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The microwave biosensor, consisting of a dielectric resonator coupled to the probe-tip, allows observation of the small variation of the glucose concentration changes in the ranges of 0\u2013300\u2009mg\/ml by measuring the microwave reflection coefficient<mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\"><mml:msub><mml:mrow><mml:mi>S<\/mml:mi><\/mml:mrow><mml:mrow><mml:mi>11<\/mml:mi><\/mml:mrow><\/mml:msub><\/mml:math>. We could observe the concentration of glucose with a detectable resolution up to 1\u2009mg\/ml at an operating frequency of about<mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\"><mml:mi>f<\/mml:mi><mml:mo>=<\/mml:mo><mml:mn>4<\/mml:mn><mml:mtext>-<\/mml:mtext><mml:mn>5<\/mml:mn><\/mml:math>\u2009GHz. The change of the glucose concentration is directly related to the change of the reflection coefficient due to the electromagnetic interaction between the microwave resonator and the glucose solution. The operational principal is explained by the plane-wave solution model. The measured signal-to-noise ratio was about 37\u2009dB, and the minimum detectible signal was about 0.003\u2009dB\/(mg\/ml). A glucose biosensor using a microwave resonator with probe provides a unique approach for glucose real-time monitoring.<\/jats:p>","DOI":"10.1155\/2010\/452163","type":"journal-article","created":{"date-parts":[[2010,12,29]],"date-time":"2010-12-29T14:37:31Z","timestamp":1293633451000},"page":"1-7","source":"Crossref","is-referenced-by-count":45,"title":["Real-Time Noninvasive Measurement of Glucose Concentration Using a Microwave Biosensor"],"prefix":"10.1155","volume":"2010","author":[{"given":"Arsen","family":"Bababjanyan","sequence":"first","affiliation":[{"name":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Republic of Korea"}]},{"given":"Harutyun","family":"Melikyan","sequence":"additional","affiliation":[{"name":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Republic of Korea"}]},{"given":"Seungwan","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Republic of Korea"}]},{"given":"Jongchel","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Republic of Korea"}]},{"given":"Kiejin","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Republic of Korea"}]},{"given":"Barry","family":"Friedman","sequence":"additional","affiliation":[{"name":"Department of Physics, Sam Houston State University, Huntsville, TX 77341, USA"}]}],"member":"311","reference":[{"issue":"12","key":"1","doi-asserted-by":"crossref","first-page":"983","DOI":"10.1002\/1521-4109(200108)13:12<983::AID-ELAN983>3.0.CO;2-#","volume":"13","year":"2001","journal-title":"Electroanalysis"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/S0956-5663(00)00076-2"},{"key":"3","doi-asserted-by":"crossref","first-page":"153","DOI":"10.1146\/annurev.bioeng.1.1.153","volume":"1","year":"1999","journal-title":"Annual Review of Biomedical Engineering"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2003.10.028"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/19.836320"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2003.08.009"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1063\/1.1492308"},{"issue":"2","key":"8","doi-asserted-by":"crossref","first-page":"440","DOI":"10.3938\/jkps.52.440","volume":"52","year":"2008","journal-title":"Journal of the Korean Physical Society"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1778477"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1063\/1.1351837"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1021\/ja051760i"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1063\/1.120918"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1063\/1.122605"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/19.816123"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1063\/1.1904713"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1063\/1.2374681"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1063\/1.2968115"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2008.06.024"},{"key":"19","doi-asserted-by":"publisher","DOI":"10.1016\/j.cap.2008.08.007"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/302"},{"key":"21","year":"1990"},{"issue":"11","key":"22","doi-asserted-by":"crossref","first-page":"934","DOI":"10.1088\/0953-2048\/9\/11\/003","volume":"9","year":"1996","journal-title":"Superconductor Science and Technology"},{"key":"23","year":"2004"}],"container-title":["Journal of Sensors"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2010\/452163.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2010\/452163.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2010\/452163.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T13:47:51Z","timestamp":1497880071000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.hindawi.com\/journals\/js\/2010\/452163\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010]]},"references-count":23,"alternative-id":["452163","452163"],"URL":"https:\/\/doi.org\/10.1155\/2010\/452163","relation":{},"ISSN":["1687-725X","1687-7268"],"issn-type":[{"value":"1687-725X","type":"print"},{"value":"1687-7268","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010]]}}}