{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,8]],"date-time":"2026-02-08T06:12:30Z","timestamp":1770531150001,"version":"3.49.0"},"publisher-location":"New York, NY, USA","reference-count":37,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,6,18]],"date-time":"2024-06-18T00:00:00Z","timestamp":1718668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,6,18]]},"DOI":"10.1145\/3661167.3661181","type":"proceedings-article","created":{"date-parts":[[2024,6,14]],"date-time":"2024-06-14T12:24:25Z","timestamp":1718367865000},"page":"110-119","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Context Switch Sensitive Fault Localization"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8442-7970","authenticated-orcid":false,"given":"Ferenc","family":"Horv\u00e1th","sequence":"first","affiliation":[{"name":"Department of Software Engineering, University of Szeged, Hungary"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-0843-7738","authenticated-orcid":false,"given":"Roland","family":"Aszmann","sequence":"additional","affiliation":[{"name":"Department of Software Engineering, University of Szeged, Hungary"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1556-8267","authenticated-orcid":false,"given":"P\u00e9ter Attila","family":"Soha","sequence":"additional","affiliation":[{"name":"Department of Software Engineering, University of Szeged, Hungary"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5421-9302","authenticated-orcid":false,"given":"\u00c1rp\u00e1d","family":"Besz\u00e9des","sequence":"additional","affiliation":[{"name":"Department of Software Engineering, University of Szeged, Hungary"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2123-7387","authenticated-orcid":false,"given":"Tibor","family":"Gyim\u00f3thy","sequence":"additional","affiliation":[{"name":"Department of Software Engineering, University of Szeged, Hungary"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2024,6,18]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.06.035"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2009.25"},{"key":"e_1_3_2_1_3_1","volume-title":"Proc. of the Testing: Academic and Industrial Conf. Practice and Research Techniques - MUTATION. 89\u201398","author":"Abreu Rui","unstructured":"Rui Abreu, Peter Zoeteweij, and Arjan J.\u00a0C. van Gemund. 2007. On the Accuracy of Spectrum-based Fault Localization. In Proc. of the Testing: Academic and Industrial Conf. Practice and Research Techniques - MUTATION. 89\u201398."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2931049"},{"key":"e_1_3_2_1_5_1","volume-title":"Techniques","author":"Beizer Boris","unstructured":"Boris Beizer. 1990. Softw. Test. Techniques. Int. Thomson Computer Press, NY."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1572272.1572290"},{"key":"e_1_3_2_1_7_1","volume-title":"Practical nonparametric statistics. Vol.\u00a0350","author":"Conover William\u00a0Jay","unstructured":"William\u00a0Jay Conover. 1998. Practical nonparametric statistics. Vol.\u00a0350. John Wiley & Sons."},{"key":"e_1_3_2_1_8_1","volume-title":"Spectrum-based Software Fault Localization: A Survey of Techniques, Advances, and Challenges. CoRR abs\/1607.04347","author":"de Souza Higor\u00a0Amario","year":"2016","unstructured":"Higor\u00a0Amario de Souza, Marcos\u00a0Lordello Chaim, and Fabio Kon. 2016. Spectrum-based Software Fault Localization: A Survey of Techniques, Advances, and Challenges. CoRR abs\/1607.04347 (2016). arxiv:1607.04347"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2017.10.014"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/VISSOFT.2013.6650539"},{"key":"e_1_3_2_1_11_1","volume-title":"Effect sizes for research: A broad practical approach","author":"Grissom J","unstructured":"Robert\u00a0J Grissom and John\u00a0J Kim. 2005. Effect sizes for research: A broad practical approach.Lawrence Erlbaum Associates Publishers."},{"key":"e_1_3_2_1_12_1","first-page":"1","article-title":"Software debugging, testing, and verification","volume":"41","author":"Hailpern Brent","year":"2001","unstructured":"Brent Hailpern and Peter Santhanam. 2001. Software debugging, testing, and verification. IBM Systems Journal 41, 1 (Dec. 2001), 4\u201312.","journal-title":"IBM Systems Journal"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/277631.277647"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1002\/spe.2703"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-022-10190-x"},{"key":"e_1_3_2_1_16_1","first-page":"437","article-title":"Defects4J: A database of existing faults to enable controlled testing studies for Java programs. In Proc. of the 2014","author":"Just Ren\u00e9","year":"2014","unstructured":"Ren\u00e9 Just, Darioush Jalali, and Michael\u00a0D Ernst. 