{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T20:32:26Z","timestamp":1783715546950,"version":"3.55.0"},"reference-count":129,"publisher":"Association for Computing Machinery (ACM)","issue":"1","license":[{"start":{"date-parts":[[2024,10,7]],"date-time":"2024-10-07T00:00:00Z","timestamp":1728259200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"DASHH","award":["HIDSS-0002"],"award-info":[{"award-number":["HIDSS-0002"]}]},{"name":"German Federal Ministry of Education and Research c-ray4edge C-ray4edge with grant C-ray4edge c-ray4edge"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Comput. Surv."],"published-print":{"date-parts":[[2025,1,31]]},"abstract":"<jats:p>Embedded digital devices are progressively deployed in dependable or safety-critical systems. These devices undergo significant hardware ageing, particularly in harsh environments. This increases their likelihood of failure. It is crucial to understand ageing processes and to detect hardware degradation early for guaranteeing system dependability. In this survey, we review the core ageing mechanisms, and identify and categorize general working principles of ageing detection and monitoring techniques for Commercial-Off-the-Shelf (COTS) components that are prevalent in embedded systems: Field Programmable Gate Arrays (FPGAs), microcontrollers, Systems-on-Chips (SoCs), and their power supplies. From our review, we find that online techniques are more widely applied on FPGAs than on other components, and see a rising trend towards machine learning application for analysing hardware ageing. Based on the reviewed literature, we identify research opportunities and potential directions of interest in the field. With this work, we intend to facilitate future research by systematically presenting all main approaches in a concise way.<\/jats:p>","DOI":"10.1145\/3695247","type":"journal-article","created":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T13:50:18Z","timestamp":1725630618000},"page":"1-34","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":14,"title":["A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems"],"prefix":"10.1145","volume":"57","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9804-7258","authenticated-orcid":false,"given":"Leandro","family":"Lanzieri","sequence":"first","affiliation":[{"name":"Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7838-3844","authenticated-orcid":false,"given":"Gianluca","family":"Martino","sequence":"additional","affiliation":[{"name":"Institute of Embedded Systems, TU Hamburg, Hamburg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6433-6265","authenticated-orcid":false,"given":"Goerschwin","family":"Fey","sequence":"additional","affiliation":[{"name":"Institute of Embedded Systems, TU Hamburg, Hamburg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4115-5183","authenticated-orcid":false,"given":"Holger","family":"Schlarb","sequence":"additional","affiliation":[{"name":"Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0956-7885","authenticated-orcid":false,"given":"Thomas C.","family":"Schmidt","sequence":"additional","affiliation":[{"name":"Computer Science, HAW Hamburg, Hamburg, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3825-2807","authenticated-orcid":false,"given":"Matthias","family":"W\u00e4hlisch","sequence":"additional","affiliation":[{"name":"Computer Science, TU Dresden, Dresden, Germany and Barkhausen Institut, Dresden, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2024,10,7]]},"reference":[{"key":"e_1_3_1_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3294111"},{"key":"e_1_3_1_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC52499.2021.9739311"},{"key":"e_1_3_1_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2019.8870552"},{"key":"e_1_3_1_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3023684"},{"key":"e_1_3_1_6_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108676"},{"key":"e_1_3_1_7_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2014.6927390"},{"key":"e_1_3_1_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2011.66"},{"key":"e_1_3_1_9_2","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2018.2815038"},{"key":"e_1_3_1_10_2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-44318-8_12"},{"key":"e_1_3_1_11_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.885952"},{"key":"e_1_3_1_12_2","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.2885"},{"key":"e_1_3_1_13_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113809"},{"key":"e_1_3_1_14_2","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16754"},{"key":"e_1_3_1_15_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2022.166727"},{"key":"e_1_3_1_16_2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2013.2272195"},{"key":"e_1_3_1_17_2","doi-asserted-by":"publisher","DOI":"10.1109\/EMCCompo.2017.7998086"},{"key":"e_1_3_1_18_2","doi-asserted-by":"publisher","DOI":"10.34385\/proc.18.13A2-A4"},{"key":"e_1_3_1_19_2","first-page":"109","volume-title":"Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems \u2014 MIXDES 2013","author":"Branlard Julien","year":"2013","unstructured":"Julien Branlard, Gohar Ayvazyan, Valeri Ayvazyan, Mariusz Grecki, Matthias Hoffmann, Tomasz Je\u017cy\u0144ski, Frank Ludwig, Uros Mavri\u010d, Sven Pfeiffer, Holger Schlarb, Christian Schmidt, Henning Weddig, Bin Yang, Pawe\u0142 Barmuta, Samer Bou Habib, \u0141ukasz Butkowski, Krzysztof Czuba, Maciej Grzegrz\u00f3\u0142ka, Ewa Janas, Jan Piekarski, Igor Rutkowski, Dominik Sikora, \u0141ukasz Zembala, Mateusz \u017bukoci\u0144ski, Wojciech Cichalewski, Wojciech Ja\u0142mu\u017cna, Dariusz Makowski, Aleksander Mielczarek, Andrzej Napieralski, Piotr Perek, Adam Piotrowski, Tomasz Po\u017aniak, Konrad Przygoda, Grzegorz Bo\u0142truczyk, Stefan Korolczuk, Maciej Kud\u0142a, Jaros\u0142aw Szewi\u0144ski, Krzysztof Oliwa, and Wojciech Wierba. 2013. MTCA.4 LLRF system for the European XFEL. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems \u2014 MIXDES 2013. IEEE, Piscataway, NJ, 109\u2013112."},{"key":"e_1_3_1_20_2","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-7506-8626-6.00001-6"},{"key":"e_1_3_1_21_2","volume-title":"Practical Switching Power Supply Design","author":"Brown Martin C.","year":"2012","unstructured":"Martin C. Brown. 2012. Practical Switching Power Supply Design. Elsevier, New York."},{"key":"e_1_3_1_22_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2011.15"},{"key":"e_1_3_1_23_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2019.106024"},{"key":"e_1_3_1_24_2","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2005.1518552"},{"key":"e_1_3_1_25_2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2019.8697786"},{"key":"e_1_3_1_26_2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371930"},{"key":"e_1_3_1_27_2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000118"},{"key":"e_1_3_1_28_2","doi-asserted-by":"publisher","DOI":"10.1007\/s42979-020-00329-2"},{"key":"e_1_3_1_29_2","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2019.00113"},{"key":"e_1_3_1_30_2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3106540"},{"key":"e_1_3_1_31_2","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope.2014.6931074"},{"key":"e_1_3_1_32_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2368125"},{"key":"e_1_3_1_33_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.1604480"},{"key":"e_1_3_1_34_2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2360779"},{"key":"e_1_3_1_35_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.net.2021.05.005"},{"key":"e_1_3_1_36_2","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1996.559241"},{"key":"e_1_3_1_37_2","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1997.628989"},{"key":"e_1_3_1_38_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2622688"},{"key":"e_1_3_1_39_2","doi-asserted-by":"publisher","DOI":"10.5555\/113938.149428"},{"key":"e_1_3_1_40_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2875830"},{"key":"e_1_3_1_41_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.02.021"},{"key":"e_1_3_1_42_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3066612"},{"key":"e_1_3_1_43_2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2164543"},{"key":"e_1_3_1_44_2","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5430-8"},{"key":"e_1_3_1_45_2","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2019.8741032"},{"key":"e_1_3_1_46_2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-20051-0_7"},{"key":"e_1_3_1_47_2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2018.8357304"},{"key":"e_1_3_1_48_2","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495581"},{"key":"e_1_3_1_49_2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2777262"},{"key":"e_1_3_1_50_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"e_1_3_1_51_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052306"},{"key":"e_1_3_1_52_2","doi-asserted-by":"publisher","DOI":"10.1109\/4.678661"},{"key":"e_1_3_1_53_2","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.2017.8227036"},{"key":"e_1_3_1_54_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.323909"},{"key":"e_1_3_1_55_2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9181070"},{"key":"e_1_3_1_56_2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574505"},{"key":"e_1_3_1_57_2","unstructured":"Leonardo Rezende Juracy Matheus Trevisan Moreira Alexandre de Morais Amory and Fernando Gehm Moraes. 