{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,30]],"date-time":"2025-07-30T13:52:13Z","timestamp":1753883533587,"version":"3.41.2"},"reference-count":8,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2008,6,25]],"date-time":"2008-06-25T00:00:00Z","timestamp":1214352000000},"content-version":"vor","delay-in-days":176,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[2008,1]]},"abstract":"<jats:p>With the growing complexity of wireless systems on chip integrating hundreds\u2010of\u2010millions of transistors, electronic design methods need to be upgraded to reduce time\u2010to\u2010market. In this paper, the test benches defined for design validation or characterization of AMS &amp; RF SoCs are optimized and reused for production testing. Although the original validation test set allows the verification of both design functionalities and performances, this test set is not well adapted to manufacturing test due to its high execution time and high test equipment costs requirement. The optimization of this validation test set is based on the evaluation of each test vector. This evaluation relies on high\u2010level fault modeling and fault simulation. Hence, a fault model based on the variations of the parameters of high abstraction level descriptions and its related qualification metric are presented. The choice of functional or behavioral abstraction levels is discussed by comparing their impact on structural fault coverage. Experiments are performed on the receiver part of a WCDMA transceiver. Results show that for this SoC, using behavioral abstraction level is justified for the generation of manufacturing test benches.<\/jats:p>","DOI":"10.1155\/2008\/596146","type":"journal-article","created":{"date-parts":[[2008,6,26]],"date-time":"2008-06-26T07:31:59Z","timestamp":1214465519000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Choice of a High\u2010Level Fault Modelfor the Optimization of Validation Test Set Reused for Manufacturing Test"],"prefix":"10.1155","volume":"2008","author":[{"given":"Yves","family":"Joannon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincent","family":"Beroulle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chantal","family":"Robach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Smail","family":"Tedjini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Louis","family":"Carbonero","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2008,6,25]]},"reference":[{"key":"e_1_2_8_1_2","unstructured":"JoannonY. BeroulleV. KhouriR. RobachC. TedjiniS. andCarboneroJ.-L. Using of behavioral level AMS & RF simulation for validation test set optimization Proceedings of the 6th Workshop on Test of Wireless Circuits and Systems (WTW \u203207) May 2007 Berkeley Calif USA 62\u201367."},{"key":"e_1_2_8_2_2","unstructured":"IEEE 1076.1 workgroup Language Reference Manual http:\/\/www.vhdl.org\/analog."},{"key":"e_1_2_8_3_2","doi-asserted-by":"crossref","unstructured":"JoannonY. BeroulleV. KhouriR. RobachC. TedjiniS. andCarboneroJ.-L. Behavioral modeling of WCDMA transceiver with VHDL-AMS language Proceedings of the 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS \u203206) April 2006 Prague Czech Republic 111\u2013116 https:\/\/doi.org\/10.1109\/DDECS.2006.1649589.","DOI":"10.1109\/DDECS.2006.1649589"},{"volume-title":"The Designer\u2032s Guide to Verilog AMS","year":"2004","author":"Kundert K. S.","key":"e_1_2_8_4_2"},{"key":"e_1_2_8_5_2","unstructured":"MENTOR GRAPHICS CommLib RF VHDL-AMS Library Manual October 2005."},{"key":"e_1_2_8_6_2","doi-asserted-by":"crossref","unstructured":"SaabK. Ben-HamidaN. andKaminskaB. Parametric fault simulation and test vector generation Proceedings of the Design Automation and Test in Europe Conference & Exhibition (DATE \u203200) March 2000 Paris France 650\u2013656 https:\/\/doi.org\/10.1109\/DATE.2000.840855.","DOI":"10.1109\/DATE.2000.840855"},{"key":"e_1_2_8_7_2","unstructured":"KhouasA.andDerieuxA. Methodology for fast and accurate analog production test optimization Proceedings of the 5th IEEE International Mixed Signal Testing Workshop (IMSTW \u203299) June 1999 Whistler Canada 215\u2013219."},{"key":"e_1_2_8_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/81.873869"}],"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/2008\/596146.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/archive\/2008\/596146.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/2008\/596146","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T13:28:51Z","timestamp":1719581331000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/2008\/596146"}},"subtitle":[],"editor":[{"given":"Bozena","family":"Kaminska","sequence":"additional","affiliation":[],"role":[{"role":"editor","vocabulary":"crossref"}]}],"short-title":[],"issued":{"date-parts":[[2008,1]]},"references-count":8,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2008,1]]}},"alternative-id":["10.1155\/2008\/596146"],"URL":"https:\/\/doi.org\/10.1155\/2008\/596146","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[2008,1]]},"assertion":[{"value":"2007-10-11","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2008-04-09","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2008-06-25","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"596146"}}