{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,5]],"date-time":"2025-03-05T05:39:24Z","timestamp":1741153164825,"version":"3.38.0"},"reference-count":20,"publisher":"SAGE Publications","issue":"2","license":[{"start":{"date-parts":[[1993,2,1]],"date-time":"1993-02-01T00:00:00Z","timestamp":728524800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["SIMULATION"],"published-print":{"date-parts":[[1993,2]]},"abstract":"<jats:p> Accurate circuit modeling and simulation of Silicon-on-Insulator (SOI) enhancement and depletion Junction Field-Effect transis tors (JFETs) is presented. The nonuniformity in FET device parameters along the channel depth (due to fabrication processes), is taken into account. This is typical in SOI and other thin-film struc tures. Since SOI fabrication processes parameters are represented, in our model, by a closed form mobility variation, improved model accuracy is guaranteed. Simulation results are found to be within less than 3% of actual measurements. Small-signal circuit-model parameters are determined for SOI FJETs and then evaluated for further logic applications. Inverters with a channel Enhancenient-JFET (E-JFET) drivers and n- channel depletion-JFET loads (E\/D invert ers) are also considered with different supply voltage values, device parameters and digital applications. <\/jats:p>","DOI":"10.1177\/003754979306000206","type":"journal-article","created":{"date-parts":[[2008,3,29]],"date-time":"2008-03-29T17:23:43Z","timestamp":1206811423000},"page":"113-126","source":"Crossref","is-referenced-by-count":0,"title":["Process-Dependent Circuit Modeling and Simulation of SOI JFETs: Digital VLSI Applications"],"prefix":"10.1177","volume":"60","author":[{"given":"Hoda S.","family":"Abdel-Aty-Zohdy","sequence":"first","affiliation":[{"name":"Microelectronics Systems Design Laboratory Department of Electrical and Systems Engineering, Oakland University Rochester, Michigan 48309-4401"}]},{"given":"Ihab E.","family":"Talkhan","sequence":"additional","affiliation":[{"name":"Microelectronics Systems Design Laboratory Department of Electrical and Systems Engineering, Oakland University Rochester, Michigan 48309-4401"}]}],"member":"179","published-online":{"date-parts":[[1993,2,1]]},"reference":[{"key":"atypb1","unstructured":"I.E. Talkhan and H.S. Abdel-Aty-Zohdy, \"An Accurate Model for Normally-off JFETs Circuit Simulation, Based on An Optimization Approach to Define Mobility in SOS Structures,\" Proceedings of the Twenty-First Annual Pittsburgh Conference on Modeling and Simulation , Pittsburgh, Pennsylvania, pp. 1781-1787,1990."},{"volume-title":"IASTED, Proceedings of the International Conference and Exhibition on Computers, Electronics, Communication and Control","author":"H.S. Abdel-Aty-Zohdy","key":"atypb2"},{"key":"atypb3","doi-asserted-by":"publisher","DOI":"10.1109\/16.2461"},{"key":"atypb4","doi-asserted-by":"publisher","DOI":"10.1109\/16.2462"},{"volume-title":"VLSI Technology","year":"1988","author":"S.M. 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