{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,25]],"date-time":"2025-07-25T10:21:26Z","timestamp":1753438886177,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2023,12,22]],"date-time":"2023-12-22T00:00:00Z","timestamp":1703203200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2023,12,22]]},"DOI":"10.1145\/3661638.3661721","type":"proceedings-article","created":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T22:28:59Z","timestamp":1717280939000},"page":"438-442","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Embedding Space Reconstruction to Enhance ANN for Industrial Process Fault Diagnosis"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-9099-0018","authenticated-orcid":false,"given":"Xiaoyi","family":"Cui","sequence":"first","affiliation":[{"name":"School of Computer Science and Engineering, Changchun University of Technology, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-9259-9514","authenticated-orcid":false,"given":"Hequan","family":"Han","sequence":"additional","affiliation":[{"name":"Machinery Technology Development Co Ltd, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-8422-0234","authenticated-orcid":false,"given":"Xingang","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Computer Science and Engineering, Changchun University of Technology, China"}]}],"member":"320","published-online":{"date-parts":[[2024,6]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"21","volume-title":"Ind. Electron. Soc.","volume":"2","author":"Jiang Y.","year":"2021","unstructured":"Y. Jiang, S. Yin, and O. Kaynak, \"Performance Supervised Plant-Wide Process Monitoring in Industry 4.0: A Roadmap,\" IEEE Open J. Ind. Electron. Soc., vol. 2, pp. 21-35, 2021."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3030179"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2767698"},{"issue":"16","key":"e_1_3_2_1_4_1","first-page":"153","article-title":"Locality preserving projections","volume":"16","author":"He X.","year":"2004","unstructured":"X. He, and N. Partha, \"Locality preserving projections,\" Proc. Adv. Neural Inf. Process. Syst., vol. 16, no. 16, pp. 153-160, 2004.","journal-title":"Proc. Adv. Neural Inf. Process. Syst."},{"key":"e_1_3_2_1_5_1","first-page":"1208","volume-title":"Proc. Eur. Conf. Comput. Vis. (ICCV'05)","volume":"1","author":"He X.","year":"2005","unstructured":"X. He, D. Cai, S. Yan. Zhang and H. J, \"Neighborhood preserving embedding,\" Proc. Eur. Conf. Comput. Vis. (ICCV'05), vol. 1, pp. 1208-1213, 2005."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3182774"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-021-01309-2"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11265-018-1378-3"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00975.R"}],"event":{"name":"AISNS 2023: 2023 International Conference on Artificial Intelligence, Systems and Network Security","acronym":"AISNS 2023","location":"Mianyang China"},"container-title":["Proceedings of the 2023 International Conference on Artificial Intelligence, Systems and Network Security"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3661638.3661721","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3661638.3661721","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T23:44:31Z","timestamp":1750290271000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3661638.3661721"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,22]]},"references-count":10,"alternative-id":["10.1145\/3661638.3661721","10.1145\/3661638"],"URL":"https:\/\/doi.org\/10.1145\/3661638.3661721","relation":{},"subject":[],"published":{"date-parts":[[2023,12,22]]},"assertion":[{"value":"2024-06-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}