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By analyzing the general model, we then gave a general mathematical expression of the effective equivalent resistor of the element being tested in VFCs. Finally, we evaluated the features of VFCs with simulation and test experiment. The results show that the expression is applicable to analyze the VFCs\u2019 performance of parameters such as the multiplexers\u2019 switch resistors, the nonscanned elements, and array size.<\/jats:p>","DOI":"10.1155\/2015\/913828","type":"journal-article","created":{"date-parts":[[2015,6,23]],"date-time":"2015-06-23T17:38:13Z","timestamp":1435081093000},"page":"1-8","source":"Crossref","is-referenced-by-count":9,"title":["General Voltage Feedback Circuit Model in the Two-Dimensional Networked Resistive Sensor Array"],"prefix":"10.1155","volume":"2015","author":[{"given":"JianFeng","family":"Wu","sequence":"first","affiliation":[{"name":"Jiangsu Key Lab of Remote Measurement and Control, School of Instrument Science and Engineering, Southeast University, Nanjing 210096, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lei","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing Institute of Technology, Nanjing 211167, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"JianQing","family":"Li","sequence":"additional","affiliation":[{"name":"Jiangsu Key Lab of Remote Measurement and Control, School of Instrument Science and Engineering, Southeast University, Nanjing 210096, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"311","reference":[{"key":"2","doi-asserted-by":"publisher","DOI":"10.1177\/027836499000900603"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/0263-2241(93)90039-k"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/647427"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.3390\/s110303249"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1108\/02602281211257506"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-009-1940-z"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.3969\/j.issn.1004-1699.2011.11.026"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2008.10.013"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2012.08.006"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2063699"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2060186"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1016\/s0924-4247(98)00204-0"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2010.08.004"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2014.02.033"},{"issue":"2","key":"17","doi-asserted-by":"crossref","first-page":"1020","DOI":"10.1109\/JSEN.2014.2359967","volume":"15","year":"2015","journal-title":"IEEE Sensors Journal"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.3390\/s140712816"}],"container-title":["Journal of Sensors"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2015\/913828.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2015\/913828.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2015\/913828.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T10:23:28Z","timestamp":1498213408000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.hindawi.com\/journals\/js\/2015\/913828\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015]]},"references-count":16,"alternative-id":["913828","913828"],"URL":"https:\/\/doi.org\/10.1155\/2015\/913828","relation":{},"ISSN":["1687-725X","1687-7268"],"issn-type":[{"value":"1687-725X","type":"print"},{"value":"1687-7268","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015]]}}}