{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T15:59:13Z","timestamp":1780675153785,"version":"3.54.1"},"reference-count":0,"publisher":"Wiley","issue":"2","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":730,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1998,1]]},"abstract":"<jats:p>Circuits of VLSI complexity are designed using modules such as adders, multipliers,\nregister files, memories, multiplexers, and busses. During the high\u2010level design of such a\ncircuit, it is important to be able to consider several alternative designs and compare\nthem on counts of area, performance, and testability. While tools exist for area and\ndelay estimation of module\u2010level circuits, most of the testability analysis tools work on\ngate\u2010level descriptions of the circuit. Thus an expensive operation of flattening the\ncircuit becomes necessary to carry out testability analysis. In this paper, we describe a\ntime and space\u2010efficient technique for evaluating the well known SCOAP testability\nmeasure of a circuit from its hierarchical description with two or more levels of\nhierarchy. We introduce the notion of SCOAP <jats:italic>Expression Diagrams<\/jats:italic> for functional\nmodules, which can be precomputed and stored as part of the module data base. Our\nhierarchical testability analysis program, HISCOAP, reads the SCOAP expression\ndiagrams for the modules used in the circuit, and evaluates the SCOAP measure in a\nsystematic manner. The program has been implemented on a Sun\/SPARC workstation,\nand we present results on several benchmark circuits, both combinational and\nsequential. We show that our algorithm also has a straightforward parallel realization.<\/jats:p>","DOI":"10.1155\/1998\/32654","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:57:36Z","timestamp":1190120256000},"page":"131-141","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["SCOAP\u2010based Testability Analysis from Hierarchical Netlists"],"prefix":"10.1155","volume":"7","author":[{"given":"C. P.","family":"Ravikumar","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"H.","family":"Joshi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","published-online":{"date-parts":[[1998,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1998\/032654.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1998\/32654","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,7]],"date-time":"2024-08-07T22:40:27Z","timestamp":1723070427000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1998\/32654"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,1]]},"references-count":0,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1998,1]]}},"alternative-id":["10.1155\/1998\/32654"],"URL":"https:\/\/doi.org\/10.1155\/1998\/32654","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"value":"1065-514X","type":"print"},{"value":"1563-5171","type":"electronic"}],"subject":[],"published":{"date-parts":[[1998,1]]},"assertion":[{"value":"1995-07-27","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"1998-01-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}