{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:07:16Z","timestamp":1755907636103,"version":"3.44.0"},"publisher-location":"New York, NY, USA","reference-count":36,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,10,24]],"date-time":"2024-10-24T00:00:00Z","timestamp":1729728000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,10,24]]},"DOI":"10.1145\/3674805.3695407","type":"proceedings-article","created":{"date-parts":[[2024,10,15]],"date-time":"2024-10-15T18:39:24Z","timestamp":1729017564000},"page":"572-581","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Do Test and Environmental Complexity Increase Flakiness? An Empirical Study of SAP HANA"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-5248-6405","authenticated-orcid":false,"given":"Alexander","family":"Berndt","sequence":"first","affiliation":[{"name":"SAP, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9993-2814","authenticated-orcid":false,"given":"Thomas","family":"Bach","sequence":"additional","affiliation":[{"name":"SAP, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2442-7522","authenticated-orcid":false,"given":"Sebastian","family":"Baltes","sequence":"additional","affiliation":[{"name":"University of Bayreuth, Germany"}]}],"member":"320","published-online":{"date-parts":[[2024,10,24]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST57152.2023.00008"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00140"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1007\/s13222-022-00426-x"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2018.00076"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-021-10072-8"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2022.3208864"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180164"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/3639477.3639741"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM56168.2023.10304860"},{"key":"e_1_3_2_1_10_1","volume-title":"Research Design and Issues of Validity. Handbook of research methods in social and personality psychology","author":"Brewer B","year":"2000","unstructured":"Marilynn\u00a0B Brewer and William\u00a0D Crano. 2000. Research Design and Issues of Validity. Handbook of research methods in social and personality psychology (2000), 3\u201316."},{"key":"e_1_3_2_1_11_1","unstructured":"SciPy Community. 2024. SciPy Docs - Mann-Whitney U. SciPy. https:\/\/docs.scipy.org\/doc\/scipy\/reference\/generated\/scipy.stats.mannwhitneyu.htmlAccessed 2024-07-31."},{"key":"e_1_3_2_1_12_1","unstructured":"SciPy Community. 2024. SciPy Docs - Pearsonr. SciPy. https:\/\/docs.scipy.org\/doc\/scipy\/reference\/generated\/scipy.stats.pearsonr.htmlAccessed 2024-07-26."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE51524.2021.9678918"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/3379597.3387460"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/3338906.3338945"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1145\/3510457.3513038"},{"key":"e_1_3_2_1_17_1","first-page":"28","article-title":"The SAP HANA Database\u2013An Architecture Overview.IEEE Data","volume":"35","author":"F\u00e4rber Franz","year":"2012","unstructured":"Franz F\u00e4rber, Norman May, Wolfgang Lehner, Philipp Gro\u00dfe, Ingo M\u00fcller, Hannes Rauhe, and Jonathan Dees. 2012. The SAP HANA Database\u2013An Architecture Overview.IEEE Data Eng. Bull. 35, 1 (2012), 28\u201333.","journal-title":"Eng. Bull."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2022.3201209"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST53961.2022.00020"},{"volume-title":"From Start-ups to Scale-ups: Opportunities and Open Problems for Static and Dynamic Program Analysis. In 2018 IEEE 18Th international working conference on source code analysis and manipulation (SCAM)","author":"Harman Mark","key":"e_1_3_2_1_20_1","unstructured":"Mark Harman and Peter O\u2019Hearn. 2018. From Start-ups to Scale-ups: Opportunities and Open Problems for Static and Dynamic Program Analysis. In 2018 IEEE 18Th international working conference on source code analysis and manipulation (SCAM). IEEE, IEEE, 1\u201323."},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377813.3381370"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1145\/3377811.3381749"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2019.00038"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE5003.2020.00045"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/3428270"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3473931"},{"key":"e_1_3_2_1_27_1","volume-title":"On the Impact of Hitting System Resource Limits on Test Flakiness. In 2024 International Flaky Tests Workshop 2024 (FTW\u201924)","author":"Leinen Fabian","year":"2024","unstructured":"Fabian Leinen, Alexander Perathoner, and Alexander Pretschner. 2024. On the Impact of Hitting System Resource Limits on Test Flakiness. In 2024 International Flaky Tests Workshop 2024 (FTW\u201924). Association for Computing Machinery, New York, NY, USA, 14\u201319."},{"key":"e_1_3_2_1_28_1","unstructured":"Jeff Listfield. 2020. Where do our Flaky Tests Come From? Google. https:\/\/testing.googleblog.com\/2017\/04\/where-do-our-flaky-tests-come-from.html2024-07-14 archived by Internet Archive at http:\/\/web.archive.org\/web\/20221113232600\/https:\/\/testing.googleblog.com\/2017\/04\/where-do-our-flaky-tests-come-from.html."},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE-SEIP.2017.16"},{"key":"e_1_3_2_1_30_1","unstructured":"John Micco. 2017. The State of Continuous Integration Testing at Google. https:\/\/static.googleusercontent.com\/media\/research.google.com\/en\/\/pubs\/archive\/45880.pdf ICST Keynote accessed 2024-09-07."},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1145\/3476105"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1145\/3379597.3387482"},{"key":"e_1_3_2_1_33_1","volume-title":"Static Test Flakiness Prediction: How far can we go?Empirical Software Engineering 27, 7","author":"Pontillo Valeria","year":"2022","unstructured":"Valeria Pontillo, Fabio Palomba, and Filomena Ferrucci. 2022. Static Test Flakiness Prediction: How far can we go?Empirical Software Engineering 27, 7 (2022), 187."},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1145\/3210459.3210461"},{"key":"e_1_3_2_1_35_1","unstructured":"scikit Learn. 2024. scikit-learn Docs. Scikit-Learn. https:\/\/scikit-learn.org\/stable\/modules\/generated\/sklearn.preprocessing.MinMaxScaler.htmlAccessed on 2024-07-28."},{"key":"e_1_3_2_1_36_1","volume-title":"The Effects of Computational Resources on Flaky Tests. arXiv preprint arXiv:2310.12132 abs\/2310.12132","author":"Silva Denini","year":"2023","unstructured":"Denini Silva, Martin Gruber, Satyajit Gokhale, Ellen Arteca, Alexi Turcotte, Marcelo d\u2019Amorim, Wing Lam, Stefan Winter, and Jonathan Bell. 2023. The Effects of Computational Resources on Flaky Tests. arXiv preprint arXiv:2310.12132 abs\/2310.12132 (2023)."}],"event":{"name":"ESEM '24: ACM \/ IEEE International Symposium on Empirical Software Engineering and Measurement","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering"],"location":"Barcelona Spain","acronym":"ESEM '24"},"container-title":["Proceedings of the 18th ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3674805.3695407","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3674805.3695407","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,22]],"date-time":"2025-08-22T12:56:36Z","timestamp":1755867396000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3674805.3695407"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,24]]},"references-count":36,"alternative-id":["10.1145\/3674805.3695407","10.1145\/3674805"],"URL":"https:\/\/doi.org\/10.1145\/3674805.3695407","relation":{},"subject":[],"published":{"date-parts":[[2024,10,24]]},"assertion":[{"value":"2024-10-24","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}