{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T14:50:20Z","timestamp":1773067820293,"version":"3.50.1"},"reference-count":67,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2025,8,14]],"date-time":"2025-08-14T00:00:00Z","timestamp":1755129600000},"content-version":"vor","delay-in-days":225,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/501100004242","name":"Princess Nourah Bint Abdulrahman University","doi-asserted-by":"publisher","award":["PNURSP2025R54"],"award-info":[{"award-number":["PNURSP2025R54"]}],"id":[{"id":"10.13039\/501100004242","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Applied Computational Intelligence and Soft Computing"],"published-print":{"date-parts":[[2025,1]]},"abstract":"<jats:p>This paper analyses existing research about machine learning approaches in software defect prediction as a key element for improving software reliability and quality. The paper reviews the use of machine learning algorithms in software defect prediction framework\u2019s bug prediction while assessing their performance across multiple environments. A comprehensive review of scholarly literature enables researchers to specify both advantages and drawbacks that emerge when using machine learning for automated defect detection in software defect prediction applications. The review conducts assessments of typical metrics like accuracy and precision and recall and runtime performance yet extends its evaluation to analyze new trends combining deep learning with ensemble approaches to enhance software defect prediction functionality. The examined findings provide crucial guidelines which help developers select and improve machine learning models in software defect prediction processes that result in better software reliability and robustness.<\/jats:p>","DOI":"10.1155\/acis\/7933078","type":"journal-article","created":{"date-parts":[[2025,8,14]],"date-time":"2025-08-14T07:20:17Z","timestamp":1755156017000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["Machine Learning Approaches for Software Defect Prediction"],"prefix":"10.1155","volume":"2025","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-6273-3840","authenticated-orcid":false,"given":"Hijab Zehra","family":"Zaidi","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0009-0006-7037-689X","authenticated-orcid":false,"given":"Ubaid","family":"Ullah","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9337-6602","authenticated-orcid":false,"given":"Muddassira","family":"Arshad","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6042-0283","authenticated-orcid":false,"given":"Hanan","family":"Aljuaid","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2644-7105","authenticated-orcid":false,"given":"Muhammad Arslan","family":"Rauf","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8681-6382","authenticated-orcid":false,"given":"Nadeem","family":"Sarwar","sequence":"additional","affiliation":[]},{"given":"Rimsha","family":"Sajid","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2025,8,14]]},"reference":[{"key":"e_1_2_10_1_2","doi-asserted-by":"publisher","DOI":"10.1007\/s41870-023-01528-9"},{"key":"e_1_2_10_2_2","doi-asserted-by":"publisher","DOI":"10.3390\/su15065517"},{"key":"e_1_2_10_3_2","volume-title":"The Promise Repository of Empirical Software Engineering Data","author":"Menzies T.","year":"2016"},{"key":"e_1_2_10_4_2","doi-asserted-by":"crossref","unstructured":"D\u2019AmbrosM. LanzaM. andRobbesR. An Extensive Comparison of Bug Prediction Approaches 2010 7th IEEE Working Conference on Mining Software Repositories (MSR 2010) May 2010 IEEE 31\u201341.","DOI":"10.1109\/MSR.2010.5463279"},{"key":"e_1_2_10_5_2","volume-title":"Software Defect Prediction Using Machine Learning Approach: A Contemporary Review","author":"Shittu