\/IEEE international conference on automated software engineering","author":"Ma Lei","year":"2018","unstructured":"Ma, Lei, \"Deepgauge: Multi-granularity testing criteria for deep learning systems.\" Proceedings of the 33rd ACM\/IEEE international conference on automated software engineering. 2018."},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"crossref","unstructured":"Gerasimou Simos \"Importance-driven deep learning system testing.\" Proceedings of the ACM\/IEEE 42nd International Conference on Software Engineering. 2020.","DOI":"10.1145\/3377811.3380391"},{"key":"e_1_3_2_1_33_1","volume-title":"2021 International Joint Conference on Neural Networks (IJCNN). IEEE","author":"Sun Weidi","year":"2021","unstructured":"Sun, Weidi, Yuteng Lu, and Meng Sun. \"Are Coverage Criteria Meaningful Metrics for DNNs?.\" 2021 International Joint Conference on Neural Networks (IJCNN). IEEE, 2021."},{"key":"e_1_3_2_1_34_1","first-page":"1","article-title":"Software testing with an operational profile: OP definition","volume":"3","author":"Smidts Carol","year":"2014","unstructured":"Smidts, Carol, \"Software testing with an operational profile: OP definition.\" ACM Computing Surveys (CSUR) 46.3, 2014: 1-39.","journal-title":"ACM Computing Surveys (CSUR) 46"},{"key":"e_1_3_2_1_35_1","volume-title":"IEEE Computer Society","author":"Juhlin B. D.","year":"1992","unstructured":"Juhlin, B. D. \"Implementing operational profiles to measure system reliability.\" Proceedings Third International Symposium on Software Reliability Engineering. IEEE Computer Society, 1992."}],"event":{"name":"ICIEAI 2023: 2023 International Conference on Information Education and Artificial Intelligence","acronym":"ICIEAI 2023","location":"Xiamen China"},"container-title":["Proceedings of the 2023 International Conference on Information Education and Artificial Intelligence"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3660043.3660164","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3660043.3660164","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T12:18:12Z","timestamp":1755778692000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3660043.3660164"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,22]]},"references-count":35,"alternative-id":["10.1145\/3660043.3660164","10.1145\/3660043"],"URL":"https:\/\/doi.org\/10.1145\/3660043.3660164","relation":{},"subject":[],"published":{"date-parts":[[2023,12,22]]},"assertion":[{"value":"2024-05-30","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}