{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T00:31:49Z","timestamp":1773793909234,"version":"3.50.1"},"reference-count":25,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T00:00:00Z","timestamp":1761091200000},"content-version":"vor","delay-in-days":294,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Journal of Electrical and Computer Engineering"],"published-print":{"date-parts":[[2025,1]]},"abstract":"<jats:p>\n                    Gas\u2010insulated switchgear (GIS) is pivotal in high\u2010voltage transmission systems owing to its compact design, high reliability, and superior dielectric strength, facilitated by sulphur hexafluoride (SF\n                    <jats:sub>6<\/jats:sub>\n                    ). However, metallic contaminants, introduced during manufacturing or operation, pose a substantial threat to the insulation integrity. This study investigates the fault mechanisms of 750\u2009kV GIS equipment, focusing on aluminium\u2010based foreign particles. By combining onsite diagnostics, energy\u2010dispersive spectroscopy, and finite element simulations using COMSOL Multiphysics, a detailed 3D electrostatic model is developed to assess the impact of particle size, shape, and position on electric field distortion. Parametric analysis identifies the critical flashover conditions and demonstrates how certain particle configurations enhance the electric field beyond the design limits, leading to partial discharge and internal flashover. The findings correlate the simulation data with the field inspection results, providing a quantitative approach to link manufacturing residues with insulation degradation in GIS systems. This study contributes to the advancement of fault prevention strategies in ultra\u2010high\u2010voltage GIS applications.\n                  <\/jats:p>","DOI":"10.1155\/jece\/5568073","type":"journal-article","created":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T17:30:59Z","timestamp":1761154259000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Insulation Fault Mechanism of 750\u2009kV GIS Equipment Based on COMSOL Multiphysics Simulation Analysis"],"prefix":"10.1155","volume":"2025","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-2118-1517","authenticated-orcid":false,"given":"Liqing","family":"Dai","sequence":"first","affiliation":[]},{"given":"Tiesheng","family":"Xu","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2025,10,22]]},"reference":[{"key":"e_1_2_11_1_2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2022.3165476"},{"key":"e_1_2_11_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2024.3360084"},{"key":"e_1_2_11_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2019.2930349"},{"key":"e_1_2_11_4_2","doi-asserted-by":"publisher","DOI":"10.3390\/en16010413"},{"key":"e_1_2_11_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3150482"},{"key":"e_1_2_11_6_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3300835"},{"key":"e_1_2_11_7_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3197221"},{"key":"e_1_2_11_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2024.3349536"},{"key":"e_1_2_11_9_2","doi-asserted-by":"publisher","DOI":"10.3390\/en12061173"},{"key":"e_1_2_11_10_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2023.3322702"},{"key":"e_1_2_11_11_2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3156926"},{"key":"e_1_2_11_12_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2022.108162"},{"key":"e_1_2_11_13_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3087749"},{"key":"e_1_2_11_14_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.105559"},{"key":"e_1_2_11_15_2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3349410"},{"key":"e_1_2_11_16_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3128036"},{"key":"e_1_2_11_17_2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2022.3206726"},{"key":"e_1_2_11_18_2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.008235"},{"key":"e_1_2_11_19_2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.008361"},{"key":"e_1_2_11_20_2","doi-asserted-by":"publisher","DOI":"10.3934\/ENERGY.2024052"},{"key":"e_1_2_11_21_2","doi-asserted-by":"publisher","DOI":"10.3390\/en11040971"},{"key":"e_1_2_11_22_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2024.3391916"},{"key":"e_1_2_11_23_2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2020.008919"},{"key":"e_1_2_11_24_2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3106117"},{"key":"e_1_2_11_25_2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196955"}],"container-title":["Journal of Electrical and Computer Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/jece\/5568073","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/full-xml\/10.1155\/jece\/5568073","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/jece\/5568073","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:38:17Z","timestamp":1773779897000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/jece\/5568073"}},"subtitle":[],"editor":[{"given":"Manuela","family":"Minetti","sequence":"additional","affiliation":[]}],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":25,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2025,1]]}},"alternative-id":["10.1155\/jece\/5568073"],"URL":"https:\/\/doi.org\/10.1155\/jece\/5568073","archive":["Portico"],"relation":{},"ISSN":["2090-0147","2090-0155"],"issn-type":[{"value":"2090-0147","type":"print"},{"value":"2090-0155","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1]]},"assertion":[{"value":"2025-04-03","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-09-25","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-10-22","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"5568073"}}