A. S.","year":"2023"},{"key":"e_1_2_10_6_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2023.107192"},{"key":"e_1_2_10_7_2","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-023-09653-1"},{"key":"e_1_2_10_8_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2010.03.006"},{"key":"e_1_2_10_9_2","first-page":"331","article-title":"Survey on Software Defect Prediction Techniques","volume":"17","author":"Thota M. K.","year":"2020","journal-title":"International Journal of Applied Science & Engineering"},{"key":"e_1_2_10_10_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.107622"},{"key":"e_1_2_10_11_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.123041"},{"key":"e_1_2_10_12_2","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0211359"},{"key":"e_1_2_10_13_2","doi-asserted-by":"crossref","unstructured":"PrabhaC. L.andShivakumarN. Software Defect Prediction Using Machine Learning Techniques 2020 4th International Conference on Trends in Electronics and Informatics (ICOEI) June 2020 IEEE 728\u2013733.","DOI":"10.1109\/ICOEI48184.2020.9142909"},{"key":"e_1_2_10_14_2","doi-asserted-by":"crossref","unstructured":"Yal\u00e7\u0131nerB.and\u00d6zde\u015fM. Software Defect Estimation Using Machine Learning Algorithms 2019 4th International Conference on Computer Science and Engineering (UBMK) September 2019 IEEE 487\u2013491.","DOI":"10.1109\/UBMK.2019.8907149"},{"key":"e_1_2_10_15_2","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/8858010"},{"key":"e_1_2_10_16_2","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-024-18456-w"},{"key":"e_1_2_10_17_2","first-page":"21","article-title":"Software Defect Prediction: A Study on Software Metrics Using Statistical and Machine Learning Methods","volume":"415","author":"Canaparo M.","year":"2022","journal-title":"Proceedings of Science"},{"key":"e_1_2_10_18_2","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-022-00340-2"},{"key":"e_1_2_10_19_2","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-023-05836-6"},{"key":"e_1_2_10_20_2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2785445"},{"key":"e_1_2_10_21_2","doi-asserted-by":"publisher","DOI":"10.3390\/s22072551"},{"key":"e_1_2_10_22_2","doi-asserted-by":"crossref","unstructured":"TanakaK. MondenA. andY\u00fccelZ. Prediction of Software Defects Using Automated Machine Learning 2019 20th IEEE\/ACIS International Conference on Software Engineering Artificial Intelligence Networking and Parallel\/Distributed Computing (SNPD) July 2019 IEEE 490\u2013494.","DOI":"10.1109\/SNPD.2019.8935839"},{"key":"e_1_2_10_23_2","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-021-05811-3"},{"key":"e_1_2_10_24_2","doi-asserted-by":"publisher","DOI":"10.1007\/s11334-023-00542-1"},{"key":"e_1_2_10_25_2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3287326"},{"key":"e_1_2_10_26_2","doi-asserted-by":"publisher","DOI":"10.1109\/tse.2020.2982385"},{"key":"e_1_2_10_27_2","doi-asserted-by":"publisher","DOI":"10.1109\/tr.2013.2259203"},{"key":"e_1_2_10_28_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.11.067"},{"key":"e_1_2_10_29_2","doi-asserted-by":"publisher","DOI":"10.1145\/3503509"},{"key":"e_1_2_10_30_2","doi-asserted-by":"crossref","unstructured":"WangS. LiuT. andTanL. Automatically Learning Semantic Features for Defect Prediction Proceedings of the 38th International Conference on Software Engineering May 2016 297\u2013308 https:\/\/doi.org\/10.1145\/2884781.2884804 2-s2.0-84971385322.","DOI":"10.1145\/2884781.2884804"},{"key":"e_1_2_10_31_2","doi-asserted-by":"publisher","DOI":"10.11591\/ijaas.v11.i4.pp287-295"},{"key":"e_1_2_10_32_2","doi-asserted-by":"publisher","DOI":"10.51153\/kjcis.v5i2.96"},{"key":"e_1_2_10_33_2","doi-asserted-by":"crossref","unstructured":"Mau\u0161aG. GrbacT. G. andBa\u0161i\u0107B. D. Data Collection for Software Defect