{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,5]],"date-time":"2022-04-05T12:08:18Z","timestamp":1649160498668},"publisher-location":"New York, New York, USA","reference-count":0,"publisher":"ACM Press","isbn-type":[{"value":"0897911121","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1983]]},"DOI":"10.1145\/800040","type":"proceedings","created":{"date-parts":[[2003,11,13]],"date-time":"2003-11-13T21:09:32Z","timestamp":1068757772000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the 1983 ACM SIGMETRICS conference on Measurement and modeling of computer systems  - SIGMETRICS '83"],"prefix":"10.1145","member":"320","event":{"name":"the 1983 ACM SIGMETRICS conference","location":"Minneapolis, Minnesota, United States","acronym":"SIGMETRICS '83","sponsor":["SIGMETRICS, ACM Special Interest Group on Measurement and Evaluation"],"start":{"date-parts":[[1983,8,29]]},"end":{"date-parts":[[1983,8,31]]}},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2013,12,16]],"date-time":"2013-12-16T23:08:32Z","timestamp":1387235312000},"score":1,"resource":{"primary":{"URL":"http:\/\/portal.acm.org\/citation.cfm?doid=800040"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1983]]},"ISBN":["0897911121"],"references-count":0,"URL":"https:\/\/doi.org\/10.1145\/800040","relation":{},"subject":[],"published":{"date-parts":[[1983]]}}}