2020. A Survey of Aging Monitors and Reconfiguration Techniques. arxiv:2007.07829 [cs.AR] https:\/\/arxiv.org\/abs\/2007.07829"},{"key":"e_1_3_1_58_2","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-8862-1_21"},{"key":"e_1_3_1_59_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.07.050"},{"key":"e_1_3_1_60_2","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219086"},{"key":"e_1_3_1_61_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.03.013"},{"key":"e_1_3_1_62_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.03.013"},{"key":"e_1_3_1_63_2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2018.8353577"},{"key":"e_1_3_1_64_2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3031246"},{"key":"e_1_3_1_65_2","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2013.6658220"},{"key":"e_1_3_1_66_2","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2762903"},{"key":"e_1_3_1_67_2","doi-asserted-by":"publisher","DOI":"10.1145\/2885500"},{"key":"e_1_3_1_68_2","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2012.6334580"},{"key":"e_1_3_1_69_2","doi-asserted-by":"publisher","DOI":"10.1109\/63.728347"},{"key":"e_1_3_1_70_2","volume-title":"Proceedings of 27th Euromicro Conference on Digital System Design (DSD\u201924),","author":"Lanzieri Leandro","year":"2024","unstructured":"Leandro Lanzieri, Lukasz Butkowski, Jiri Kral, Goerschwin Fey, Holger Schlarb, and Thomas C. Schmidt. 2024. Studying the degradation of propagation delay on FPGAs at the European XFEL. In Proceedings of 27th Euromicro Conference on Digital System Design (DSD\u201924), Paris, France. IEEE, Piscataway, NJ."},{"key":"e_1_3_1_71_2","doi-asserted-by":"publisher","DOI":"10.1109\/DSD60849.2023.00054"},{"key":"e_1_3_1_72_2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531956"},{"key":"e_1_3_1_73_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2013.6645596"},{"key":"e_1_3_1_74_2","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2014.2346248"},{"key":"e_1_3_1_75_2","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2016.7522856"},{"key":"e_1_3_1_76_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2007.4601924"},{"key":"e_1_3_1_77_2","doi-asserted-by":"publisher","DOI":"10.3390\/s22124439"},{"key":"e_1_3_1_78_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3125769"},{"key":"e_1_3_1_79_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.12.027"},{"key":"e_1_3_1_80_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2019.00016"},{"key":"e_1_3_1_81_2","doi-asserted-by":"publisher","DOI":"10.1109\/DSD53832.2021.00028"},{"key":"e_1_3_1_82_2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-60910-8"},{"key":"e_1_3_1_83_2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.1998.658762"},{"key":"e_1_3_1_84_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICRoM54204.2021.9663495"},{"key":"e_1_3_1_85_2","doi-asserted-by":"publisher","DOI":"10.1109\/NSREC.2016.7891730"},{"key":"e_1_3_1_86_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.087"},{"key":"e_1_3_1_87_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.07.048"},{"key":"e_1_3_1_88_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2016.7577328"},{"key":"e_1_3_1_89_2","doi-asserted-by":"publisher","DOI":"10.1201\/b12722-1"},{"key":"e_1_3_1_90_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1979.1051173"},{"key":"e_1_3_1_91_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.51.4218"},{"key":"e_1_3_1_92_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1984.4333489"},{"key":"e_1_3_1_93_2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2920666"},{"key":"e_1_3_1_94_2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861123"},{"key":"e_1_3_1_95_2","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2012.6376820"},{"key":"e_1_3_1_96_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2012.6339167"},{"key":"e_1_3_1_97_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2013.6645584"},{"issue":"5","key":"e_1_3_1_98_2","first-page":"151","article-title":"Power-supply reliability: A practical improvement guide.","volume":"42","author":"Pflueger Karl H.","year":"1997","unstructured":"Karl H. Pflueger. 