{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,30]],"date-time":"2025-07-30T13:48:33Z","timestamp":1753883313479,"version":"3.41.2"},"reference-count":11,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2008,6,4]],"date-time":"2008-06-04T00:00:00Z","timestamp":1212537600000},"content-version":"vor","delay-in-days":155,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[2008,1]]},"abstract":"<jats:p>The test of radiofrequency (RF) integrated circuits at their ever\u2010increasing operating frequency range requires sophisticated test equipment and is time\u2010consuming and, therefore, very expensive. This paper introduces a new method combining low\u2010frequency actuation signal as test stimuli and signal envelope detection applied on the RF output signal in order to provide a low\u2010cost mean for production testing of RF MEMS switches embedded in system\u2010in\u2010package (SiP) devices. The proposed approach uses the principle of alternate test that replaces conventional specification\u2010based testing procedures. The basic idea is to extract the high\u2010frequency characteristics of the switch from the signal envelope of the response. Output parameters like \u201con\u201d and \u201coff\u201d transition time are extracted at low frequency and used in a regression process to predict RF conventional specifications like S\u2010parameters. The paper also provides a set of recursive estimation algorithms suitable for online testing. In this context, \u201con\u201d and \u201coff\u201d transition time estimated from the output low\u2010frequency envelope is used as test metrics and is concurrently updated using recursive algorithms. Validation results obtained on a capacitive RF switch model are presented.<\/jats:p>","DOI":"10.1155\/2008\/294014","type":"journal-article","created":{"date-parts":[[2008,6,11]],"date-time":"2008-06-11T06:47:53Z","timestamp":1213166873000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Using Signal Envelope Detection for Online and  Offline RF MEMS Switch Testing"],"prefix":"10.1155","volume":"2008","author":[{"given":"E.","family":"Simeu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H. 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Test generation for accurate prediction of analog specifications Proceedings of the 18th IEEE VLSI Test Symposium (VTS \u203200) April-May 2000 Montreal Canada 137\u2013142 https:\/\/doi.org\/10.1109\/VTEST.2000.843837.","DOI":"10.1109\/VTEST.2000.843837"}],"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/2008\/294014.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/archive\/2008\/294014.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/2008\/294014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T13:27:32Z","timestamp":1719581252000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/2008\/294014"}},"subtitle":[],"editor":[{"given":"Jos\u00e9","family":"Machado da Silva","sequence":"additional","affiliation":[],"role":[{"role":"editor","vocabulary":"crossref"}]}],"short-title":[],"issued":{"date-parts":[[2008,1]]},"references-count":11,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2008,1]]}},"alternative-id":["10.1155\/2008\/294014"],"URL":"https:\/\/doi.org\/10.1155\/2008\/294014","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[2008,1]]},"assertion":[{"value":"2007-10-16","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2008-04-07","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2008-06-04","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"2008.294014"}}