{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,30]],"date-time":"2026-01-30T22:08:20Z","timestamp":1769810900581,"version":"3.49.0"},"reference-count":12,"publisher":"SAGE Publications","issue":"3","license":[{"start":{"date-parts":[[2003,3,1]],"date-time":"2003-03-01T00:00:00Z","timestamp":1046476800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["SIMULATION"],"published-print":{"date-parts":[[2003,3]]},"abstract":"<jats:p> The authors discuss the concept and design criteria for a framework that facilitates the performance assessment of shop-floor control systems. Their basic concept includes a simulation model that emulates the shop floor of a wafer fab, sends information to the control system, and receives information back from the control system. The shop-floor control system is realized as a separate module that interfaces to the simulator via a data layer that contains the current shop-floor status and the control information generated by the controller. The authors provide detailed information on how the simulation model and shop-floor control system communicate and how each system triggers events in the other system. They show how this framework supports the performance assessment of the shop-floor control system under consideration. They also present a prototype of the framework currently implemented in the course of the SRC\/International Sematech FORCe project \u201cScheduling of Semiconductor Wafer Fabrication Facilities.\u201d <\/jats:p>","DOI":"10.1177\/0037549703256039","type":"journal-article","created":{"date-parts":[[2003,11,12]],"date-time":"2003-11-12T21:35:11Z","timestamp":1068672911000},"page":"163-170","source":"Crossref","is-referenced-by-count":40,"title":["A Simulation Framework for the Performance Assessment of Shop-Floor Control Systems"],"prefix":"10.1177","volume":"79","author":[{"given":"Lars","family":"M\u00f6nch","sequence":"first","affiliation":[{"name":"Institut f\u00fcr Wirtschaftsinformatik Technische                        Universit\u00e4t Ilmenau D-98684 Ilmenau, Germany,"}]},{"given":"Oliver","family":"Rose","sequence":"additional","affiliation":[{"name":"Lehrstuhl f\u00fcr Informatik III Universit\u00e4t                        W\u00fcrzburg D-97074 W\u00fcrzburg, Germany,"}]},{"given":"Roland","family":"Sturm","sequence":"additional","affiliation":[{"name":"Department Cleanroom Manufacturing Fraunhofer Institut Produktionstechnik                        und Automatisierung (Fraunhofer IPA) D-70569 Stuttgart, Germany,"}]}],"member":"179","published-online":{"date-parts":[[2003,3,1]]},"reference":[{"key":"atypb1","unstructured":"1 Sch\u00f6mig, A., and J. W. Fowler. 2000. Modeling semiconductor manufacturing operations . In Proceedings of the 9th ASIM Dedicated Conference Simulation in Production and Logistics, pp. 55-64 ."},{"key":"atypb2","doi-asserted-by":"publisher","DOI":"10.1080\/00207540010010253"},{"key":"atypb3","doi-asserted-by":"publisher","DOI":"10.1109\/66.857934"},{"key":"atypb4","doi-asserted-by":"crossref","unstructured":"4 Mason, S., J. W. Fowler, and M. W. Carlyle. 2001. A modified shifting bottleneck heuristic for minimizing the total weighted tardiness in a semiconductor wafer fab . Journal of Scheduling 5: 247-262 .","DOI":"10.1002\/jos.102"},{"key":"atypb5","unstructured":"5 Fordyce, K., and G. Sullivan. 1994. Logistics management system (LMS): Integrating decision technology for dispatch scheduling in semiconductor manufacturing. In Intelligent scheduling, edited by M. Zweben and M. S. Fox, 473-516. San Francisco, CA: Morgan Kaufmann ."},{"key":"atypb6","unstructured":"6 Henoch, J., and H. Ulrich. 2000. HIDES: Towards an agent-based simulator . In Proceedings of Agent Based Simulation: International Workshop 2000, Passau, Germany, pp. 259-263 ."},{"key":"atypb7","doi-asserted-by":"crossref","unstructured":"7 McLean, C., and F. Riddick. 2000. The IMS mission architecture for distributed manufacturing simulation . In Proceedings of the 2000 Winter Simulation Conference, pp. 1539-1548 .","DOI":"10.1109\/WSC.2000.899138"},{"key":"atypb8","unstructured":"8 Object Management Group. 2001. CORBA\/IIOP specification 2.6. Retrieved from www.omg.org"},{"key":"atypb9","unstructured":"9 Semiconductor Equipment and Materials International (SEMI). 2000. SEMI E105-1000, provisional specification for CIM framework scheduling component. Austin, TX: SEMI ."},{"key":"atypb10","unstructured":"10 Fowler, J. W., S. Brown, M. W. Carlyle, E. S. Gel, S. M. Mason, L. M\u00f6nch, O. Rose, G. C. Runger, and R. Sturm. 2002. 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