{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,12]],"date-time":"2025-04-12T05:47:53Z","timestamp":1744436873044,"version":"3.37.3"},"reference-count":0,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":730,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["MIP-9308426"],"award-info":[{"award-number":["MIP-9308426"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1998,1]]},"abstract":"<jats:p>Higher levels of integration have led to a generation of integrated circuits for which\npower dissipation and reliability are major design concerns. In CMOS circuits, both of\nthese problems are directly related to the extent of circuit switching activity. The average\nnumber of transitions per second at a circuit node is a measure of switching activity that\nhas been called the <jats:italic>transition density<\/jats:italic>. This paper presents a statistical simulation\ntechnique to estimate individual node transition densities in combinational logic\ncircuits. The strength of this approach is that the desired accuracy and confidence can be\nspecified up\u2010front by the user. Another key feature is the classification of nodes into two\ncategories: regular\u2010 and low\u2010density nodes. Regular\u2010density nodes are certified with\nuser\u2010specified <jats:italic>percentage error<\/jats:italic> and confidence levels. Low\u2010density nodes are certified\nwith an <jats:italic>absolute error<\/jats:italic>, with the same confidence. This speeds convergence while\nsacrificing percentage accuracy only on nodes which contribute little to power\ndissipation and have few reliability problems.<\/jats:p>","DOI":"10.1155\/1998\/46819","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:57:36Z","timestamp":1190120256000},"page":"243-254","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":11,"title":["Statistical Estimation of the ,Switching Activity in VLSI Circuits"],"prefix":"10.1155","volume":"7","author":[{"given":"Farid N.","family":"Najm","sequence":"first","affiliation":[]},{"given":"Michael G.","family":"Xakellis","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[1998,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1998\/046819.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1998\/46819","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,7]],"date-time":"2024-08-07T22:54:01Z","timestamp":1723071241000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1998\/46819"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,1]]},"references-count":0,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1998,1]]}},"alternative-id":["10.1155\/1998\/46819"],"URL":"https:\/\/doi.org\/10.1155\/1998\/46819","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1998,1]]},"assertion":[{"value":"1998-01-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}