{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T10:40:02Z","timestamp":1723200002216},"reference-count":0,"publisher":"Wiley","issue":"1-4","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":730,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["JA853\/1-1"],"award-info":[{"award-number":["JA853\/1-1"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["96-CJ-816"],"award-info":[{"award-number":["96-CJ-816"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1998,1]]},"abstract":"<jats:p>The Mutation Operator Monte Carlo method (MOMC) is a new type of Monte Carlo\ntechnique for the study of hot electron related effects in semiconductor devices. The\nMOMC calculates energy distributions of electrons by a physical mutation of the\ndistribution towards a stationary condition. In this work we compare results of an one\ndimensional simulation of an 800nm Si\u2010MOSFET with full band Monte Carlo\ncalculations and measurement results. Starting from the potential distribution resulting\nfrom a drift diffusion simulation, the MOMC calculates electron distributions which are\ncomparable to FBMC\u2010results within minutes on a modern workstation. From these\ndistributions, substrate and gate currents close to experimental results can be calculated.\nThese results show that the MOMC is useful as a post\u2010processor for the investigation of\nhot electron related problems in Si\u2010MOSFETs. Beside the computational efficiency, a\nfurther advantage of the MOMC compared to standard MC techniques is the good\nresolution of the high energy tail of the distribution without the necessity of any\nstatistical enhancement.<\/jats:p>","DOI":"10.1155\/1998\/80689","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:58:07Z","timestamp":1190120287000},"page":"343-347","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Simulation of Si\u2010MOSFETs with the Mutation OperatorMonte Carlo Method"],"prefix":"10.1155","volume":"8","author":[{"given":"J\u00fcrgen","family":"Jakumeit","sequence":"first","affiliation":[]},{"given":"Amanda","family":"Duncan","sequence":"additional","affiliation":[]},{"given":"Umberto","family":"Ravaioli","sequence":"additional","affiliation":[]},{"given":"Karl","family":"Hess","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[1998,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1998\/080689.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1998\/80689","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T10:00:58Z","timestamp":1723197658000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1998\/80689"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,1]]},"references-count":0,"journal-issue":{"issue":"1-4","published-print":{"date-parts":[[1998,1]]}},"alternative-id":["10.1155\/1998\/80689"],"URL":"https:\/\/doi.org\/10.1155\/1998\/80689","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1998,1]]},"assertion":[{"value":"1998-01-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}