{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:25:54Z","timestamp":1761582354472,"version":"3.44.0"},"publisher-location":"New York, NY, USA","reference-count":41,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,6,18]],"date-time":"2024-06-18T00:00:00Z","timestamp":1718668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,6,18]]},"DOI":"10.1145\/3661167.3661195","type":"proceedings-article","created":{"date-parts":[[2024,6,14]],"date-time":"2024-06-14T12:24:25Z","timestamp":1718367865000},"page":"160-169","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Improving classifier-based effort-aware software defect prediction by reducing ranking errors"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2756-9216","authenticated-orcid":false,"given":"Yuchen","family":"Guo","sequence":"first","affiliation":[{"name":"Xi'an Jiaotong University, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1874-6145","authenticated-orcid":false,"given":"Martin","family":"Shepperd","sequence":"additional","affiliation":[{"name":"Brunel University London, United Kingdom"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7394-0640","authenticated-orcid":false,"given":"Ning","family":"Li","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University, China"}]}],"member":"320","published-online":{"date-parts":[[2024,6,18]]},"reference":[{"volume-title":"The 18th IEEE International Symposium on Software Reliability (ISSRE\u201907)","author":"Arisholm E.","key":"e_1_3_2_1_1_1","unstructured":"E. Arisholm, L. Briand, and M. Fuglerud. 2007. Data mining techniques for building fault-proneness models in telecom java software. In The 18th IEEE International Symposium on Software Reliability (ISSRE\u201907). IEEE, 215\u2013224."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.06.055"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"crossref","unstructured":"Y. Benjamini and D. Yekutieli. 2001. The control of the false discovery rate in multiple testing under dependency. Annals of statistics (2001) 1165\u20131188.","DOI":"10.1214\/aos\/1013699998"},{"key":"e_1_3_2_1_4_1","unstructured":"G Boetticher. 2007. The PROMISE repository of empirical software engineering data. http:\/\/promisedata. org\/repository (2007)."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2017.08.004"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1007\/s10664-011-9173-9","article-title":"Evaluating defect prediction approaches: a benchmark and an extensive comparison","volume":"17","author":"D\u2019Ambros M.","year":"2012","unstructured":"M. D\u2019Ambros, M. Lanza, and R. Robbes. 2012. Evaluating defect prediction approaches: a benchmark and an extensive comparison. Empirical Software Engineering 17, 4\u20135 (2012), 531\u2013577.","journal-title":"Empirical Software Engineering"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.3390\/axioms11050205"},{"volume-title":"Proceedings of the 2017 11th joint meeting on foundations of software engineering. 72\u201383","author":"Fu W.","key":"e_1_3_2_1_8_1","unstructured":"W. Fu and T. Menzies. 2017. Revisiting unsupervised learning for defect prediction. In Proceedings of the 2017 11th joint meeting on foundations of software engineering. 72\u201383."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/3183440.3194992"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.103"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2017.01.002"},{"volume-title":"2017 IEEE International Conference on Software Maintenance and Evolution (ICSME). IEEE, 159\u2013170","author":"Huang Q.","key":"e_1_3_2_1_12_1","unstructured":"Q. Huang, X. Xia, and D. Lo. 2017. Supervised vs unsupervised models: A holistic look at effort-aware just-in-time defect prediction. In 2017 IEEE International Conference on Software Maintenance and Evolution (ICSME). IEEE, 159\u2013170."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-018-9661-2"},{"volume-title":"IEEE International Conference on Software Maintenance (ICSM2010)","author":"Kamei Y.","key":"e_1_3_2_1_14_1","unstructured":"Y. Kamei, S. Matsumoto, A. Monden, K. Matsumoto, B. Adams, and A. Hassan. 2010. Revisiting common bug prediction findings using effort-aware models. In IEEE International Conference on Software Maintenance (ICSM2010). IEEE, 1\u201310."},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.70"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"crossref","unstructured":"Y. Khatri and S. Singh. 2023. An effective feature selection based cross-project defect prediction model for software quality improvement. International Journal of System Assurance Engineering and Management (2023) 1\u201319.","DOI":"10.1007\/s13198-022-01831-x"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2008.35"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1049\/sfw2.12133"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2020.106364"},{"volume-title":"2017 ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM). IEEE, 11\u201319","author":"Liu J.","key":"e_1_3_2_1_20_1","unstructured":"J. Liu, Y. Zhou, Y. Yang, H. Lu, and B. Xu. 2017. Code churn: A neglected metric in effort-aware just-in-time defect prediction. In 2017 ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM). IEEE, 11\u201319."