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However, the design space of redacted solutions is huge, with tradeoffs between the portions selected for redaction and the configuration of the configurable embedded logic. We propose ARIANNA, a complete flow that aids the designer in all the stages, from selecting the logic to be hidden to tailoring the bespoke fabrics for the configurable logic used to hide it. We present a security evaluation of the considered fabrics and introduce two heuristics for the novel bespoke fabric flow. We evaluate the heuristics against an exhaustive approach. We also evaluate the complete flow using a selection of benchmarks. Results show that using ARIANNA to customize the redaction fabrics yields up to 3.3\u00d7 lower overheads and 4\u00d7 higher eFPGA fabric utilization than a one-fits-all fabric as proposed in prior works.<\/jats:p>","DOI":"10.1145\/3737287","type":"journal-article","created":{"date-parts":[[2025,6,2]],"date-time":"2025-06-02T07:08:11Z","timestamp":1748848091000},"page":"1-23","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["ARIANNA: An Automatic Design Flow for Fabric Customization and eFPGA Redaction"],"prefix":"10.1145","volume":"30","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2367-6700","authenticated-orcid":false,"given":"Luca","family":"Collini","sequence":"first","affiliation":[{"name":"ECE, New York University Tandon School of Engineering","place":["Brooklyn, United States"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1017-1690","authenticated-orcid":false,"given":"Jitendra","family":"Bhandari","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering, New York University Tandon School of Engineering","place":["Brooklyn, United States"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-2434-6006","authenticated-orcid":false,"given":"Chiara","family":"Muscari Tomajoli","sequence":"additional","affiliation":[{"name":"DEIB, Politecnico di Milano","place":["Milan, Italy"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6715-267X","authenticated-orcid":false,"given":"Abdul","family":"Moosa","sequence":"additional","affiliation":[{"name":"ECE, New York University Tandon School of Engineering","place":["New York, United States"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7642-3638","authenticated-orcid":false,"given":"Benjamin","family":"Tan","sequence":"additional","affiliation":[{"name":"Electrical and Software Engineering, University of Calgary","place":["Calgary, Canada"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2203-3981","authenticated-orcid":false,"given":"Xifan","family":"Tang","sequence":"additional","affiliation":[{"name":"Rapid Flex","place":["Campbell, United States"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3634-3999","authenticated-orcid":false,"given":"Pierre-Emanuel","family":"Gaillardon","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Univeristy of Utah","place":["Salt Lake City, United States"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7989-5617","authenticated-orcid":false,"given":"Ramesh","family":"Karri","sequence":"additional","affiliation":[{"name":"ECE, New York University Tandon School of Engineering","place":["New York, United States"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9315-1788","authenticated-orcid":false,"given":"Christian","family":"Pilato","sequence":"additional","affiliation":[{"name":"DEIB, Politecnico di Milano","place":["Milan, Italy"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2025,7,9]]},"reference":[{"issue":"6","key":"e_1_3_2_2_2","article-title":"An overview of hardware security and trust: Threats, countermeasures, and design tools","volume":"40","author":"Hu Wei","year":"2021","unstructured":"Wei Hu, Chip-Hong Chang, Anirban Sengupta, Swarup Bhunia, Ryan Kastner, and Hai Li. 2021. 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