{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T04:40:02Z","timestamp":1751863202909,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":26,"publisher":"ACM","content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2025,5,28]]},"DOI":"10.1145\/3706594.3727947","type":"proceedings-article","created":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T04:13:09Z","timestamp":1751861589000},"page":"193-198","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Mitigating Cross-Domain SEU Corruption in FPGA-Based AI Accelerators for Space Applications"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9169-6140","authenticated-orcid":false,"given":"Sarah","family":"Azimi","sequence":"first","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7573-1815","authenticated-orcid":false,"given":"Eleonora","family":"Vacca","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4212-3052","authenticated-orcid":false,"given":"Corrado","family":"De Sio","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3080-2560","authenticated-orcid":false,"given":"Luca","family":"Sterpone","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3597-1523","authenticated-orcid":false,"given":"Andrea","family":"Portaluri","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}]}],"member":"320","published-online":{"date-parts":[[2025,7,6]]},"reference":[{"key":"e_1_3_3_1_2_2","volume-title":"IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","author":"De\u00a0Sio S.\u00a0Azimi A.\u00a0Portaluri, C.","year":"2021","unstructured":"S.\u00a0Azimi A.\u00a0Portaluri, C. De\u00a0Sio and L. Sterpone. 2021. A New Domains-based Isolation Design Flow for Reconfigurable SoCs. In IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS). https:\/\/doi.org\/10.1109\/IOLTS52814.2021.9486687"},{"key":"e_1_3_3_1_3_2","volume-title":"Single Event Effects Test Method and Guidelines","author":"Agency European\u00a0Space","year":"2014","unstructured":"European\u00a0Space Agency. 2014. Single Event Upset Characterization of the Zynq UltraScale+ MPSoC Using Proton Irradiation. In Single Event Effects Test Method and Guidelines."},{"key":"e_1_3_3_1_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44778.2020.9325281"},{"key":"e_1_3_3_1_5_2","volume-title":"Microelectronics Reliability","author":"S.\u00a0Azimi L.\u00a0Bozzoli B. Du L.\u00a0Sterpone C.\u00a0De\u00a0Sio,","year":"2019","unstructured":"L.\u00a0Bozzoli B. Du L.\u00a0Sterpone C.\u00a0De\u00a0Sio, S.\u00a0Azimi. 2019. Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs. In Microelectronics Reliability. https:\/\/doi.org\/10.1016\/j.microrel.2019.06.034"},{"key":"e_1_3_3_1_6_2","volume-title":"IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems","author":"S.\u00a0Azimi L.\u00a0Sterpone C.\u00a0De\u00a0Sio,","year":"2020","unstructured":"L.\u00a0Sterpone C.\u00a0De\u00a0Sio, S.\u00a0Azimi. 2020. An Emulation Platform for Evaluating the Reliability of Deep Neural Networks. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. https:\/\/doi.org\/10.1109\/DFT50435.2020.9250872"},{"key":"e_1_3_3_1_7_2","volume-title":"International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","author":"S.\u00a0Azimi L.\u00a0Sterpone D. M.\u00a0Codinachs C.\u00a0De\u00a0Sio,","year":"2023","unstructured":"L.\u00a0Sterpone D. M.\u00a0Codinachs C.\u00a0De\u00a0Sio, S.\u00a0Azimi and F. Decuzzi. 2023. PyXEL: Exploring Bitstream Analysis to Assess and Enhance the Robustness of Designs on FPGAs. In International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD). https:\/\/doi.org\/10.1109\/SMACD58065.2023.10192116"},{"key":"e_1_3_3_1_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250872"},{"key":"e_1_3_3_1_9_2","doi-asserted-by":"crossref","unstructured":"S.\u00a0Azimi C.\u00a0De\u00a0Sio and L. Sterpone. 2022. FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms. IEEE Transactions on Emerging Topics in Computing (2022). https:\/\/doi.org\/10.1109\/TETC.2022.3152668","DOI":"10.1109\/TETC.2022.3152668"},{"key":"e_1_3_3_1_10_2","unstructured":"V.\u00a0Kirischian D.\u00a0M.\u00a0Hiemstra and J. Brelski. 2017. Single Event Upset Characterization of the Zynq UltraScale+ MPSoC Using Proton Irradiation."},{"key":"e_1_3_3_1_11_2","volume-title":"ACM International Conference on Computing Frontiers","author":"De\u00a0Sio S.\u00a0Azimi E.\u00a0Vacca, C.","year":"2022","unstructured":"S.\u00a0Azimi E.\u00a0Vacca, C. De\u00a0Sio. 2022. Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor. In ACM International Conference on Computing Frontiers. https:\/\/doi.org\/10.1145\/3528416.3530984"},{"key":"e_1_3_3_1_12_2","doi-asserted-by":"crossref","unstructured":"C.