{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:42:51Z","timestamp":1740134571382,"version":"3.37.3"},"reference-count":17,"publisher":"Wiley","license":[{"start":{"date-parts":[[2013,1,1]],"date-time":"2013-01-01T00:00:00Z","timestamp":1356998400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"],"award-info":[{"award-number":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"],"award-info":[{"award-number":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"],"award-info":[{"award-number":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"],"award-info":[{"award-number":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Ministry Level Pre-Research Foundation of China","award":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"],"award-info":[{"award-number":["61071029","60934002","61271035","61201009","9140A17060411DZ0205"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Applied Mathematics"],"published-print":{"date-parts":[[2013]]},"abstract":"<jats:p>The tolerance handling in analogue fault diagnosis is a challenging problem. Although lots of methods are effective for fault diagnosis, it is hard to apply them to the case with tolerance influence. In this paper, a robust statistics-based approach is introduced for tolerance-influencing fault diagnosis. The advantage of this proposed method is that it can accurately locate the data fusion among fault states. In addition, the results in analogue benchmark (e.g., linear voltage divider circuit) indicate that it is effective in fault diagnosis in accordance with given fault diagnostic requirements (e.g., fault diagnosis error, fault detection rate).<\/jats:p>","DOI":"10.1155\/2013\/414120","type":"journal-article","created":{"date-parts":[[2013,11,27]],"date-time":"2013-11-27T18:01:17Z","timestamp":1385575277000},"page":"1-9","source":"Crossref","is-referenced-by-count":1,"title":["Handing Tolerance Problem in Fault Diagnosis of Linear-Analogue Circuits with Accurate Statistics Approach"],"prefix":"10.1155","volume":"2013","author":[{"given":"Xin","family":"Gao","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"}]},{"given":"HouJun","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"}]},{"given":"Zhen","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"}]}],"member":"311","reference":[{"key":"1","first-page":"252","volume":"31","year":"2001","journal-title":"Microelectronics"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.809075"},{"issue":"2","key":"3","doi-asserted-by":"crossref","first-page":"149","DOI":"10.1002\/cta.4490130205","volume":"13","year":"1985","journal-title":"International Journal of Circuit Theory and Applications"},{"issue":"6","key":"4","first-page":"243","volume":"130","year":"1983","journal-title":"IEE Proceedings G"},{"key":"5","first-page":"583","volume":"4","year":"2009","journal-title":"Metrology and Measurement Systems"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.3233\/IFS-2010-0471"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1023\/A:1012864504306"},{"key":"8","doi-asserted-by":"crossref","first-page":"291","DOI":"10.1007\/s10836-011-5275-y","volume":"28","year":"2012","journal-title":"Journal of Electronic Testing"},{"key":"9","first-page":"1","volume":"22","year":"2006","journal-title":"IEEE Transactions on Automatic Control"},{"key":"10","first-page":"61","volume":"16","year":"2009","journal-title":"Metrology and Measurement Systems"},{"issue":"7","key":"11","doi-asserted-by":"crossref","first-page":"496","DOI":"10.1109\/TCS.1979.1084664","volume":"26","year":"1979","journal-title":"IEEE Transactions on Circuits and Systems"},{"issue":"7","key":"12","doi-asserted-by":"crossref","first-page":"505","DOI":"10.1109\/TCS.1979.1084667","volume":"26","year":"1979","journal-title":"IEEE Transactions on Circuits and Systems"},{"year":"2007","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2050356"},{"key":"15","first-page":"1245","volume":"47","year":"2007","journal-title":"Journal of Tsinghua University"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/56.3.635"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1080\/00949659008811236"}],"container-title":["Journal of Applied Mathematics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/jam\/2013\/414120.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jam\/2013\/414120.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jam\/2013\/414120.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T23:17:43Z","timestamp":1498087063000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.hindawi.com\/journals\/jam\/2013\/414120\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013]]},"references-count":17,"alternative-id":["414120","414120"],"URL":"https:\/\/doi.org\/10.1155\/2013\/414120","relation":{},"ISSN":["1110-757X","1687-0042"],"issn-type":[{"type":"print","value":"1110-757X"},{"type":"electronic","value":"1687-0042"}],"subject":[],"published":{"date-parts":[[2013]]}}}