{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T12:43:50Z","timestamp":1780317830422,"version":"3.54.1"},"publisher-location":"New York, NY, USA","reference-count":48,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T00:00:00Z","timestamp":1731974400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100006374","name":"NSF (National Science Foundation)","doi-asserted-by":"publisher","award":["2338069"],"award-info":[{"award-number":["2338069"]}],"id":[{"id":"10.13039\/501100006374","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,11,19]]},"DOI":"10.1145\/3689939.3695784","type":"proceedings-article","created":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T18:21:00Z","timestamp":1732040460000},"page":"68-77","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":5,"title":["BackMon: IC Backside Tamper Detection using On-Chip Impedance Monitoring"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4816-1623","authenticated-orcid":false,"given":"Tahoura","family":"Mosavirik","sequence":"first","affiliation":[{"name":"Worcester Polytechnic Institute, Worcester, Massachusetts, United States"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3752-2358","authenticated-orcid":false,"given":"Shahin","family":"Tajik","sequence":"additional","affiliation":[{"name":"Worcester Polytechnic Institute, Worcester, Massachusetts, United States"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2024,11,19]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2019.00015"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.06.099"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.31399\/asm.cp.istfa2023p0339"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2018.8452604"},{"key":"e_1_3_2_1_5_1","unstructured":"Hany Fahmy Jack Carrel Ray Anderson and Harry Fu. 2012. Simulating FPGA Power Integrity Using S-Parameter Models. (2012)."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2848460"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-57543-3_2"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516717"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA55383.2022.9915714"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2018.8383890"},{"key":"e_1_3_2_1_11_1","first-page":"310","article-title":"Method and system for measuring the impedance of the power distribution network in programmable logic device applications","volume":"9","author":"Iorga Cosmin","year":"2016","unstructured":"Cosmin Iorga. 2016. Method and system for measuring the impedance of the power distribution network in programmable logic device applications. US Patent 9,310,432.","journal-title":"US Patent"},{"key":"e_1_3_2_1_12_1","volume-title":"Solve Power Integrity Problems in FPGA Systems Using an Embedded Vector Network Analyzer. Signal Integrity Journal","author":"Iorga Cosmin","year":"2018","unstructured":"Cosmin Iorga. 2018. Solve Power Integrity Problems in FPGA Systems Using an Embedded Vector Network Analyzer. Signal Integrity Journal (2018)."},{"key":"e_1_3_2_1_13_1","first-page":"560","article-title":"FPGA configured vector network analyzer for measuring the Z parameter and S parameter models of the power distribution network in FPGA systems","volume":"10","author":"Iorga Cosmin","year":"2020","unstructured":"Cosmin Iorga. 2020. FPGA configured vector network analyzer for measuring the Z parameter and S parameter models of the power distribution network in FPGA systems. US Patent 10,560,075.","journal-title":"US Patent"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2010.2100079"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/SP40001.2021.00029"},{"key":"e_1_3_2_1_16_1","volume-title":"30th USENIX security symposium (USENIX security 21). 627--644.","author":"Krachenfels Thilo","unstructured":"Thilo Krachenfels, Tuba Kiyan, Shahin Tajik, and Jean-Pierre Seifert. 2021. Automatic Extraction of Secrets from the Transistor Jungle using Laser-Assisted Side-Channel Attacks. In 30th USENIX security symposium (USENIX security 21). 627--644."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/19.377836"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2012.6248905"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3005779"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184683"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1145\/3513087"},{"key":"e_1_3_2_1_22_1","volume-title":"Maryam Saadat Safa, and Shahin Tajik.","author":"Mosavirik Tahoura","year":"2023","unstructured":"Tahoura Mosavirik, Saleh Khalaj Monfared, Maryam Saadat Safa, and Shahin Tajik. 2023. Silicon Echoes: Non-Invasive Trojan and Tamper Detection using Frequency-Selective Impedance Analysis. IACR Transactions on Cryptographic Hardware and Embedded Systems (2023), 238--261."},{"key":"e_1_3_2_1_23_1","first-page":"301","article-title":"ImpedanceVerif: On-Chip Impedance Sensing for System-Level Tampering Detection","volume":"1","author":"Mosavirik Tahoura","year":"2023","unstructured":"Tahoura Mosavirik, Patrick Schaumont, and Shahin Tajik. 2023. ImpedanceVerif: On-Chip Impedance Sensing for System-Level Tampering Detection. IACR Transactions on Cryptographic Hardware and Embedded Systems, Vol. 1 (2023), 301--325.","journal-title":"IACR Transactions on Cryptographic Hardware and Embedded Systems"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3073946"},{"key":"e_1_3_2_1_25_1","volume-title":"Prediction and verification of power\/ground plane edge radiation excited by through-hole signal via based on balanced TLM and via coupling model","author":"Pak Jun So","unstructured":"Jun So Pak, Junwoo Lee, Hyungsoo Kim, and Joungho Kim. 2003. Prediction and verification of power\/ground plane edge radiation excited by through-hole signal via based on balanced TLM and via coupling model. In Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710). IEEE, 181--184."