{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T05:05:17Z","timestamp":1750309517372,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T00:00:00Z","timestamp":1729209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,10,18]]},"DOI":"10.1145\/3711129.3711348","type":"proceedings-article","created":{"date-parts":[[2025,2,20]],"date-time":"2025-02-20T12:46:06Z","timestamp":1740055566000},"page":"1307-1312","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["The Study of Nickel Anode Plate Copper Ear Wire Overlapping Scene Segmentation Based on Mask R-CNN"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-8111-9104","authenticated-orcid":false,"given":"Minghong","family":"He","sequence":"first","affiliation":[{"name":"Faculty of Mechanical and Electrical Engineering, Kunming University of Science and Technology, Kunming, Yunnan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-8133-0110","authenticated-orcid":false,"given":"Ping","family":"Xu","sequence":"additional","affiliation":[{"name":"Faculty of Mechanical and Electrical Engineering, Kunming University of Science and Technology, Kunming, Yunnan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-2746-7256","authenticated-orcid":false,"given":"Zhengyun","family":"Zhu","sequence":"additional","affiliation":[{"name":"Faculty of Mechanical and Electrical Engineering, Kunming University of Science and Technology, Kunming, Yunnan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2025,2,20]]},"reference":[{"key":"e_1_3_3_1_1_2","doi-asserted-by":"publisher","DOI":"10.3390\/rs16173330"},{"key":"e_1_3_3_1_2_2","doi-asserted-by":"publisher","DOI":"10.1007\/s42979-022-01407-3"},{"volume-title":"Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR)","author":"Bai M","key":"e_1_3_3_1_3_2","unstructured":"Bai M, Urtasun R. Deep Watershed Transform for Instance Segmentation [C]. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2017: 5221-5229."},{"key":"e_1_3_3_1_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.343"},{"key":"e_1_3_3_1_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2844175"},{"volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"Ke L","key":"e_1_3_3_1_6_2","unstructured":"Ke L, Tai Y-W, Tang C-K, et al. Deep Occlusion-Aware Instance Segmentation with Overlapping BiLayers [C]. Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2021: 4019-4028."},{"volume-title":"Proceedings of the European Conference on Computer Vision (ECCV)","author":"Wang X","key":"e_1_3_3_1_7_2","unstructured":"Wang X, Kong T, Shen C, et al. SOLO: Segmenting Objects by Locations [C]. Proceedings of the European Conference on Computer Vision (ECCV), 2020: 649-665."},{"volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"He J","key":"e_1_3_3_1_8_2","unstructured":"He J, Li P, Geng Y, et al. FastInst: A Simple Query-Based Model for Real-Time Instance Segmentation [C]. Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2023: 23663-23672."},{"volume-title":"Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","author":"Zhang H","key":"e_1_3_3_1_9_2","unstructured":"Zhang H, Li F, Xu H, et al. MP-Former: Mask-Piloted Transformer for Image Segmentation [C]. Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2023: 18074-18083."},{"key":"e_1_3_3_1_10_2","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13173557"}],"event":{"name":"EITCE 2024: 2024 8th International Conference on Electronic Information Technology and Computer Engineering","acronym":"EITCE 2024","location":"Haikou Guangdong China"},"container-title":["Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3711129.3711348","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3711129.3711348","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T01:18:03Z","timestamp":1750295883000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3711129.3711348"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,18]]},"references-count":10,"alternative-id":["10.1145\/3711129.3711348","10.1145\/3711129"],"URL":"https:\/\/doi.org\/10.1145\/3711129.3711348","relation":{},"subject":[],"published":{"date-parts":[[2024,10,18]]},"assertion":[{"value":"2025-02-20","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}