{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T11:58:44Z","timestamp":1742385524287,"version":"3.37.3"},"reference-count":16,"publisher":"Wiley","license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities of China","doi-asserted-by":"crossref","award":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"],"award-info":[{"award-number":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Science and Technology Support Project of Sichuan Province, China","award":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"],"award-info":[{"award-number":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"]}]},{"name":"Science and Technology Support Project of Sichuan Province, China","award":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"],"award-info":[{"award-number":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"]}]},{"name":"Chengdu Technological University","award":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"],"award-info":[{"award-number":["ZYGX2015J074","2014FZ0037","2015FZ0111","KY1311018B"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Computational Intelligence and Neuroscience"],"published-print":{"date-parts":[[2016]]},"abstract":"<jats:p>This paper presents a novel fault diagnosis method for analog circuits using ensemble empirical mode decomposition (EEMD), relative entropy, and extreme learning machine (ELM). First, nominal and faulty response waveforms of a circuit are measured, respectively, and then are decomposed into intrinsic mode functions (IMFs) with the EEMD method. Second, through comparing the nominal IMFs with the faulty IMFs, kurtosis and relative entropy are calculated for each IMF. Next, a feature vector is obtained for each faulty circuit. Finally, an ELM classifier is trained with these feature vectors for fault diagnosis. Via validating with two benchmark circuits, results show that the proposed method is applicable for analog fault diagnosis with acceptable levels of accuracy and time cost.<\/jats:p>","DOI":"10.1155\/2016\/7657054","type":"journal-article","created":{"date-parts":[[2016,9,8]],"date-time":"2016-09-08T21:23:41Z","timestamp":1473369821000},"page":"1-9","source":"Crossref","is-referenced-by-count":15,"title":["Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM"],"prefix":"10.1155","volume":"2016","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0883-8185","authenticated-orcid":true,"given":"Jian","family":"Xiong","sequence":"first","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"},{"name":"Department of Communication Engineering, Chengdu Technological University, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shulin","family":"Tian","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0834-5164","authenticated-orcid":true,"given":"Chenglin","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","reference":[{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2010.2050356"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2224074"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/82.823545"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5520-x"},{"issue":"1","key":"6","doi-asserted-by":"crossref","first-page":"42","DOI":"10.1109\/54.902821","volume":"18","year":"2001","journal-title":"Design & Test of Computers IEEE"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2007.02.007"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-013-9614-3"},{"key":"10","doi-asserted-by":"crossref","first-page":"2338","DOI":"10.1016\/j.ijleo.2015.05.145","volume":"126","year":"2015","journal-title":"Optik"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2025068"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1142\/s1793536909000047"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.3390\/e17106683"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2005.12.126"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.08.009"},{"key":"20","doi-asserted-by":"crossref","first-page":"17","DOI":"10.3724\/SP.J.1187.2010.00017","volume":"24","year":"2010","journal-title":"Journal of Electronic Measurement & Instrument"},{"year":"1993","key":"21"},{"volume":"111","journal-title":"Journal of Vibration & Acoustics","year":"1989","key":"19"}],"container-title":["Computational Intelligence and Neuroscience"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/cin\/2016\/7657054.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/cin\/2016\/7657054.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/cin\/2016\/7657054.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,5,17]],"date-time":"2020-05-17T04:48:31Z","timestamp":1589690911000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/journals\/cin\/2016\/7657054\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":16,"alternative-id":["7657054","7657054"],"URL":"https:\/\/doi.org\/10.1155\/2016\/7657054","relation":{},"ISSN":["1687-5265","1687-5273"],"issn-type":[{"type":"print","value":"1687-5265"},{"type":"electronic","value":"1687-5273"}],"subject":[],"published":{"date-parts":[[2016]]}}}