},{"key":"e_1_3_2_1_26_1","unstructured":"PIScanner. [n. d.]. PIScanner -- FPGA Configured Vector Network Analyze. https:\/\/storage.googleapis.com\/wzukusers\/user-29188536\/documents\/5c12c1352367bAich15I\/datasheet_piscanner.pdf."},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3027711"},{"key":"e_1_3_2_1_28_1","volume-title":"Fields and waves in communication electronics","author":"Ramo Simon","unstructured":"Simon Ramo, John R Whinnery, and Theodore Van Duzer. 1994. Fields and waves in communication electronics. John Wiley & Sons."},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2009.5284628"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS57882.2023.10139623"},{"key":"e_1_3_2_1_31_1","volume-title":"Formulation and Network Reduction to a Physics Based Model for Analysis of the Power Distribution Network in a Production Level Multi-layered Printed Circuit Board","author":"Shringarpure K","year":"2014","unstructured":"K Shringarpure, S Pan, J Kim, B Achkir, B Archambeault, J Drewniak, and J Fan. 2014. Formulation and Network Reduction to a Physics Based Model for Analysis of the Power Distribution Network in a Production Level Multi-layered Printed Circuit Board. IEEE Transactions on Electromagnetic Compatibility (2014)."},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2014.6898973"},{"key":"e_1_3_2_1_33_1","volume-title":"Principles of power integrity for PDN design--simplified: robust and cost effective design for high speed digital products","author":"Smith Larry D","unstructured":"Larry D Smith and Eric Bogatin. 2017. Principles of power integrity for PDN design--simplified: robust and cost effective design for high speed digital products. Prentice Hall."},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2022.3201673"},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1109\/SP46214.2022.9833631"},{"key":"e_1_3_2_1_36_1","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2004.831897"},{"key":"e_1_3_2_1_37_1","volume-title":"Laser Fault Attack on Physically Unclonable Functions. In 2015 workshop on fault diagnosis and tolerance in cryptography (FDTC). IEEE, 85--96","author":"Tajik Shahin","year":"2015","unstructured":"Shahin Tajik, Heiko Lohrke, Fatemeh Ganji, Jean-Pierre Seifert, and Christian Boit. 2015. Laser Fault Attack on Physically Unclonable Functions. In 2015 workshop on fault diagnosis and tolerance in cryptography (FDTC). IEEE, 85--96."},{"key":"e_1_3_2_1_38_1","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3134039"},{"key":"e_1_3_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2014.64"},{"key":"e_1_3_2_1_40_1","unstructured":"TestEquity. 2019. TestEquity Model 106 and 107 Temperature Chamber Operation and Service Manual. https:\/\/www.testequity.com\/UserFiles\/documents\/pdfs\/106--107.pdf."},{"key":"e_1_3_2_1_41_1","volume-title":"YACC: Yet Another Conference on Cryptography. Citeseer.","author":"Ordas K TOBICH, P MAURINE, T","year":"2012","unstructured":"K TOBICH, P MAURINE, T Ordas, and PY Liardet. 2012. Yet another fault injection technique: by forward body biasing injection. In YACC: Yet Another Conference on Cryptography. Citeseer."},{"key":"e_1_3_2_1_42_1","first-page":"110","article-title":"Secure embedded systems","volume":"22","author":"Vai Michael","year":"2016","unstructured":"Michael Vai, David J Whelihan, Benjamin R Nahill, Daniil M Utin, Sean R OMelia, and Roger I Khazan. 2016. Secure embedded systems. Lincoln Laboratory Journal, Vol. 22, 1 (2016), 110--122.","journal-title":"Lincoln Laboratory Journal"},{"key":"e_1_3_2_1_43_1","unstructured":"Xilinx. 2021. Kria K26 SOM Thermal Design Guide. https:\/\/docs.xilinx.com\/r\/en-US\/ug1090-k26-thermal-design\/Thermal-Solution-Installation-Examples."},{"key":"e_1_3_2_1_44_1","unstructured":"Xilinx. 2022. Kria KV260 Vision AI Starter Kit Data Sheet. https:\/\/docs.xilinx.com\/r\/en-US\/ds986-kv260-starter-kit\/Summary."},{"key":"e_1_3_2_1_45_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2927742"},{"key":"e_1_3_2_1_46_1","volume-title":"FPGA-based Remote Power Side-channel Attacks. In 2018 IEEE Symposium on Security and Privacy (SP). IEEE, 229--244","author":"Zhao Mark","year":"2018","unstructured":"Mark Zhao and G Edward Suh. 2018. FPGA-based Remote Power Side-channel Attacks. In 2018 IEEE Symposium on Security and Privacy (SP). IEEE, 229--244."},{"key":"e_1_3_2_1_47_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2808907"},{"key":"e_1_3_2_1_48_1","volume-title":"PDNPulse: Sensing PCB anomaly with the intrinsic power delivery network","author":"Zhu Huifeng","year":"2023","unstructured":"Huifeng Zhu, Haoqi Shan, Dean Sullivan, Xiaolong Guo, Yier Jin, and Xuan Zhang. 2023. PDNPulse: Sensing PCB anomaly with the intrinsic power delivery network. IEEE Transactions on Information Forensics and Security (2023)."}],"event":{"name":"CCS '24: ACM SIGSAC Conference on Computer and Communications Security","location":"Salt Lake City UT USA","acronym":"CCS '24","sponsor":["SIGSAC ACM Special Interest Group on Security, Audit, and Control"]},"container-title":["Proceedings of the 2024 Workshop on Attacks and Solutions in Hardware Security"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3689939.3695784","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3689939.3695784","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T18:20:41Z","timestamp":1755973241000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3689939.3695784"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,19]]},"references-count":48,"alternative-id":["10.1145\/3689939.3695784","10.1145\/3689939"],"URL":"https:\/\/doi.org\/10.1145\/3689939.3695784","relation":{},"subject":[],"published":{"date-parts":[[2024,11,19]]},"assertion":[{"value":"2024-11-19","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}