{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T17:18:35Z","timestamp":1740158315200,"version":"3.37.3"},"reference-count":5,"publisher":"Wiley","license":[{"start":{"date-parts":[[2013,1,1]],"date-time":"2013-01-01T00:00:00Z","timestamp":1356998400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electrical and Computer Engineering"],"published-print":{"date-parts":[[2013]]},"abstract":"<jats:p>We are examining different configurations and circuit topologies for arithmetic components such as adder and compressor circuits using both symmetric and asymmetric work-function FinFETs. Based on extensive characterization data, for the carry generation of a mirror full adder using symmetric devices, both leakage current and delay are decreased by 25% and 50%, respectively, compared to results in the literature. For the 14-transistor (14T) full adder topology, both leakage and delay are decreased by 23% and 29%, respectively, compared to the mirror topology. The 14T adder topology, using asymmetric devices without any additional power supply, achives reduction in leakage current by 85% with a small degradation of 7% in delay. The compressor circuits, using asymmetric devices for one of the proposed configurations, achieve reduction in both leakage current and delay by 86% and 4%, respectively. All simulations are based on a 25\u2009nm FinFET technology using the University of Florida UFDG model.<\/jats:p>","DOI":"10.1155\/2013\/454392","type":"journal-article","created":{"date-parts":[[2013,10,7]],"date-time":"2013-10-07T17:03:11Z","timestamp":1381165391000},"page":"1-13","source":"Crossref","is-referenced-by-count":2,"title":["Ultra-Low Leakage Arithmetic Circuits Using Symmetric and Asymmetric FinFETs"],"prefix":"10.1155","volume":"2013","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0658-3182","authenticated-orcid":true,"given":"Farid","family":"Moshgelani","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Royal Military College of Canada, P.O. Box 17000, Station Forces, Kingston ON, Canada K7K 7B4"}]},{"given":"Dhamin","family":"Al-Khalili","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Royal Military College of Canada, P.O. Box 17000, Station Forces, Kingston ON, Canada K7K 7B4"}]},{"given":"C\u00f4me","family":"Rozon","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Royal Military College of Canada, P.O. Box 17000, Station Forces, Kingston ON, Canada K7K 7B4"}]}],"member":"311","reference":[{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009633"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2040094"},{"year":"2003","key":"6"},{"journal-title":"Proceedings of the IEEE Workshop on Signal Processing Systems (SiPS '99)","first-page":"713","year":"1999","key":"8"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.835683"}],"container-title":["Journal of Electrical and Computer Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2013\/454392.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2013\/454392.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2013\/454392.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,8,18]],"date-time":"2016-08-18T15:05:25Z","timestamp":1471532725000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.hindawi.com\/journals\/jece\/2013\/454392\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013]]},"references-count":5,"alternative-id":["454392","454392"],"URL":"https:\/\/doi.org\/10.1155\/2013\/454392","relation":{},"ISSN":["2090-0147","2090-0155"],"issn-type":[{"type":"print","value":"2090-0147"},{"type":"electronic","value":"2090-0155"}],"subject":[],"published":{"date-parts":[[2013]]}}}