\u00a0Cai et al. 2019. SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA. Electronics 8 (2019). https:\/\/doi.org\/10.3390\/electronics8121531","DOI":"10.3390\/electronics8121531"},{"key":"e_1_3_3_1_13_2","doi-asserted-by":"crossref","unstructured":"L.\u00a0A.\u00a0Cardona et al. 2017. A novel tool-flow for zero-overhead cross-domain error resilient partially reconfigurable X-TMR for SRAM-based FPGAs. Journal of System Architecture (2017). https:\/\/doi.org\/10.1016\/j.sysarc.2017.10.009","DOI":"10.1016\/j.sysarc.2017.10.009"},{"key":"e_1_3_3_1_14_2","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2016.7870001"},{"key":"e_1_3_3_1_15_2","doi-asserted-by":"crossref","unstructured":"P.\u00a0Graham J. Krone M.\u00a0Caffrey H.\u00a0Quinn K.\u00a0Morgan and K. Lundgreen. 2007. Domain Crossing Errors: Limitations on Single Device Triple-Modular Redundancy Circuits in Xilinx FPGAs. IEEE Transactions on Nuclear Science (2007). https:\/\/doi.org\/10.1109\/TNS.2007.910870","DOI":"10.1109\/TNS.2007.910870"},{"key":"e_1_3_3_1_16_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.07.035"},{"key":"e_1_3_3_1_17_2","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM.2018.00031"},{"key":"e_1_3_3_1_18_2","volume-title":"Springer New York","author":"N.\u00a0Battezzati L.\u00a0Sterpone","unstructured":"L.\u00a0Sterpone N.\u00a0Battezzati and M. Violante. [n. d.]. Reconfiguable Field Programmable Arrays for Mission-Critical Applications. In Springer New York. https:\/\/doi.org\/10.1007\/978-1-4419-7595-9"},{"key":"e_1_3_3_1_19_2","doi-asserted-by":"crossref","unstructured":"K.\u00a0Raj R.\u00a0Tomar P. K.\u00a0Singh. 2013. A Review of CORDIC Algorithms and Architectures with Applications for Efficient Designing. International Journal of Scientific and Engineering Research (2013). https:\/\/doi.org\/10.1109\/TNS.2018.2877579","DOI":"10.1109\/TNS.2018.2877579"},{"key":"e_1_3_3_1_20_2","unstructured":"Romoth and M. Porrmann. 2017. Survey of FPGA applications in the period 2000 \u2013 2015. Technical Report (2017)."},{"key":"e_1_3_3_1_21_2","volume-title":"Microelectronics Reliability","author":"L.\u00a0Sterpone B.\u00a0Du L.\u00a0Boragno S.\u00a0Azimi,","year":"2018","unstructured":"B.\u00a0Du L.\u00a0Boragno S.\u00a0Azimi, L.\u00a0Sterpone. 2018. On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs. In Microelectronics Reliability. https:\/\/doi.org\/10.1016\/j.microrel.2018.07.135"},{"key":"e_1_3_3_1_22_2","volume-title":"IEEE proceeding)","author":"Stassinopoulos E.\u00a0G.","year":"2023","unstructured":"E.\u00a0G. Stassinopoulos and J.\u00a0P. Raymond. 2023. The space radiation environment for electronics. In IEEE proceeding). https:\/\/doi.org\/10.1109\/5.90113"},{"key":"e_1_3_3_1_23_2","doi-asserted-by":"crossref","unstructured":"L. Sterpone and M. Violante. 2005. A new analytical approach to estimate the effects of SEUs in TMR architectures implemented through SRAM-based FPGAs. IEEE Transactions on Nuclear Science (2005). https:\/\/doi.org\/10.1109\/TNS.2005.860745","DOI":"10.1109\/TNS.2005.860745"},{"key":"e_1_3_3_1_24_2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2404212"},{"key":"e_1_3_3_1_25_2","unstructured":"Xilinx. 2020. Xilinx AI Engines and Their Applications."},{"key":"e_1_3_3_1_26_2","unstructured":"Xilinx. 2021. DPUCZDX8G for Zynq UltraScale+ MPSoCs."},{"key":"e_1_3_3_1_27_2","volume-title":"Application Note XAPP1335","year":"2021","unstructured":"Xilinx. 2021. Isolation Design Flow for UltraScale+ FPGAs and Zynq UltraScale+ MPSoCs. In Application Note XAPP1335."}],"event":{"name":"CF '25 Companion: 22nd ACM International Conference on Computing Frontiers","location":"Cagliari Italy","acronym":"CF '25 Companion","sponsor":["SIGMICRO ACM Special Interest Group on Microarchitectural Research and Processing"]},"container-title":["Proceedings of the 22nd ACM International Conference on Computing Frontiers: Workshops and Special Sessions"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3706594.3727947","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T04:15:19Z","timestamp":1751861719000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3706594.3727947"}},"subtitle":["Invited Paper"],"short-title":[],"issued":{"date-parts":[[2025,5,28]]},"references-count":26,"alternative-id":["10.1145\/3706594.3727947","10.1145\/3706594"],"URL":"https:\/\/doi.org\/10.1145\/3706594.3727947","relation":{},"subject":[],"published":{"date-parts":[[2025,5,28]]},"assertion":[{"value":"2025-07-06","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}