{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T05:15:35Z","timestamp":1778908535352,"version":"3.51.4"},"reference-count":45,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2021,8,3]],"date-time":"2021-08-03T00:00:00Z","timestamp":1627948800000},"content-version":"vor","delay-in-days":214,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["41775030"],"award-info":[{"award-number":["41775030"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61731001"],"award-info":[{"award-number":["61731001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61527805"],"award-info":[{"award-number":["61527805"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Journal of Sensors"],"published-print":{"date-parts":[[2021,1]]},"abstract":"<jats:p>Metamaterial\u2010based microwave sensor having novel and compact structure of the resonators and the slotted microstrip transmission line is proposed for highly precise measurement of dielectric properties of the materials under test (MUTs). The proposed sensor is designed and simulated on Rogers\u2019 substrate RO4003C by using the ANSYS HFSS software. A single and accumulative notch depth of \u201044.29\u2009dB in the transmission coefficient (<jats:italic>S<\/jats:italic><jats:sub>21<\/jats:sub>) is achieved at the resonant frequency of 5.15\u2009GHz. The negative constitutive parameters (permittivity and permeability) are extracted from the <jats:italic>S<\/jats:italic>\u2010parameters which are the basic property of metamaterials or left handed materials (LHMs). The proposed sensor is fabricated and measured through the PNA\u2010X (N5247A). The sensitivity analysis is performed by placing various standard dielectric materials onto the sensor and measuring the shift in the resonant frequencies of the MUTs. A parabolic equation of the proposed sensor is formulated to approximate the resonant frequency and the relative permittivity of the MUTs. A very strong agreement among the simulated, measured, and calculated results is found which reveals that the proposed sensor is a highly precise sensor for the characterization of dielectric properties of the MUTs. Error analysis is performed to determine the accuracy of the proposed sensor. A very small percentage of error (0.81%) and a very low standard deviation are obtained which indicate high accuracy of the proposed sensor.<\/jats:p>","DOI":"10.1155\/2021\/8888187","type":"journal-article","created":{"date-parts":[[2021,8,4]],"date-time":"2021-08-04T00:20:05Z","timestamp":1628036405000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["High\u2010Precision Complementary Metamaterial Sensor Using Slotted Microstrip Transmission Line"],"prefix":"10.1155","volume":"2021","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6366-6633","authenticated-orcid":false,"given":"Abdul","family":"Samad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6051-3962","authenticated-orcid":false,"given":"Wei Dong","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Waseem","family":"Shahzad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leo. P.","family":"Ligthart","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hamid","family":"Raza","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2021,8,3]]},"reference":[{"key":"e_1_2_8_1_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.84.4184"},{"key":"e_1_2_8_2_2","doi-asserted-by":"publisher","DOI":"10.1070\/PU1968v010n04ABEH003699"},{"key":"e_1_2_8_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/22.798002"},{"key":"e_1_2_8_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2004.828029"},{"key":"e_1_2_8_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2013.2240813"},{"key":"e_1_2_8_6_2","doi-asserted-by":"crossref","unstructured":"AbdolrazzaghiM.andDaneshmandM. A 4 Ghz near-field monitoring planar oscillator sensor 2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) July 2018 Ann Arbor MI USA https:\/\/doi.org\/10.1109\/IMWS-AMP.2018.8457169 2-s2.0-85057590366.","DOI":"10.1109\/IMWS-AMP.2018.8457169"},{"key":"e_1_2_8_7_2","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2016.2629967"},{"key":"e_1_2_8_8_2","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-019-2923-z"},{"key":"e_1_2_8_9_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2295312"},{"key":"e_1_2_8_10_2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2693981"},{"key":"e_1_2_8_11_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2313625"},{"key":"e_1_2_8_12_2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2018.2791942"},{"key":"e_1_2_8_13_2","doi-asserted-by":"publisher","DOI":"10.21917\/ijct.2016.0211"},{"key":"e_1_2_8_14_2","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.017099"},{"key":"e_1_2_8_15_2","doi-asserted-by":"publisher","DOI":"10.1007\/s11082-016-0449-6"},{"key":"e_1_2_8_16_2","doi-asserted-by":"publisher","DOI":"10.1002\/mop.29979"},{"key":"e_1_2_8_17_2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2005.845211"},{"key":"e_1_2_8_18_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2682266"},{"key":"e_1_2_8_19_2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2588487"},{"key":"e_1_2_8_20_2","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2017.2701338"},{"key":"e_1_2_8_21_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2840691"},{"key":"e_1_2_8_22_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2469683"},{"key":"e_1_2_8_23_2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2503764"},{"key":"e_1_2_8_24_2","doi-asserted-by":"crossref","unstructured":"AlbishiA. M.andRamahiO. M. Surface