{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T10:40:01Z","timestamp":1723200001232},"reference-count":0,"publisher":"Wiley","issue":"1-4","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":730,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1998,1]]},"abstract":"<jats:p>A boundary condition specifically designed to model open\u2010circuited devices in a\nmacroscopic device simulator is introduced. Other simulation techniques have relied on\nan external circuit model to regulate the current flow out of a contact thus allowing the\npotential to remain the controlled variable at the boundary. The limitations of these\nmethods become apparent when modeling open\u2010circuited devices with an exceptionally\nsmall or zero output current. In this case, using a standard ohmic\u2010type Dirichlet\nboundary condition would not yield satisfactory results and attaching the device to an\narbitrarily large load resistance is physically and numerically unacceptable. This\nproposed condition is a true current controlled boundary where the external current is\nthe specified parameter rather than the potential. Using this model, the external current\nis disseminated into electron and hole components relative to their respective\nconcentration densities at the contact. This model also allows for the inclusion of\ntrapped interface charge and a finite surface recombination velocity at the contact.\n<\/jats:p><jats:p>An example of the use of this boundary condition is performed by modeling a silicon\navalanche photodiode operating in the flux integrating mode for use in an imaging\nsystem. In this example, the device is biased in steady\u2010state to just below the breakdown\nvoltage and then open\u2010circuited. The recovery of the isolated photodiode back to its\nequilibrium condition is then determined by the generation lifetime of the material, the\nquantity of signal and background radiation incident upon the device, and the impact\nionization rates.<\/jats:p>","DOI":"10.1155\/1998\/71381","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:58:07Z","timestamp":1190120287000},"page":"567-572","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Boundary Condition for the Modeling of Open\u2010circuitedDevices in Non\u2010equilibrium"],"prefix":"10.1155","volume":"8","author":[{"suffix":"Jr.","given":"Joseph W.","family":"Parks","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kevin F.","family":"Brennan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[1998,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1998\/071381.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1998\/71381","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T10:00:32Z","timestamp":1723197632000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1998\/71381"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,1]]},"references-count":0,"journal-issue":{"issue":"1-4","published-print":{"date-parts":[[1998,1]]}},"alternative-id":["10.1155\/1998\/71381"],"URL":"https:\/\/doi.org\/10.1155\/1998\/71381","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1998,1]]},"assertion":[{"value":"1998-01-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}