{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T14:36:22Z","timestamp":1754145382745,"version":"3.41.2"},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"type":"print","value":"9798400715938"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,9]]},"DOI":"10.1145\/3726854","type":"proceedings","created":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T09:46:42Z","timestamp":1749030402000},"source":"Crossref","is-referenced-by-count":0,"title":["Abstracts of the 2025 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2025,6,9]]},"event":{"name":"SIGMETRICS '25: ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"],"location":"Stony Brook NY USA","acronym":"SIGMETRICS '25"},"container-title":[],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3726854","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T22:22:26Z","timestamp":1752704546000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/3726854"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,9]]},"ISBN":["9798400715938"],"references-count":0,"alternative-id":["10.1145\/3726854"],"URL":"https:\/\/doi.org\/10.1145\/3726854","relation":{},"subject":[],"published":{"date-parts":[[2025,6,9]]}}}