1997. Power-supply reliability: A practical improvement guide. EDN 42, 5 (1997), 151\u2013154.","journal-title":"EDN"},{"key":"e_1_3_1_99_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCircuitsAndSystems.2012.6408286"},{"key":"e_1_3_1_100_2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269294"},{"key":"e_1_3_1_101_2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936367"},{"key":"e_1_3_1_102_2","doi-asserted-by":"publisher","DOI":"10.1109\/DevIC57758.2023.10134887"},{"key":"e_1_3_1_103_2","volume-title":"International Conference on Embedded Wireless Systems and Networks (EWSN\u201922)","author":"Rottleuthner Michel","year":"2022","unstructured":"Michel Rottleuthner, Thomas C. Schmidt, and Matthias W\u00e4hlisch. 2022. Dynamic clock reconfiguration for the constrained IoT and its application to energy-efficient networking. In International Conference on Embedded Wireless Systems and Networks (EWSN\u201922) (Linz, AT). ACM, New York, NY."},{"key":"e_1_3_1_104_2","doi-asserted-by":"publisher","DOI":"10.1109\/SPI.2002.258304"},{"key":"e_1_3_1_105_2","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(01)00138-X"},{"key":"e_1_3_1_106_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2284636"},{"key":"e_1_3_1_107_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.006"},{"key":"e_1_3_1_108_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2006.270300"},{"key":"e_1_3_1_109_2","doi-asserted-by":"publisher","DOI":"10.1109\/23.101171"},{"key":"e_1_3_1_110_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.net.2022.08.021"},{"key":"e_1_3_1_111_2","doi-asserted-by":"publisher","DOI":"10.1016\/B978-075066694-7\/50003-X"},{"key":"e_1_3_1_112_2","doi-asserted-by":"publisher","DOI":"10.3390\/mi15010019"},{"key":"e_1_3_1_113_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.017"},{"key":"e_1_3_1_114_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.08.001"},{"key":"e_1_3_1_115_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2010.88"},{"key":"e_1_3_1_116_2","doi-asserted-by":"publisher","DOI":"10.1145\/1723112.1723152"},{"key":"e_1_3_1_117_2","doi-asserted-by":"publisher","DOI":"10.1002\/9780470455265.ch5"},{"key":"e_1_3_1_118_2","doi-asserted-by":"publisher","DOI":"10.1109\/EDL.1983.25667"},{"key":"e_1_3_1_119_2","doi-asserted-by":"publisher","DOI":"10.1557\/S088376940003904X"},{"key":"e_1_3_1_120_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2013.2253795"},{"key":"e_1_3_1_121_2","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2011.5985926"},{"key":"e_1_3_1_122_2","doi-asserted-by":"publisher","DOI":"10.1109\/EUROSOI-ULIS45800.2019.9041857"},{"key":"e_1_3_1_123_2","doi-asserted-by":"publisher","DOI":"10.1145\/3477040"},{"key":"e_1_3_1_124_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2007.4439227"},{"key":"e_1_3_1_125_2","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2008.4762372"},{"key":"e_1_3_1_126_2","doi-asserted-by":"publisher","DOI":"10.1145\/1534916.1534920"},{"key":"e_1_3_1_127_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.07.099"},{"key":"e_1_3_1_128_2","first-page":"759","volume-title":"2013 International Symposium on Electromagnetic Compatibility","author":"Wu J.","year":"2013","unstructured":"J. Wu, J. Li, Rongjun Shen, Alexandre Boyer, and Sonia Ben Dhia. 2013. Effect of electrical stresses on the susceptibility of a voltage regulator. In 2013 International Symposium on Electromagnetic Compatibility. IEEE, Piscataway, NJ, 759\u2013764."},{"key":"e_1_3_1_129_2","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2556"},{"key":"e_1_3_1_130_2","doi-asserted-by":"publisher","DOI":"10.1145\/1723112.1723153"}],"container-title":["ACM Computing Surveys"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3695247","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3695247","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T00:58:11Z","timestamp":1750294691000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3695247"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,7]]},"references-count":129,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2025,1,31]]}},"alternative-id":["10.1145\/3695247"],"URL":"https:\/\/doi.org\/10.1145\/3695247","relation":{},"ISSN":["0360-0300","1557-7341"],"issn-type":[{"value":"0360-0300","type":"print"},{"value":"1557-7341","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,10,7]]},"assertion":[{"value":"2023-03-07","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2024-08-30","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2024-10-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}