{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T08:55:29Z","timestamp":1766566529241,"version":"3.48.0"},"publisher-location":"New York, NY, USA","reference-count":34,"publisher":"ACM","funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["378803395"],"award-info":[{"award-number":["378803395"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["496588242"],"award-info":[{"award-number":["496588242"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2025,6,17]]},"DOI":"10.1145\/3756681.3756963","type":"proceedings-article","created":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T08:30:04Z","timestamp":1766565004000},"page":"205-215","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Empirical Fault Patterns for Mutation Testing"],"prefix":"10.1145","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-5131-6565","authenticated-orcid":false,"given":"Sophia","family":"Hans","sequence":"first","affiliation":[{"name":"LMU Munich, Munich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7365-5030","authenticated-orcid":false,"given":"Matthias","family":"Kettl","sequence":"additional","affiliation":[{"name":"LMU Munich, Munich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8244-995X","authenticated-orcid":false,"given":"Stefan","family":"Winter","sequence":"additional","affiliation":[{"name":"LMU Munich, Munich, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2025,12,24]]},"reference":[{"key":"e_1_3_3_3_2_2","doi-asserted-by":"publisher","DOI":"10.21236\/ADA076575"},{"key":"e_1_3_3_3_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2005.1553583"},{"key":"e_1_3_3_3_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.61"},{"key":"e_1_3_3_3_5_2","doi-asserted-by":"publisher","unstructured":"Ram Chillarege I.S. Bhandari Jarir Chaar M.J. Halliday D.S. Moebus Bonnie Ray and M.-Y Wong. 1992. Orthogonal Defect Classification - A Concept for In-Process Measurements. Software Engineering IEEE Transactions on 18 (12 1992) 943 \u2013 956. 10.1109\/32.177364","DOI":"10.1109\/32.177364"},{"key":"e_1_3_3_3_6_2","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1996.534615"},{"key":"e_1_3_3_3_7_2","doi-asserted-by":"publisher","unstructured":"Domenico Cotroneo Anna Lanzaro and Roberto Natella. 2018. Faultprog: Testing the Accuracy of Binary-Level Software Fault Injection. IEEE Transactions on Dependable and Secure Computing 15 1 (2018) 40\u201353. 10.1109\/TDSC.2016.2522968","DOI":"10.1109\/TDSC.2016.2522968"},{"key":"e_1_3_3_3_8_2","doi-asserted-by":"publisher","unstructured":"R.A. DeMillo R.J. Lipton and F.G. Sayward. 1978. Hints on Test Data Selection: Help for the Practicing Programmer. Computer 11 4 (1978) 34\u201341. 10.1109\/C-M.1978.218136","DOI":"10.1109\/C-M.1978.218136"},{"key":"e_1_3_3_3_9_2","unstructured":"Richard\u00a0A DeMillo Richard\u00a0J Lipton and Frederick\u00a0G Sayward. 1979. Program Mutation: A new Approach to Program Testing. Infotech State of the Art Report Software Testing 2 1979 (1979) 107\u2013126."},{"key":"e_1_3_3_3_10_2","volume-title":"Appendix A - G-SWFIT fault emulation operators","author":"Dur\u00e3es Jo\u00e3o","year":"2006","unstructured":"Jo\u00e3o Dur\u00e3es and Henrique Madeira. 2006. Appendix A - G-SWFIT fault emulation operators. http:\/\/wpage.unina.it\/roberto.natella\/misc\/fault-emulation-annex-e0849s.pdf"},{"key":"e_1_3_3_3_11_2","doi-asserted-by":"publisher","unstructured":"Jo\u00e3o Dur\u00e3es and Henrique Madeira. 2006. Emulation of Software Faults: A Field Data Study and a Practical Approach. IEEE Trans. Software Eng. 32 11 (2006) 849\u2013867. 10.1109\/TSE.2006.113","DOI":"10.1109\/TSE.2006.113"},{"key":"e_1_3_3_3_12_2","doi-asserted-by":"publisher","unstructured":"Tania\u00a0Basso e\u00a0Regina Moraes e Bruno Sanches\u00a0e Mario\u00a0Jino. 2009. An Investigation of Java Faults Operators Derived from a Field Data Study on Java Software Faults. Anais do Workshop de Testes e Toler\u00e2ncia a Falhas (WTF) (2009) 156\u2013168. 10.5753\/wtf.2009.23141","DOI":"10.5753\/wtf.2009.23141"},{"key":"e_1_3_3_3_13_2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2014.40"},{"key":"e_1_3_3_3_14_2","doi-asserted-by":"publisher","DOI":"10.5281\/zenodo.15292919"},{"key":"e_1_3_3_3_15_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2019.00021"},{"key":"e_1_3_3_3_16_2","doi-asserted-by":"publisher","unstructured":"Yue Jia and Mark Harman. 