{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T14:35:38Z","timestamp":1740148538666,"version":"3.37.3"},"reference-count":6,"publisher":"Wiley","license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11305126","11235008","SKLIPR1211"],"award-info":[{"award-number":["11305126","11235008","SKLIPR1211"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11305126","11235008","SKLIPR1211"],"award-info":[{"award-number":["11305126","11235008","SKLIPR1211"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Foundation of State Key Laboratory of China","award":["11305126","11235008","SKLIPR1211"],"award-info":[{"award-number":["11305126","11235008","SKLIPR1211"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Sensors"],"published-print":{"date-parts":[[2016]]},"abstract":"<jats:p>The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a<jats:sup>60<\/jats:sup>Co<jats:italic>\u03b3<\/jats:italic>-ray source. The parameters of DALSA\u2019s linear CCD were measured at the CCD test systems as the EMVA1288 standard before and after the radiation. The dark current, dark signal nonuniformity (DSNU), photo response nonuniformity (PRNU), saturation output, full-well capacity (FWC), quantum efficiency (QE), and responsivity versus the TID were analyzed. The behavior of the tested CCD had shown a remarkable degradation after radiation. The degradation mechanisms of the CCD induced by TID damage were also discussed.<\/jats:p>","DOI":"10.1155\/2016\/9604042","type":"journal-article","created":{"date-parts":[[2016,7,12]],"date-time":"2016-07-12T17:27:54Z","timestamp":1468344474000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage"],"prefix":"10.1155","volume":"2016","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2502-9550","authenticated-orcid":true,"given":"Zujun","family":"Wang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O. 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