{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,12]],"date-time":"2025-04-12T05:08:35Z","timestamp":1744434515069},"reference-count":0,"publisher":"Wiley","issue":"4","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[2001,1]]},"abstract":"<jats:p>Pseudorandom testing has been widely used in built\u2010in self\u2010testing of VLSI circuits.\nAlthough the defect level estimation for pseudorandom testing has been performed\nusing sequential statical analysis, no closed form can be accomplished as complex\ncombinatorial enumerations are involved. In this work, a Markov model is employed to\ndescribe the pseudorandom test behaviors. For the first time, a closed form of the defect\nlevel equation is derived by solving the differential equation extracted from the Markov\nmodel. The defect level equation clearly describes the relationships among defect level,\nfabrication yield, the number of all input combinations, circuit detectability (in terms of\nthe worst single stuck\u2010at fault), and pseudorandom test length. The Markov model is\nthen extended to consider all single stuck\u2010at faults, instead of only the worst single\nstuck\u2010at fault. Results demonstrate that the defect level analysis for pseudorandom\ntesting by only dealing with the worst single stuck\u2010at fault is not adequate (In fact, the\nworst single stuck\u2010at fault analysis is just a special case). A closed form of the defect\nlevel equation is successfully derived to incorporate all single stuck\u2010at faults into\nconsideration. Although our discussions are primarily based on the single struck\u2010at fault\nmodel, it is not difficult to extend the results to other fault types.<\/jats:p>","DOI":"10.1155\/2001\/28741","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:59:02Z","timestamp":1190120342000},"page":"457-474","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis"],"prefix":"10.1155","volume":"12","author":[{"given":"W. B.","family":"Jone","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D. C.","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. C.","family":"Chang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. R.","family":"Das","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2000,9,11]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/2001\/028741.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/2001\/28741","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T04:23:19Z","timestamp":1723090999000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/2001\/28741"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,9,11]]},"references-count":0,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2001,1]]}},"alternative-id":["10.1155\/2001\/28741"],"URL":"https:\/\/doi.org\/10.1155\/2001\/28741","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[2000,9,11]]},"assertion":[{"value":"1999-08-15","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2000-09-11","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}