{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,27]],"date-time":"2025-09-27T00:46:13Z","timestamp":1758933973502,"version":"3.37.3"},"reference-count":18,"publisher":"Wiley","license":[{"start":{"date-parts":[[2018,7,17]],"date-time":"2018-07-17T00:00:00Z","timestamp":1531785600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Open Research Fund of the State Key Laboratory for Manufacturing Systems Engineering","award":["sklms2018005","3182021","51375036","51775017"],"award-info":[{"award-number":["sklms2018005","3182021","51375036","51775017"]}]},{"DOI":"10.13039\/501100005089","name":"Beijing Municipal Natural Science Foundation","doi-asserted-by":"publisher","award":["sklms2018005","3182021","51375036","51775017"],"award-info":[{"award-number":["sklms2018005","3182021","51375036","51775017"]}],"id":[{"id":"10.13039\/501100005089","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["sklms2018005","3182021","51375036","51775017"],"award-info":[{"award-number":["sklms2018005","3182021","51375036","51775017"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["sklms2018005","3182021","51375036","51775017"],"award-info":[{"award-number":["sklms2018005","3182021","51375036","51775017"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Journal of Sensors"],"published-print":{"date-parts":[[2018,7,17]]},"abstract":"<jats:p>This paper presents a high-precision control scheme based on active disturbance rejection control (ADRC) to improve the stabilization accuracy of an inertially stabilized platform (ISP) for aerial remote sensing applications. The ADRC controller is designed to suppress the effects of the disturbance on the stabilization accuracy that consists of a tracking differentiator, a nonlinear state error feedback, and an extended state observer. By the ADRC controller, the effects of both the internal uncertain dynamics and the external multisource disturbances on the system output are compensated as a total disturbance in real time. The disturbance rejection ability of the ADRC is analyzed by simulations. To verify the method, the experiments are conducted. The results show that compared with the conventional PID controller, the ADRC has excellent capability in disturbance rejection, by which the effect of main friction disturbance on the control system can be weakened seriously and the stabilization accuracy of the ISP is improved significantly.<\/jats:p>","DOI":"10.1155\/2018\/7295852","type":"journal-article","created":{"date-parts":[[2018,7,18]],"date-time":"2018-07-18T13:29:54Z","timestamp":1531920594000},"page":"1-9","source":"Crossref","is-referenced-by-count":16,"title":["A High-Precision Control Scheme Based on Active Disturbance Rejection Control for a Three-Axis Inertially Stabilized Platform for Aerial Remote Sensing Applications"],"prefix":"10.1155","volume":"2018","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3439-7371","authenticated-orcid":true,"given":"Xiangyang","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Instrumentation Science and Opto-electronics Engineering, Beihang University (BUAA), Beijing 100191, China"},{"name":"State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China"}]},{"given":"Chao","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Instrumentation Science and Opto-electronics Engineering, Beihang University (BUAA), Beijing 100191, China"}]},{"given":"Beilei","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Instrumentation Science and Opto-electronics Engineering, Beihang University (BUAA), Beijing 100191, China"}]},{"given":"Libo","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, Xi\u2019an 710049, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8213-2792","authenticated-orcid":true,"given":"Zhuangsheng","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Instrumentation Science and Opto-electronics Engineering, Beihang University (BUAA), Beijing 100191, China"}]}],"member":"311","reference":[{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2007.910201"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.3390\/s16030366"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechatronics.2014.09.004"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.3182\/20130410-3-CN-2034.00071"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/7964727"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2435004"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1007\/BF02909682"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2005.847583"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2014.02.002"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2008.2008638"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2029528"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1007\/s11424-012-1022-4"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.03.029"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2009.2024591"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.14569\/IJACSA.2016.071032"},{"volume":"3","journal-title":"Control and Decision","year":"1995","key":"22"},{"key":"23","first-page":"13","volume":"9","year":"2002","journal-title":"Control Engineering of China"},{"volume":"11","journal-title":"High Voltage Engineering","year":"2007","key":"25"}],"container-title":["Journal of Sensors"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2018\/7295852.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2018\/7295852.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2018\/7295852.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,7,18]],"date-time":"2018-07-18T13:30:03Z","timestamp":1531920603000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/journals\/js\/2018\/7295852\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7,17]]},"references-count":18,"alternative-id":["7295852","7295852"],"URL":"https:\/\/doi.org\/10.1155\/2018\/7295852","relation":{},"ISSN":["1687-725X","1687-7268"],"issn-type":[{"type":"print","value":"1687-725X"},{"type":"electronic","value":"1687-7268"}],"subject":[],"published":{"date-parts":[[2018,7,17]]}}}