},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2022.3156787"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2014.11.023"},{"key":"e_1_3_2_1_23_1","volume-title":"Proceedings of the 5th International Conference on Predictor Models in Software Engineering (PROMISE","author":"Mende T.","year":"2009","unstructured":"T. Mende and R. Koschke. 2009. Revisiting the evaluation of defect prediction models. In Proceedings of the 5th International Conference on Predictor Models in Software Engineering (PROMISE 2009). ACM."},{"key":"e_1_3_2_1_24_1","volume-title":"14th European Conference on Software Maintenance and Re-engineering (CSMR","author":"Mende T.","year":"2010","unstructured":"T. Mende and R. Koschke. 2010. Effort-aware defect prediction models. In 14th European Conference on Software Maintenance and Re-engineering (CSMR 2010). IEEE, 107\u2013116."},{"key":"e_1_3_2_1_25_1","unstructured":"C. Ni X. Xia D. Lo X. Chen and Q. Gu. 2020. Revisiting supervised and unsupervised methods for effort-aware cross-project defect prediction. IEEE Transactions on Software Engineering (2020)."},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/3508479"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2021.106605"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/QRS-C55045.2021.00062"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2018.2836442"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2018.2794977"},{"key":"e_1_3_2_1_31_1","unstructured":"M. Tomczak and E. Tomczak. 2014. The need to report effect size estimates revisited. An overview of some recommended measures of effect size. (2014)."},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2017.03.007"},{"volume-title":"2015 IEEE International Conference on Software Quality, Reliability and Security. IEEE, 17\u201326","author":"Yang X.","key":"e_1_3_2_1_33_1","unstructured":"X. Yang, D. Lo, X. Xia, Y. Zhang, and J. Sun. 2015. Deep learning for just-in-time defect prediction. In 2015 IEEE International Conference on Software Quality, Reliability and Security. IEEE, 17\u201326."},{"volume-title":"Proceedings of the 1st ACM SIGSOFT International Workshop on Representation Learning for Software Engineering and Program Languages. 13\u201316","author":"Yang X.","key":"e_1_3_2_1_34_1","unstructured":"X. Yang, H. Yu, G. Fan, and K. Yang. 2020. A differential evolution-based approach for effort-aware just-in-time software defect prediction. In Proceedings of the 1st ACM SIGSOFT International Workshop on Representation Learning for Software Engineering and Program Languages. 13\u201316."},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194021500108"},{"volume-title":"24th ACM SIGSOFT International Symposium on Foundations of Software Engineering. ACM, 157\u2013168","author":"Yang Y.","key":"e_1_3_2_1_36_1","unstructured":"Y. Yang, Y. Zhou, J. Liu, Y. Zhao, H. Lu, L. Xu, B. Xu, and H. Leung. 2016. Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models. In 24th ACM SIGSOFT International Symposium on Foundations of Software Engineering. ACM, 157\u2013168."},{"key":"e_1_3_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2370048"},{"key":"e_1_3_2_1_38_1","doi-asserted-by":"crossref","unstructured":"X. Yu H. Dai L. Li X. Gu J. Keung K. Bennin F. Li and J. Liu. 2023. Finding the best learning to rank algorithms for effort-aware defect prediction. Information and Software Technology (2023) 107165.","DOI":"10.1016\/j.infsof.2023.107165"},{"key":"e_1_3_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2023.110941"},{"key":"e_1_3_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2023.107250"},{"key":"e_1_3_2_1_41_1","doi-asserted-by":"publisher","DOI":"10.1145\/3183339"}],"event":{"name":"EASE 2024: 28th International Conference on Evaluation and Assessment in Software Engineering","acronym":"EASE 2024","location":"Salerno Italy"},"container-title":["Proceedings of the 28th International Conference on Evaluation and Assessment in Software Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3661167.3661195","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3661167.3661195","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T11:13:41Z","timestamp":1755861221000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3661167.3661195"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,18]]},"references-count":41,"alternative-id":["10.1145\/3661167.3661195","10.1145\/3661167"],"URL":"https:\/\/doi.org\/10.1145\/3661167.3661195","relation":{},"subject":[],"published":{"date-parts":[[2024,6,18]]},"assertion":[{"value":"2024-06-18","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}