2011. An Analysis and Survey of the Development of Mutation Testing. IEEE Transactions on Software Engineering 37 5 (2011) 649\u2013678. 10.1109\/TSE.2010.62","DOI":"10.1109\/TSE.2010.62"},{"key":"e_1_3_3_3_17_2","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628053"},{"key":"e_1_3_3_3_18_2","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628055"},{"key":"e_1_3_3_3_19_2","doi-asserted-by":"publisher","DOI":"10.4230\/LIPIcs.ECOOP.2019.22"},{"key":"e_1_3_3_3_20_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW55395.2022.00042"},{"key":"e_1_3_3_3_21_2","doi-asserted-by":"publisher","unstructured":"L.J. Morell. 1990. A theory of fault-based testing. IEEE Transactions on Software Engineering 16 8 (1990) 844\u2013857. 10.1109\/32.57623","DOI":"10.1109\/32.57623"},{"key":"e_1_3_3_3_22_2","doi-asserted-by":"publisher","unstructured":"Roberto Natella Domenico Cotroneo Joao\u00a0A. Duraes and Henrique\u00a0S. Madeira. 2013. On Fault Representativeness of Software Fault Injection. IEEE Transactions on Software Engineering 39 1 (2013) 80\u201396. 10.1109\/TSE.2011.124","DOI":"10.1109\/TSE.2011.124"},{"key":"e_1_3_3_3_23_2","doi-asserted-by":"publisher","unstructured":"Roberto Natella Domenico Cotroneo and Henrique\u00a0S. Madeira. 2016. Assessing Dependability with Software Fault Injection: A Survey. ACM Comput. Surv. 48 3 Article 44 (Feb. 2016) 55\u00a0pages. 10.1145\/2841425","DOI":"10.1145\/2841425"},{"key":"e_1_3_3_3_24_2","doi-asserted-by":"publisher","unstructured":"A.\u00a0Jefferson Offutt. 1992. Investigations of the software testing coupling effect. ACM Trans. Softw. Eng. Methodol. 1 1 (jan 1992) 5\u201320. 10.1145\/125489.125473","DOI":"10.1145\/125489.125473"},{"key":"e_1_3_3_3_25_2","doi-asserted-by":"publisher","unstructured":"A.\u00a0Jefferson Offutt Ammei Lee Gregg Rothermel Roland\u00a0H. Untch and Christian Zapf. 1996. An experimental determination of sufficient mutant operators. ACM Trans. Softw. Eng. Methodol. 5 2 (apr 1996) 99\u2013118. 10.1145\/227607.227610","DOI":"10.1145\/227607.227610"},{"key":"e_1_3_3_3_26_2","doi-asserted-by":"publisher","DOI":"10.1016\/J.ENTCS.2006.07.022"},{"key":"e_1_3_3_3_27_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.103"},{"key":"e_1_3_3_3_28_2","doi-asserted-by":"publisher","unstructured":"Mike Papadakis Marinos Kintis Jie Zhang Yue Jia Yves\u00a0Le Traon and Mark Harman. 2019. Chapter Six - Mutation Testing Advances: An Analysis and Survey. Advances in Computers Vol.\u00a0112. Elsevier 275\u2013378. 10.1016\/bs.adcom.2018.03.015","DOI":"10.1016\/bs.adcom.2018.03.015"},{"key":"e_1_3_3_3_29_2","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180183"},{"key":"e_1_3_3_3_30_2","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3468623"},{"key":"e_1_3_3_3_31_2","doi-asserted-by":"publisher","DOI":"10.1109\/ICST53961.2022.00027"},{"key":"e_1_3_3_3_32_2","doi-asserted-by":"publisher","DOI":"10.1109\/LADC.2011.20"},{"key":"e_1_3_3_3_33_2","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1991.146625"},{"key":"e_1_3_3_3_34_2","doi-asserted-by":"publisher","DOI":"10.1145\/3551349.3556949"},{"key":"e_1_3_3_3_35_2","doi-asserted-by":"publisher","unstructured":"Andr\u00e1s Vargha and Harold\u00a0D. Delaney. 2000. A Critique and Improvement of the CL Common Language Effect Size Statistics of McGraw and Wong. Journal of Educational and Behavioral Statistics 25 2 (2000) 101\u2013132. 10.3102\/10769986025002101 arXiv:10.3102\/10769986025002101","DOI":"10.3102\/10769986025002101"}],"event":{"name":"EASE '25: Evaluation and Assessment in Software Engineering","location":"Istanbul Turkiye","acronym":"EASE '25"},"container-title":["Proceedings of the 29th International Conference on Evaluation and Assessment in Software Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3756681.3756963","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T08:44:34Z","timestamp":1766565874000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3756681.3756963"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,17]]},"references-count":34,"alternative-id":["10.1145\/3756681.3756963","10.1145\/3756681"],"URL":"https:\/\/doi.org\/10.1145\/3756681.3756963","relation":{},"subject":[],"published":{"date-parts":[[2025,6,17]]},"assertion":[{"value":"2025-12-24","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}