{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T11:05:21Z","timestamp":1740135921790,"version":"3.37.3"},"reference-count":7,"publisher":"Wiley","license":[{"start":{"date-parts":[[2014,11,16]],"date-time":"2014-11-16T00:00:00Z","timestamp":1416096000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[2014,11,16]]},"abstract":"<jats:p>We propose an approach to design of an algebraic signature analyzer that can be used for mixed-signal systems testing. The analyzer does not contain carry propagating circuitry, which improves its performance as well as fault tolerance. The common design technique of a signature analyzer for mixed-signal systems is based on the rules of an arithmetic finite field. The application of this technique to the systems with an arbitrary radix is a challenging task and the devices designed possess high hardware complexity. The proposed technique is simple and applicable to systems of any size and radix. The hardware complexity is low. The technique can also be used in arithmetic\/algebraic coding and cryptography.<\/jats:p>","DOI":"10.1155\/2014\/465907","type":"journal-article","created":{"date-parts":[[2014,11,16]],"date-time":"2014-11-16T21:02:41Z","timestamp":1416171761000},"page":"1-8","source":"Crossref","is-referenced-by-count":2,"title":["On the Use of an Algebraic Signature Analyzer for Mixed-Signal Systems Testing"],"prefix":"10.1155","volume":"2014","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4264-4117","authenticated-orcid":true,"given":"Vadim","family":"Geurkov","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, Toronto, ON, Canada M5B 2K3"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lev","family":"Kirischian","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, Toronto, ON, Canada M5B 2K3"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","reference":[{"issue":"9","key":"1","first-page":"2","volume":"28","year":"1977","journal-title":"Hewlett-Packard Journal"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/12.90252"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/43.703834"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/82.142030"},{"year":"1972","key":"13"},{"year":"2004","key":"15"},{"issue":"1","key":"16","first-page":"8","volume":"1","year":"2010","journal-title":"i-manager's Journal on Electronics Engineering"}],"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/2014\/465907.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/archive\/2014\/465907.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/archive\/2014\/465907.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,12,9]],"date-time":"2020-12-09T16:16:39Z","timestamp":1607530599000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/journals\/vlsi\/2014\/465907\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,11,16]]},"references-count":7,"alternative-id":["465907","465907"],"URL":"https:\/\/doi.org\/10.1155\/2014\/465907","relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[2014,11,16]]}}}