{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T14:10:03Z","timestamp":1723212603759},"reference-count":0,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":1095,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"funder":[{"name":"UK Science and Engineering Research Council","award":["GR\/G23937"],"award-info":[{"award-number":["GR\/G23937"]}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1997,1]]},"abstract":"<jats:p>This paper applies the time\u2010domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in\nCMOS mixed\u2010signal circuits. The voltage and supply current (i<jats:sub>DDT<\/jats:sub>) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement\nachieves higher confidence in the detection. Catastrophic, soft and stuck\u2010at single fault conditions were introduced to the circuit\u2010under\u2010test (CUT). The time\u2010domain technique tests\na mixed\u2010signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.<\/jats:p>","DOI":"10.1155\/1997\/47423","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:57:06Z","timestamp":1190120226000},"page":"223-240","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Application of Dynamic Supply Current Monitoring to Testing Mixed\u2010Signal Circuits"],"prefix":"10.1155","volume":"5","author":[{"given":"Mahmoud A.","family":"Al-Qutayri","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peter R.","family":"Shepherd","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[1997,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1997\/047423.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1997\/47423","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T13:41:57Z","timestamp":1723210917000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1997\/47423"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997,1]]},"references-count":0,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1997,1]]}},"alternative-id":["10.1155\/1997\/47423"],"URL":"https:\/\/doi.org\/10.1155\/1997\/47423","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1997,1]]},"assertion":[{"value":"1997-01-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}