{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T14:29:41Z","timestamp":1778596181088,"version":"3.51.4"},"reference-count":24,"publisher":"SAGE Publications","issue":"1","license":[{"start":{"date-parts":[[1997,1,1]],"date-time":"1997-01-01T00:00:00Z","timestamp":852076800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Dent Res"],"published-print":{"date-parts":[[1997,1]]},"abstract":"<jats:p>\n                    When amalgam was triturated with Hg-In liquid alloys instead of pure mercury, the resultant amalgams released a significantly smaller amount of mercury vapor during setting. To understand the mechanisms responsible for the drastic decrease in mercury evaporation from the In-containing amalgam, we used Auger Electron Spectroscopy to examine surface oxide films on amalgams made with Hg-10 wt% In or pure mercury. The surface of the In-containing amalgam was rapidly covered with both indium and tin oxide films. Greater amounts of oxygen were found on the \u03b3\n                    <jats:sub>1<\/jats:sub>\n                    Ag-Hg matrix in the In-containing amalgam than in the amalgam without indium. The rapid formation of the oxide film contributes to a reduction in the mercury release from the In-containing amalgam by forming an effective barrier to evaporation.\n                  <\/jats:p>","DOI":"10.1177\/00220345970760011301","type":"journal-article","created":{"date-parts":[[2009,1,8]],"date-time":"2009-01-08T19:39:42Z","timestamp":1231443582000},"page":"610-616","source":"Crossref","is-referenced-by-count":9,"title":["Surface Characterization of Amalgam Made with Hg-In Liquid Alloy"],"prefix":"10.1177","volume":"76","author":[{"given":"H.","family":"Nakajima","sequence":"first","affiliation":[{"name":"Department of Biomaterials Science, Baylor College of Dentistry-Texas A&M University System, P.O. Box 660677, Dallas, Texas 75266-0677"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Akaiwa","sequence":"additional","affiliation":[{"name":"Laboratory of X-ray Analysis, Meikai University School of Dentistry, Saitama, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Hashimoto","sequence":"additional","affiliation":[{"name":"Department of Dental Materials Science, Meikai University School of Dentistry, Saitama, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.L.","family":"Ferracane","sequence":"additional","affiliation":[{"name":"Department of Biomaterials and Biomechanics, Oregon Health Sciences University School of Dentistry, Portland, Oregon"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Okabe","sequence":"additional","affiliation":[{"name":"Department of Biomaterials Science, Baylor College of Dentistry-Texas A&M University System, P.O. Box 660677, Dallas, Texas 75266-0677"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"179","published-online":{"date-parts":[[1997,1,1]]},"reference":[{"key":"atypb1","doi-asserted-by":"publisher","DOI":"10.1116\/1.571474"},{"key":"atypb2","unstructured":"Feldman LC, Mayer JW (1986). Nonradiative transitions and Auger electron spectroscopy . In: Fundamentals of surface and thin film analysis. Feldman LC, Mayer JW , editors. 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Application of AES in microelectronics. In: Practical surface analysis by Auger and X-ray electron spectroscopy . Briggs D, Seah MP, editors. Chichester: John Wiley & Sons, Ltd., pp. 217-246."},{"key":"atypb15","doi-asserted-by":"publisher","DOI":"10.1177\/08959374920060010701"},{"key":"atypb16","doi-asserted-by":"publisher","DOI":"10.1520\/STP25597S"},{"key":"atypb17","doi-asserted-by":"publisher","DOI":"10.1177\/00220345890680080301"},{"key":"atypb18","unstructured":"Seah MP ( 1983). Quantification of AES and XPS. In: Practical surface analysis by Auger and x-ray electron spectroscopy. Briggs D, Seah MP, editors. Chichester: John Wiley and Sons, Ltd., pp. 181-216."},{"key":"atypb19","unstructured":"Seah MP, Briggs D. (1983). A perspective on the analysis of surfaces and interfaces. In: Practical surface analysis by Auger and x-ray electron spectroscopy. Briggs D, Seah MP, editors. 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Chichester: John Wiley and Sons , pp. 575-590."},{"key":"atypb24","first-page":"149","volume":"74","author":"Watkins JH","year":"1995","journal-title":"J Dent Res"}],"container-title":["Journal of Dental Research"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/00220345970760011301","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/00220345970760011301","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T21:05:31Z","timestamp":1777496731000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/00220345970760011301"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997,1]]},"references-count":24,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1997,1]]}},"alternative-id":["10.1177\/00220345970760011301"],"URL":"https:\/\/doi.org\/10.1177\/00220345970760011301","relation":{},"ISSN":["0022-0345","1544-0591"],"issn-type":[{"value":"0022-0345","type":"print"},{"value":"1544-0591","type":"electronic"}],"subject":[],"published":{"date-parts":[[1997,1]]}}}