prediction-An Exploratory Case Study of Open Source Software Projects 2015 38th International Convention on Information and Communication Technology Electronics and Microelectronics (MIPRO) May 2015 IEEE 463\u2013469.","DOI":"10.1109\/MIPRO.2015.7160316"},{"key":"e_1_2_10_34_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.04.090"},{"key":"e_1_2_10_35_2","doi-asserted-by":"crossref","unstructured":"KakkarM.andJainS. Feature Selection in Software Defect Prediction: A Comparative Study 2016 6th International Conference-Cloud System and Big Data Engineering (Confluence) January 2016 IEEE 658\u2013663.","DOI":"10.1109\/CONFLUENCE.2016.7508200"},{"key":"e_1_2_10_36_2","doi-asserted-by":"crossref","unstructured":"YangX. LoD. XiaX. ZhangY. andSunJ. Deep Learning for Just-In-Time Defect Prediction 2015 IEEE International Conference on Software Quality Reliability and Security August 2015 IEEE 17\u201326 https:\/\/doi.org\/10.1109\/qrs.2015.14 2-s2.0-84962124148.","DOI":"10.1109\/QRS.2015.14"},{"key":"e_1_2_10_37_2","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-024-05459-1"},{"key":"e_1_2_10_38_2","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-024-00424-1"},{"key":"e_1_2_10_39_2","doi-asserted-by":"publisher","DOI":"10.1007\/s10586-024-04446-y"},{"key":"e_1_2_10_40_2","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-023-09642-4"},{"key":"e_1_2_10_41_2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2017.2759180"},{"key":"e_1_2_10_42_2","doi-asserted-by":"publisher","DOI":"10.1109\/tse.2014.2322358"},{"key":"e_1_2_10_43_2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3095559"},{"key":"e_1_2_10_44_2","doi-asserted-by":"publisher","DOI":"10.1109\/tse.2012.20"},{"key":"e_1_2_10_45_2","doi-asserted-by":"publisher","DOI":"10.1109\/tr.2020.2996261"},{"key":"e_1_2_10_46_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2024.111805"},{"key":"e_1_2_10_47_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2024.120786"},{"key":"e_1_2_10_48_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2024.111835"},{"key":"e_1_2_10_49_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2023.111753"},{"key":"e_1_2_10_50_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2022.107886"},{"key":"e_1_2_10_51_2","doi-asserted-by":"crossref","unstructured":"JingX. Y. YingS. ZhangZ. W. WuS. S. andLiuJ. Dictionary Learning Based Software Defect Prediction Proceedings of the 36th International Conference on Software Engineering May 2014 414\u2013423 https:\/\/doi.org\/10.1145\/2568225.2568320 2-s2.0-84994121213.","DOI":"10.1145\/2568225.2568320"},{"key":"e_1_2_10_52_2","doi-asserted-by":"crossref","unstructured":"RizwanS. TiantianW. andXiaohongS. Empirical Study on Software Bug Prediction Proceedings of the 2017 International Conference on Software and e-Business December 2017 55\u201359 https:\/\/doi.org\/10.1145\/3178212.3178221 2-s2.0-85045942717.","DOI":"10.1145\/3178212.3178221"},{"key":"e_1_2_10_53_2","doi-asserted-by":"crossref","unstructured":"HaD. A. ChenT. H. andYuanS. M. Unsupervised Methods for Software Defect Prediction Proceedings of the Tenth International Symposium on Information and Communication Technology-SoICT 2019 December 2019 49\u201355 https:\/\/doi.org\/10.1145\/3368926.3369711.","DOI":"10.1145\/3368926.3369711"},{"key":"e_1_2_10_54_2","doi-asserted-by":"publisher","DOI":"10.1145\/3105906"},{"key":"e_1_2_10_55_2","doi-asserted-by":"crossref","unstructured":"SoltanifarB. AkbarinasajiS. CaglayanB. BenerA. B. FilizA. andKramerB. M. Software Analytics in Practice: A Defect Prediction Model Using Code Smells Proceedings of the 20th International Database Engineering & Applications Symposium July 2016 148\u2013155.","DOI":"10.1145\/2938503.2938553"},{"key":"e_1_2_10_56_2","doi-asserted-by":"crossref","unstructured":"ChenJ. HuK. YuY.et