{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T13:42:22Z","timestamp":1777902142561,"version":"3.51.4"},"reference-count":19,"publisher":"SAGE Publications","issue":"12","license":[{"start":{"date-parts":[[2008,12,1]],"date-time":"2008-12-01T00:00:00Z","timestamp":1228089600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["SIMULATION"],"published-print":{"date-parts":[[2008,12]]},"abstract":"<jats:p>In modern interconnected power systems, almost 70\u201490% of faults in high voltage Power Transmission Lines (PTLs) are intrinsically transient. The necessity of rapid fault clearing results in fast developing of protection equipments. Moreover, need for reliable supplying of loads, lead to improvements in single-phase autoreclosure (SPAR) equipments. An ADAptive LInear NEuron (ADALINE) is suitable for important applications such as protection of power systems and digital relays. In this paper, a novel simple adaptive SPAR algorithm is introduced. This algorithm is based on learning error function of an ADALINE. It can be distinguished by fault type (transient fault or a permanent fault), and if the fault is permanent, autoreclosure should be blocked. This leads to improve the performance and efficiency of SPAR. Electromagnetic transients program-based simulation results show that the autoreclosure scheme based on learning error function of ADALINE on a typical 400 kV circuit for various system and fault conditions improves the reliability of fault discrimination.<\/jats:p>","DOI":"10.1177\/0037549708097293","type":"journal-article","created":{"date-parts":[[2008,11,24]],"date-time":"2008-11-24T10:33:40Z","timestamp":1227522820000},"page":"601-610","source":"Crossref","is-referenced-by-count":11,"title":["A Novel Approach to Adaptive Single Phase Autoreclosure Scheme for EHV Power Transmission Lines Based on Learning Error Function of ADALINE"],"prefix":"10.1177","volume":"84","author":[{"given":"Behrooz","family":"Vahidi","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering Amirkabir University of Technology No. 424, Hafez Avenue Tehran 158754413, Iran,"}]},{"given":"Mohsen","family":"Jannati","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering Amirkabir University of Technology No. 424, Hafez Avenue Tehran 158754413, Iran"}]},{"given":"Seyed Hossein","family":"Hosseinian","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering Amirkabir University of Technology No. 424, Hafez Avenue Tehran 158754413, Iran"}]}],"member":"179","published-online":{"date-parts":[[2008,12,1]]},"reference":[{"key":"atypb1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.824404"},{"key":"atypb2","doi-asserted-by":"publisher","DOI":"10.1109\/61.956756"},{"key":"atypb3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2002.800910"},{"key":"atypb4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.881427"},{"key":"atypb5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2002.1022790"},{"key":"atypb6","doi-asserted-by":"publisher","DOI":"10.1109\/61.847228"},{"key":"atypb7","volume-title":"In IEEE Power India Conference","author":"Sanaye-Pasand, M."},{"key":"atypb8","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2006.04.006"},{"key":"atypb9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2005.860285"},{"key":"atypb10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.886781"},{"key":"atypb11","doi-asserted-by":"publisher","DOI":"10.1109\/61.956759"},{"issue":"1","key":"atypb12","first-page":"47","volume":"11","author":"Wang, Z.Q.","year":"2000","journal-title":"IEEE Transactions on Power Delivery"},{"key":"atypb13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2005.846051"},{"key":"atypb14","volume-title":"In IEEE Athens Power Tech Conference","author":"Aggarwal, R.K."},{"key":"atypb15","doi-asserted-by":"publisher","DOI":"10.1109\/61.956756"},{"key":"atypb16","doi-asserted-by":"publisher","DOI":"10.1002\/etep.4450040302"},{"key":"atypb17","doi-asserted-by":"publisher","DOI":"10.1002\/etep.4450010111"},{"key":"atypb18","doi-asserted-by":"publisher","DOI":"10.1049\/ip-gtd:19949869"},{"key":"atypb19","first-page":"83","volume":"88","author":"Anjo, K.","year":"1968","journal-title":"Electrical Engineering in Japan"}],"container-title":["SIMULATION"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/0037549708097293","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/0037549708097293","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T11:21:07Z","timestamp":1777634467000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/0037549708097293"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,12]]},"references-count":19,"journal-issue":{"issue":"12","published-print":{"date-parts":[[2008,12]]}},"alternative-id":["10.1177\/0037549708097293"],"URL":"https:\/\/doi.org\/10.1177\/0037549708097293","relation":{},"ISSN":["0037-5497","1741-3133"],"issn-type":[{"value":"0037-5497","type":"print"},{"value":"1741-3133","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,12]]}}}