{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T16:21:31Z","timestamp":1774369291133,"version":"3.50.1"},"reference-count":26,"publisher":"Wiley","license":[{"start":{"date-parts":[[2018,11,1]],"date-time":"2018-11-01T00:00:00Z","timestamp":1541030400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Security and Communication Networks"],"published-print":{"date-parts":[[2018,11,1]]},"abstract":"<jats:p>Wireless communication protocols are indispensable in Internet of Things (IoT), which refer to rules and conventions that must be followed by both entities to complete wireless communication or service. Wireless protocol conformance testing concerns an effective way to judge whether a wireless protocol is carried out as expected. Starting from existing test sequence generation methods in conformance testing, an improved method based on overlapping by invertibility and multiple unique input\/output (UIO) sequences is proposed in this paper. The method is accomplished in two steps: first, maximum-length invertibility-dependent overlapping sequences (IDOSs) are constructed, then a minimum-length rural postman tour covering the just constructed set of maximum-length IDOSs is generated and a test sequence is extracted from the tour. The soundness and effectiveness of the method are analyzed. Theory and experiment show that desirable test sequences can be yielded by the proposed method to reveal violations of wireless communication protocols in IoT.<\/jats:p>","DOI":"10.1155\/2018\/3723691","type":"journal-article","created":{"date-parts":[[2018,11,1]],"date-time":"2018-11-01T19:50:51Z","timestamp":1541101851000},"page":"1-13","source":"Crossref","is-referenced-by-count":5,"title":["Test Sequence Reduction of Wireless Protocol Conformance Testing to Internet of Things"],"prefix":"10.1155","volume":"2018","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3133-5669","authenticated-orcid":true,"given":"Weiwei","family":"Lin","sequence":"first","affiliation":[{"name":"School of Computer Engineering and Science, Shanghai University, Shanghai 200444, China"},{"name":"Shanghai Key Laboratory of Computer Software Testing and Evaluating, Shanghai 201114, China"},{"name":"Department of Information Science and Technology, Taishan University, Taian 271000, 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