{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T12:10:01Z","timestamp":1723205401859},"reference-count":0,"publisher":"Wiley","issue":"1-4","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":730,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1998,1]]},"abstract":"<jats:p>Numerical simulation results for the spectral density of noise due to current fluctuations are\npresented. The mathematical framework is based on the interpretation of the equations\ndescribing electron transport in the semiclassical transport model as stochastic differential\nequations (SDE). Within this framework, it was previously shown that the autocovariance\nfunction of current fluctuations can be obtained from the transient solution of the Boltzmann\ntransport equation (BTE) with special initial conditions. The key aspect which differentiates\nthis approach from other noise models is that this approach directly connects noise characteristics\nwith the physics of scattering in the semiclassical transport model and makes no additional\nassumptions regarding the nature of noise. The solution of the BTE is based on the\nLegendre polynomial method. A numerical algorithm is presented for the solution of the transient\nBTE. Numerical results are in good agreement with Monte Carlo noise simulations for\nthe spectral density of current fluctuations in bulk silicon.<\/jats:p>","DOI":"10.1155\/1998\/75094","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:57:27Z","timestamp":1190120247000},"page":"185-189","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Computation of the Spectral Density of CurrentFluctuations in Bulk Silicon Based on the Solution of theBoltzmann Transport Equation"],"prefix":"10.1155","volume":"6","author":[{"given":"Alfredo J.","family":"Piazza","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Can E.","family":"Korman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[1998,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1998\/075094.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1998\/75094","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T11:32:52Z","timestamp":1723203172000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1998\/75094"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,1]]},"references-count":0,"journal-issue":{"issue":"1-4","published-print":{"date-parts":[[1998,1]]}},"alternative-id":["10.1155\/1998\/75094"],"URL":"https:\/\/doi.org\/10.1155\/1998\/75094","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1998,1]]},"assertion":[{"value":"1998-01-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}