2014. Defects4J: A database of existing faults to enable controlled testing studies for Java programs. In Proc. of the 2014 Int. Sym. on Softw. Testing and Analysis. ACM, 437\u2013440.","journal-title":"Int. Sym. on Softw. Testing and Analysis. ACM"},{"key":"e_1_3_2_1_17_1","volume-title":"Proc. of the 25th Int. Sym. on Softw. Testing and Analysis - ISSTA 2016. ACM, NY, USA, 165\u2013176","author":"Kochhar S.","year":"2016","unstructured":"Pavneet\u00a0S. Kochhar, Xin Xia, David Lo, and Shanping Li. 2016. Practitioners\u2019 expectations on automated fault localization. In Proc. of the 25th Int. Sym. on Softw. Testing and Analysis - ISSTA 2016. ACM, NY, USA, 165\u2013176."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.5120\/ijca2016912206"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001445"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.62"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSREW.2012.15"},{"key":"e_1_3_2_1_22_1","volume-title":"Jaguar: A Spectrum-Based Fault Localization Tool for Real-World Software. In 2018 IEEE 11th Int. Conf. on Softw. Testing, Verification and Validation (ICST). 404\u2013409","author":"Ribeiro Henrique","year":"2018","unstructured":"Henrique Ribeiro, Roberto Andrioli\u00a0de Araujo, Marcos Chaim, Higor Souza, and Fabio Kon. 2018. Jaguar: A Spectrum-Based Fault Localization Tool for Real-World Software. In 2018 IEEE 11th Int. Conf. on Softw. Testing, Verification and Validation (ICST). 404\u2013409."},{"key":"e_1_3_2_1_23_1","volume-title":"Understanding the use of spectrum\u2010based fault localization. J. of Softw.: Evolution and Process (10","author":"Souza Higor","year":"2023","unstructured":"Higor Souza, Marcelo Lauretto, Fabio Kon, and Marcos Chaim. 2023. Understanding the use of spectrum\u2010based fault localization. J. of Softw.: Evolution and Process (10 2023), e2622."},{"key":"e_1_3_2_1_24_1","volume-title":"Effective Debugging: 66 Specific Ways to Debug Software and Systems","author":"Spinellis Diomidis","unstructured":"Diomidis Spinellis. 2016. Effective Debugging: 66 Specific Ways to Debug Software and Systems (1st ed.). Addison-Wesley Professional. 256 pages.","edition":"1"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2022.111429"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/QRS57517.2022.00032"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2285319"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2007.109"},{"key":"e_1_3_2_1_30_1","volume-title":"Large Systems. In 2016 IEEE Int. Conf on Softw. Maintenance and Evolution (ICSME). IEEE, 267\u2013278","author":"Xia Xin","year":"2016","unstructured":"Xin Xia, Lingfeng Bao, David Lo, and Shanping Li. 2016. \u201cAutomated Debugging Considered Harmful\u201d Considered Harmful: A User Study Revisiting the Usefulness of Spectra-Based Fault Localization Techniques with Professionals Using Real Bugs from Large Systems. In 2016 IEEE Int. Conf on Softw. Maintenance and Evolution (ICSME). IEEE, 267\u2013278."},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1145\/2522920.2522924"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194011005505"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME.2014.41"},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2023.107245"},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.array.2019.100008"},{"key":"e_1_3_2_1_36_1","volume-title":"Why Programs Fail","author":"Zeller Andreas","unstructured":"Andreas Zeller. 2009. Why Programs Fail, Second Edition: A Guide to Systematic Debugging (2nd ed.). Morgan Kaufmann Publishers Inc., CA, USA. 424 pages."},{"key":"e_1_3_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2892102"}],"event":{"name":"EASE 2024: 28th International Conference on Evaluation and Assessment in Software Engineering","location":"Salerno Italy","acronym":"EASE 2024"},"container-title":["Proceedings of the 28th International Conference on Evaluation and Assessment in Software Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3661167.3661181","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3661167.3661181","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T11:16:01Z","timestamp":1755861361000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3661167.3661181"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,18]]},"references-count":37,"alternative-id":["10.1145\/3661167.3661181","10.1145\/3661167"],"URL":"https:\/\/doi.org\/10.1145\/3661167.3661181","relation":{},"subject":[],"published":{"date-parts":[[2024,6,18]]},"assertion":[{"value":"2024-06-18","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}