{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T15:25:51Z","timestamp":1761060351762,"version":"3.37.3"},"reference-count":20,"publisher":"Wiley","license":[{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Major and Key Project of Natural Science of Anhui Provincial Department of Education","award":["KJ2015ZD09","KJ2016A085","1608085MF129"],"award-info":[{"award-number":["KJ2015ZD09","KJ2016A085","1608085MF129"]}]},{"name":"Major and Key Project of Natural Science of Anhui Provincial Department of Education","award":["KJ2015ZD09","KJ2016A085","1608085MF129"],"award-info":[{"award-number":["KJ2015ZD09","KJ2016A085","1608085MF129"]}]},{"DOI":"10.13039\/501100003995","name":"Anhui Provincial Natural Science Foundation","doi-asserted-by":"crossref","award":["KJ2015ZD09","KJ2016A085","1608085MF129"],"award-info":[{"award-number":["KJ2015ZD09","KJ2016A085","1608085MF129"]}],"id":[{"id":"10.13039\/501100003995","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Electrical and Computer Engineering"],"published-print":{"date-parts":[[2017]]},"abstract":"<jats:p>In recent years, learning based machine intelligence has aroused a lot of attention across science and engineering. Particularly in the field of automatic industry inspection, the machine learning based vision inspection plays a more and more important role in defect identification and feature extraction. Through learning from image samples, many features of industry objects, such as shapes, positions, and orientations angles, can be obtained and then can be well utilized to determine whether there is defect or not. However, the robustness and the quickness are not easily achieved in such inspection way. In this work, for solar panel vision inspection, we present an extreme learning machine (ELM) and moving least square regression based approach to identify solder joint defect and detect the panel position. Firstly, histogram peaks distribution (HPD) and fractional calculus are applied for image preprocessing. Then an ELM-based defective solder joints identification is discussed in detail. Finally, moving least square regression (MLSR) algorithm is introduced for solar panel position determination. Experimental results and comparisons show that the proposed ELM and MLSR based inspection method is efficient not only in detection accuracy but also in processing speed.<\/jats:p>","DOI":"10.1155\/2017\/7406568","type":"journal-article","created":{"date-parts":[[2017,5,16]],"date-time":"2017-05-16T17:00:59Z","timestamp":1494954059000},"page":"1-10","source":"Crossref","is-referenced-by-count":6,"title":["Extreme Learning Machine and Moving Least Square Regression Based Solar Panel Vision Inspection"],"prefix":"10.1155","volume":"2017","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7563-2676","authenticated-orcid":true,"given":"Heng","family":"Liu","sequence":"first","affiliation":[{"name":"School of Computer Science and Technology, Anhui University of Technology, Maxiang Road, Ma\u2019anshan 243032, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Caihong","family":"Zhang","sequence":"additional","affiliation":[{"name":"BOCOM Smart Network Technologies Inc., Shanghai 200433, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dongdong","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Anhui University of Technology, Maxiang Road, Ma\u2019anshan 243032, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","reference":[{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00152-X"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/s40684-016-0039-x"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/5797654"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2006.877265"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.3390\/s151025882"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2011.03.007"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.013592"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/34.3902"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-006-0051-1"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(98)00103-4"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2006.12.010"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2010.06.022"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1214\/14-PS243"},{"year":"1993","series-title":"A Wiley-Interscience Publication","key":"25"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2011.2168604"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2015.2424995"},{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2570569"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/mci.2015.2405316"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/159694"},{"year":"2012","key":"17"}],"container-title":["Journal of Electrical and Computer Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2017\/7406568.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2017\/7406568.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2017\/7406568.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,16]],"date-time":"2017-05-16T17:01:08Z","timestamp":1494954068000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/journals\/jece\/2017\/7406568\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"references-count":20,"alternative-id":["7406568","7406568"],"URL":"https:\/\/doi.org\/10.1155\/2017\/7406568","relation":{},"ISSN":["2090-0147","2090-0155"],"issn-type":[{"type":"print","value":"2090-0147"},{"type":"electronic","value":"2090-0155"}],"subject":[],"published":{"date-parts":[[2017]]}}}