{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T14:10:01Z","timestamp":1723212601670},"reference-count":0,"publisher":"Wiley","issue":"1-4","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[2001,1]]},"abstract":"<jats:p>The second\u2010order nonrandom ordinary differential equation (ODE) system derived as\nthe noise\u2010source\u2010aware model for expectations of solutions of It\u00f4\u2032s stochastic\ndifferential equation (ISDE) system is discussed in connection with large\u2010scale\nintegrated circuits (ICs). The work explains the reason why the new model consistently\nallows for the noise\u2010induced phenomena in the expectations, namely, stochastic\nresonance, stochastic linearization, stochastic self\u2010oscillations and stochastic chaos. The\ncase of stochastic resonance is considered as an example. In spite of the fact that the\nabove second\u2010order model is more complex than the nonrandom first\u2010order IC ODE\nsystem for the expectations commonly used in engineering, an efficient practical\ntechnique for its implementation is proposed. The corresponding predicted computing\ntime is only in 2.5 times greater than in the case of the first\u2010order model which does not\ninclude any noise\u2010source influence upon the expectations of the modelled IC responses.<\/jats:p>","DOI":"10.1155\/2001\/92043","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T13:00:57Z","timestamp":1190120457000},"page":"257-264","update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["The Deterministic Circuit Model for Noise Influenceon the Averaged Transient Responses of Large\u2010scaleNonlinear ICs Analyzed with It\u00f4\u2032s StochasticDifferential Equations"],"prefix":"10.1155","volume":"13","author":[{"given":"Magnus","family":"Willander","sequence":"first","affiliation":[]},{"given":"Yevgeny","family":"Mamontov","sequence":"additional","affiliation":[]},{"given":"Jonathan","family":"Vincent","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2001,1]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/2001\/092043.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/2001\/92043","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,9]],"date-time":"2024-08-09T13:34:03Z","timestamp":1723210443000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/2001\/92043"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,1]]},"references-count":0,"journal-issue":{"issue":"1-4","published-print":{"date-parts":[[2001,1]]}},"alternative-id":["10.1155\/2001\/92043"],"URL":"https:\/\/doi.org\/10.1155\/2001\/92043","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[2001,1]]},"assertion":[{"value":"2001-01-01","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}