{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T14:17:14Z","timestamp":1740147434319,"version":"3.37.3"},"reference-count":0,"publisher":"Wiley","license":[{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Control Science and Engineering"],"published-print":{"date-parts":[[2017]]},"DOI":"10.1155\/2017\/1026759","type":"journal-article","created":{"date-parts":[[2017,5,24]],"date-time":"2017-05-24T17:01:09Z","timestamp":1495645269000},"page":"1-3","source":"Crossref","is-referenced-by-count":2,"title":["Fault Diagnosis and Application to Modern Systems"],"prefix":"10.1155","volume":"2017","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3998-7060","authenticated-orcid":true,"given":"Xiao","family":"He","sequence":"first","affiliation":[{"name":"Department of Automation, TNList, Tsinghua University, Beijing 100084, China"}]},{"given":"Zidong","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Computer Science, Brunel University London, London UB8 3PH, UK"}]},{"given":"Gang","family":"Li","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Opto-Electronics Engineering, Beihang University, Beijing 100191, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3128-7385","authenticated-orcid":true,"given":"Zhijie","family":"Zhou","sequence":"additional","affiliation":[{"name":"Xi\u2019an High-Tech Institute, Xi\u2019an 710025, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6245-1550","authenticated-orcid":true,"given":"Youqing","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao 266590, China"}]}],"member":"311","container-title":["Journal of Control Science and Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/jcse\/2017\/1026759.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jcse\/2017\/1026759.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jcse\/2017\/1026759.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,24]],"date-time":"2017-05-24T17:01:10Z","timestamp":1495645270000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/journals\/jcse\/2017\/1026759\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"references-count":0,"alternative-id":["1026759","1026759"],"URL":"https:\/\/doi.org\/10.1155\/2017\/1026759","relation":{},"ISSN":["1687-5249","1687-5257"],"issn-type":[{"type":"print","value":"1687-5249"},{"type":"electronic","value":"1687-5257"}],"subject":[],"published":{"date-parts":[[2017]]}}}