crack detection in metallic materials using sensitive microwave-based sensors 2016 IEEE 17th Annual Wireless and Microwave Technology Conference (WAMICON) April 2016 Clearwater FL USA https:\/\/doi.org\/10.1109\/WAMICON.2016.7483842 2-s2.0-84978518567.","DOI":"10.1109\/WAMICON.2016.7483842"},{"key":"e_1_2_8_25_2","doi-asserted-by":"publisher","DOI":"10.3390\/s18040984"},{"key":"e_1_2_8_26_2","article-title":"High-sensitivity microwave sensor for liquid characterization using a complementary circular spiral resonator","volume":"19","author":"Zhang X.","year":"2019","journal-title":"Sensors"},{"key":"e_1_2_8_27_2","doi-asserted-by":"crossref","unstructured":"Saadat-SafaM. NayyeriV. KhanjarianM. SoleimaniM. andRamahiO. M. Full characterization of magneto-dielectric materials using a novel Csrr based sensor 2018 9th International Symposium on Telecommunications (IST) December 2018 Tehran Iran https:\/\/doi.org\/10.1109\/ISTEL.2018.8660979 2-s2.0-85063893270.","DOI":"10.1109\/ISTEL.2018.8660979"},{"key":"e_1_2_8_28_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2013.2285918"},{"key":"e_1_2_8_29_2","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2014.2318900"},{"key":"e_1_2_8_30_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2822306"},{"key":"e_1_2_8_31_2","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2016.7384959"},{"key":"e_1_2_8_32_2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2189241"},{"key":"e_1_2_8_33_2","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2018.2860596"},{"key":"e_1_2_8_34_2","volume-title":"Basics of Measuring the Dielectric Properties of Materials","author":"Technologies K.","year":"2018"},{"key":"e_1_2_8_35_2","doi-asserted-by":"publisher","DOI":"10.1108\/SR-06-2018-0152"},{"key":"e_1_2_8_36_2","doi-asserted-by":"crossref","unstructured":"AnsariM. A. H. JhaA. K. andAkhtarM. J. Dual band microwave sensor for dielectric characterization of dispersive materials 2015 Asia-Pacific Microwave Conference (APMC) Decemeber 2015 Nanjing China https:\/\/doi.org\/10.1109\/APMC.2015.7411595 2-s2.0-84978150632.","DOI":"10.1109\/APMC.2015.7411595"},{"key":"e_1_2_8_37_2","doi-asserted-by":"crossref","unstructured":"HaqT. U. RuanC. WangR. andWuT. High Q dual band super high frequency notch Filter based on complementary metamaterial 2018 Progress in Electromagnetics Research Symposium (PIERS-Toyama) August 2018 Toyama Japan https:\/\/doi.org\/10.23919\/PIERS.2018.8597696 2-s2.0-85060905279.","DOI":"10.23919\/PIERS.2018.8597696"},{"key":"e_1_2_8_38_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2822877"},{"key":"e_1_2_8_39_2","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2015.2435656"},{"key":"e_1_2_8_40_2","doi-asserted-by":"publisher","DOI":"10.1002\/9780470937297"},{"key":"e_1_2_8_41_2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2203450"},{"key":"e_1_2_8_42_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.70.016608"},{"key":"e_1_2_8_43_2","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2018.2833202"},{"key":"e_1_2_8_44_2","doi-asserted-by":"publisher","DOI":"10.1109\/lmwc.2017.2690873"},{"key":"e_1_2_8_45_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2724942"}],"container-title":["Journal of Sensors"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2021\/8888187.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/journals\/js\/2021\/8888187.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/2021\/8888187","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T00:35:12Z","timestamp":1722904512000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/2021\/8888187"}},"subtitle":[],"editor":[{"given":"Francesco","family":"Dell\u2032Olio","sequence":"additional","affiliation":[],"role":[{"role":"editor","vocabulary":"crossref"}]}],"short-title":[],"issued":{"date-parts":[[2021,1]]},"references-count":45,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2021,1]]}},"alternative-id":["10.1155\/2021\/8888187"],"URL":"https:\/\/doi.org\/10.1155\/2021\/8888187","archive":["Portico"],"relation":{},"ISSN":["1687-725X","1687-7268"],"issn-type":[{"value":"1687-725X","type":"print"},{"value":"1687-7268","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,1]]},"assertion":[{"value":"2020-03-03","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2021-07-02","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2021-08-03","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"8888187"}}