al. Software Visualization and Deep Transfer Learning for Effective Software Defect Prediction Proceedings of the ACM\/IEEE 42nd International Conference on Software Engineering June 2020 578\u2013589 https:\/\/doi.org\/10.1145\/3377811.3380389.","DOI":"10.1145\/3377811.3380389"},{"key":"e_1_2_10_57_2","doi-asserted-by":"crossref","unstructured":"SantosG. VelosoA. andFigueiredoE. Understanding Thresholds of Software Features for Defect Prediction Proceedings of the XXXVI Brazilian Symposium on Software Engineering October 2022 305\u2013310 https:\/\/doi.org\/10.1145\/3555228.3555269.","DOI":"10.1145\/3555228.3555269"},{"key":"e_1_2_10_58_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.104773"},{"key":"e_1_2_10_59_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2022.111245"},{"key":"e_1_2_10_60_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.03.001"},{"key":"e_1_2_10_61_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2024.107510"},{"key":"e_1_2_10_62_2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3135973"},{"key":"e_1_2_10_63_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2022.109737"},{"key":"e_1_2_10_64_2","doi-asserted-by":"crossref","unstructured":"QingH. BiwenL. BeijunS. andXiaY. Cross-Project Software Defect Prediction Using Feature-Based Transfer Learning Proceedings of the 7th Asia-Pacific Symposium on Internetware November 2015 74\u201382 https:\/\/doi.org\/10.1145\/2875913.2875944 2-s2.0-84994381838.","DOI":"10.1145\/2875913.2875944"},{"key":"e_1_2_10_65_2","doi-asserted-by":"crossref","unstructured":"Str\u00fcderS. MukelabaiM. Str\u00fcberD. andBergerT. Feature-Oriented Defect Prediction Proceedings of the 24th ACM Conference on Systems and Software Product Line: Volume A-Volume A October 2020 1\u201312.","DOI":"10.1145\/3382025.3414960"},{"key":"e_1_2_10_66_2","doi-asserted-by":"crossref","unstructured":"WangJ. WangS. CuiQ. andWangQ. Local-Based Active Classification of Test Report to Assist Crowdsourced Testing Proceedings of the 31st IEEE\/ACM International Conference on Automated Software Engineering August 2016 190\u2013201 https:\/\/doi.org\/10.1145\/2970276.2970300 2-s2.0-84989154013.","DOI":"10.1145\/2970276.2970300"},{"key":"e_1_2_10_67_2","doi-asserted-by":"crossref","unstructured":"XuB. ShiraniA. LoD. andAlipourM. A. Prediction of Relatedness in Stack Overflow: Deep Learning vs. SVM: A Reproducibility Study Proceedings of the 12th ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement October 2018 1\u201310 https:\/\/doi.org\/10.1145\/3239235.3240503 2-s2.0-85061492521.","DOI":"10.1145\/3239235.3240503"}],"container-title":["Applied Computational Intelligence and Soft Computing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/acis\/7933078","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1155\/acis\/7933078","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/acis\/7933078","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,8]],"date-time":"2026-03-08T11:45:24Z","timestamp":1772970324000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/acis\/7933078"}},"subtitle":[],"editor":[{"given":"Najlae","family":"Idrissi","sequence":"additional","affiliation":[]}],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":67,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2025,1]]}},"alternative-id":["10.1155\/acis\/7933078"],"URL":"https:\/\/doi.org\/10.1155\/acis\/7933078","archive":["Portico"],"relation":{},"ISSN":["1687-9724","1687-9732"],"issn-type":[{"value":"1687-9724","type":"print"},{"value":"1687-9732","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1]]},"assertion":[{"value":"2024-08-18","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-06-23","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-08-14","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"7933078"}}