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These modifications are called hardware Trojan (HT). HT is difficult to detect due to its high concealment and diversity of implementation. HT detection based on the side channel is a relatively effective detection method because it does not need to trigger the Trojan or destroy the chip. However, detection based on the side channel faces two major challenges. Firstly, the side channel detection is quite dependent on the golden model. The second one relates to the accuracy of the samples. Side channel information of the chip comes from the hardware manufacturing process and implementation, so it is obviously affected by process variation. In the existing work, many self-reference detection methods have been proposed to solve the problem of missing golden models. However, the existing methods often have special requirements for the circuit structure (such as the need for self-similar structures in the circuit). And, they can hardly resist process variation. This paper combines design and detection. We select the power consumption generated at different times and construct two self-reference \u2018knapsack\u2019 to detect HT. The solution proposed in this article is a kind of self-reference method, but we need neither self-similar structures nor the same state of some clocks in the circuit. Meanwhile, by constructing the \u2018knapsack,\u2019 we reduce the impact of process variation on detection accuracy because the process variation in the two sets of power consumption is balanced.<\/jats:p>","DOI":"10.1155\/2021\/8839222","type":"journal-article","created":{"date-parts":[[2021,3,3]],"date-time":"2021-03-03T16:32:52Z","timestamp":1614789172000},"page":"1-15","source":"Crossref","is-referenced-by-count":1,"title":["Process Variation-Resistant Golden-Free Hardware Trojan Detection through a Power Side Channel"],"prefix":"10.1155","volume":"2021","author":[{"given":"Yidong","family":"Yuan","sequence":"first","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin 300072, China"},{"name":"Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 100192, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0546-8131","authenticated-orcid":true,"given":"Yao","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Cyber Science and Engineering, Wuhan University, Wuhan 430072, China"},{"name":"Key Laboratory of Aerospace Infomation Security and Trusted Computing, Ministry of Education, Wuhan University, Wuhan 430072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiqiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin 300072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xige","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Tianjin University, Tianjin 300072, China"},{"name":"Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 100192, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2218-0164","authenticated-orcid":true,"given":"Ming","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Cyber Science and Engineering, Wuhan University, Wuhan 430072, China"},{"name":"Key Laboratory of Aerospace Infomation Security and Trusted Computing, Ministry of Education, Wuhan University, Wuhan 430072, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","reference":[{"volume-title":"Trust in Integrated Circuits (TIC)","year":"2007","author":"DARPA","key":"1"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7169073"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/mc.2010.299"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/CADGRAPHICS.2015.41"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TrustCom.2011.82"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516654"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.18"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/mc.2016.225"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0352"},{"article-title":"Hardware Trojans classification for gate-level netlists based on machine learning","author":"K. 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