{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T06:55:16Z","timestamp":1742799316732},"reference-count":0,"publisher":"Wiley","issue":"4","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":2191,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1994,1]]},"abstract":"<jats:p>Built\u2010in\u2010self\u2010test (BIST) response data can be compacted using a linear\u2010feedback shift register (LFSR). Prior work\nhas indicated that the probability of aliasing tends to converge to 2<jats:sup>-k<\/jats:sup> for a polynomial of degree <jats:italic>k<\/jats:italic> and large test\nlength, and that primitive polynomials perform better than non\u2010primitive polynomials. Nearly all analytical models\nand simulations have been based on the assumption that error occurrences are statistically\u2010independent. This\npaper presents the first statistical results, based on fault simulation, that show that this convergence property\nholds for actual digital logic circuits and randomly\u2010generated test vector sequences. However, it is shown that\nthe <jats:italic>average<\/jats:italic> probability of aliasing is unsuitable as a design metric, and that a 95% <jats:italic>upper confidence limit (UCL)<\/jats:italic>\nis more useful. This paper introduces a UCL for the loss of fault coverage due to test response compaction. The\ntheoretical or \u201cideal\u201d UCL is shown to match closely the empirically\u2010derived UCL obtained by fault simulation.\nThe result is that a tight lower bound on fault coverage for LFSR\u2010based BIST configurations can be obtained\neasily. Fault coverage for a BIST configuration can be obtained without the LFSR, eliminating costly fault\nsimulation of the full structure with the LFSR. These results have been incorporated in the standard procedure\nfor fault coverage measurement.<\/jats:p>","DOI":"10.1155\/1994\/78932","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:36:02Z","timestamp":1190118962000},"page":"313-326","source":"Crossref","is-referenced-by-count":1,"title":["Empirical Bounds on Fault Coverage LossDue to LFSR Aliasing"],"prefix":"10.1155","volume":"1","author":[{"given":"Warren H.","family":"Debany","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark J.","family":"Gorniak","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anthony R.","family":"Macera","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel E.","family":"Daskiewich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kevin A.","family":"Kwiat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Heather B.","family":"Dussault","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[1994,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1994\/078932.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/vlsi\/1994\/078932.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1994\/78932","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T11:33:08Z","timestamp":1723203188000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1994\/78932"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1994,1]]},"references-count":0,"journal-issue":{"issue":"4","published-print":{"date-parts":[[1994,1]]}},"alternative-id":["10.1155\/1994\/78932"],"URL":"https:\/\/doi.org\/10.1155\/1994\/78932","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1994,1]]}}}