{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T06:05:50Z","timestamp":1777442750121,"version":"3.51.4"},"reference-count":18,"publisher":"SAGE Publications","issue":"3","license":[{"start":{"date-parts":[[2020,11,30]],"date-time":"2020-11-30T00:00:00Z","timestamp":1606694400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51777144"],"award-info":[{"award-number":["51777144"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"China State Grid Corporation Science and Technology Project","award":["SGHB0000KXJS 1800554"],"award-info":[{"award-number":["SGHB0000KXJS 1800554"]}]}],"content-domain":{"domain":["journals.sagepub.com"],"crossmark-restriction":true},"short-container-title":["Appl Spectrosc"],"published-print":{"date-parts":[[2021,3]]},"abstract":"<jats:p>\n                    Sulfur dioxide, carbon disulfide, and hydrogen sulfide are important decomposition products of insulating gas sulfur hexafluoride, and their types and contents are of great significance for the fault diagnosis of SF\n                    <jats:sub>6<\/jats:sub>\n                    insulated equipment. In this paper, a method of combining ultraviolet absorption spectroscopy and least squares fitting is proposed for the quantitative calculation of sulfur dioxide, carbon disulfide, and hydrogen sulfide mixed gases. All three gases have absorption peaks in the ultraviolet band and they overlap with each other which makes it hard to determinate the concentrations of the three gases directly. During the experiment, we found that high concentrations of sulfur dioxide and carbon disulfide interfered with the hydrogen sulfide calculation and the magnitude of this interference was positively correlated with these two gas concentrations. Therefore, we found a modified equation for the correction of hydrogen sulfide. Combined with this equation, accurate quantitative detection of three gases can be achieved. The detection ranges are 0.5\u201310 parts per million for sulfur dioxide and hydrogen sulfide, and 10\u2013300 parts per billion for carbon disulfide. This paper provides a simple and efficient detection method, which is convenient for integration into detection equipment and it provides a support method for the diagnosis of sulfur hexafluoride decomposition gases.\n                  <\/jats:p>","DOI":"10.1177\/0003702820973227","type":"journal-article","created":{"date-parts":[[2020,10,28]],"date-time":"2020-10-28T00:04:06Z","timestamp":1603843446000},"page":"265-273","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":15,"title":["Real-Time Measurement of SO\n                    <sub>2<\/sub>\n                    , H\n                    <sub>2<\/sub>\n                    S, and CS\n                    <sub>2<\/sub>\n                    Mixed Gases Using Ultraviolet Spectroscopy and a Least Squares Algorithm"],"prefix":"10.1177","volume":"75","author":[{"given":"Zhaolun","family":"Cui","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5872-2039","authenticated-orcid":false,"given":"Xiaoxing","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"},{"name":"School of Electrical and Electronic Engineering, Hubei University of Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dachang","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yi","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yufei","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Hubei University of Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yin","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Wang","sequence":"additional","affiliation":[{"name":"State Grid Hubei Electric Power Company, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"179","published-online":{"date-parts":[[2020,11,30]]},"reference":[{"key":"bibr1-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.8b00010"},{"key":"bibr2-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1049\/hve.2017.0047"},{"key":"bibr3-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2018.10.167"},{"key":"bibr4-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1109\/TEI.1986.348921"},{"key":"bibr5-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2012.6148499"},{"issue":"12","key":"bibr6-0003702820973227","first-page":"118","volume":"35","author":"Yan X.","year":"2011","journal-title":"Power System Technology"},{"key":"bibr7-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.6633703"},{"key":"bibr8-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.6678864"},{"key":"bibr9-0003702820973227","unstructured":"International Electrotechnical Commission (IEC). IEC 60480:2004. Guidelines for the Checking and Treatment of Sulfur Hexafluoride (SF\n                      6\n                      ) Taken from Electrical Equipment and Specification for its Reuse. London: International Electrotechnical Commission, 2004."},{"key":"bibr10-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1016\/j.jhazmat.2018.10.006"},{"key":"bibr11-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2018.11.230"},{"key":"bibr12-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2016.07.004"},{"key":"bibr13-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1007\/s00216-002-1280-4"},{"key":"bibr14-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-010-4151-2"},{"key":"bibr15-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2016.10.055"},{"key":"bibr16-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1039\/C7RA09983E"},{"key":"bibr17-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1016\/j.saa.2019.01.075"},{"key":"bibr18-0003702820973227","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsb.2015.10.004"}],"container-title":["Applied Spectroscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/0003702820973227","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/full-xml\/10.1177\/0003702820973227","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/0003702820973227","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,28]],"date-time":"2026-04-28T12:18:22Z","timestamp":1777378702000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/0003702820973227"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,30]]},"references-count":18,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2021,3]]}},"alternative-id":["10.1177\/0003702820973227"],"URL":"https:\/\/doi.org\/10.1177\/0003702820973227","relation":{},"ISSN":["0003-7028","1943-3530"],"issn-type":[{"value":"0003-7028","type":"print"},{"value":"1943-3530","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,11,30]]}}}