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First, the way to add white noise in the EEMD method is processed, and then the permutation entropy algorithm is used to identify the nature of the components obtained during the decomposition. Then the wavelet transform modulus maximum denoising method is used to deal with the IMF components of the high-frequency part obtained before. Finally, the processed IMF results and residual difference are summed up. The results show that after processing, the noise component in the signal is less and the original information is more reserved, which prevents the signal distortion to a great extent and provides more effective data for subsequent processing. In the experiment, the crack defect data collected by the electromagnetic ultrasonic experiment system were processed by the improved EEMD method. Compared with the traditional EEMD method, it can retain the information of crack location more accurately, which proves the effectiveness of the proposed method.<\/jats:p>","DOI":"10.1155\/2018\/5405639","type":"journal-article","created":{"date-parts":[[2018,11,8]],"date-time":"2018-11-08T18:33:10Z","timestamp":1541701990000},"page":"1-13","source":"Crossref","is-referenced-by-count":3,"title":["A Novel Denoising Algorithm of Electromagnetic Ultrasonic Detection Signal Based on Improved EEMD Method"],"prefix":"10.1155","volume":"2018","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6538-4442","authenticated-orcid":true,"given":"Wenkang","family":"Gong","sequence":"first","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, Liaoning 110003, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3649-8894","authenticated-orcid":true,"given":"Qi","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, Liaoning 110003, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9785-6248","authenticated-orcid":true,"given":"Wenhao","family":"Du","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, Liaoning 110003, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1190-9503","authenticated-orcid":true,"given":"Weichen","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, Liaoning 110003, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1505-1268","authenticated-orcid":true,"given":"Gang","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, Liaoning 110003, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","reference":[{"issue":"8","key":"1","first-page":"217","volume":"12","year":"2016","journal-title":"Computer Knowledge and Technology"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/tip.2010.2055570"},{"issue":"10","key":"3","doi-asserted-by":"crossref","first-page":"107002","DOI":"10.1117\/1.3002369","volume":"47","year":"2008","journal-title":"Optical Engineering"},{"issue":"12","key":"4","first-page":"5","volume":"36","year":"2017","journal-title":"Measurement and Control Technology"},{"issue":"2","key":"5","first-page":"42","volume":"44","year":"2016","journal-title":"Power System Protection and Control"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1142\/s1793536909000047"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1103\/physrevlett.88.174102"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.3724\/sp.j.1187.2013.00683"}],"container-title":["Journal of Electrical and Computer Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2018\/5405639.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2018\/5405639.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/jece\/2018\/5405639.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,11,8]],"date-time":"2018-11-08T18:33:12Z","timestamp":1541701992000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/journals\/jece\/2018\/5405639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,11,8]]},"references-count":8,"alternative-id":["5405639","5405639"],"URL":"https:\/\/doi.org\/10.1155\/2018\/5405639","relation":{},"ISSN":["2090-0147","2090-0155"],"issn-type":[{"value":"2090-0147","type":"print"},{"value":"2090-0155","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,11,8]]}}}