{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T13:36:20Z","timestamp":1777901780534,"version":"3.51.4"},"reference-count":10,"publisher":"SAGE Publications","issue":"3","license":[{"start":{"date-parts":[[1993,9,1]],"date-time":"1993-09-01T00:00:00Z","timestamp":746841600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["SIMULATION"],"published-print":{"date-parts":[[1993,9]]},"abstract":"<jats:p>\n                    In this paper, we present parallel algorithms for logic and fault simulation, developed for and implemented on the Cray Y-MP supercomputer, a general purpose shared- memory parallel machine with vector processors. The parallel-and-vector version of the event-driven logic simulation algorithm achieves a speedup of 52 on the Cray Y-MP with 8 processors, with a maximum performance of about 2 million events per second. These results are comparable to the performance of hardware simulation engines and can be implemented on other parallel machines without major modifications. The second algorithm is a parallel and vector version of the parallel fault simulation algorithm. Experimental results on benchmark circuits [1] show that very high evaluation rates (20 to 32\u00d710\n                    <jats:sup>9<\/jats:sup>\n                    evaluations\/s.) can be achieved. Speedup factors of 45 to 69 are observed between the scalar and the parallel and vector execution of the fault simulator.\n                  <\/jats:p>","DOI":"10.1177\/003754979306100304","type":"journal-article","created":{"date-parts":[[2008,3,29]],"date-time":"2008-03-29T13:23:43Z","timestamp":1206797023000},"page":"161-168","source":"Crossref","is-referenced-by-count":1,"title":["Parallel and Vector Logic and Fault Simulation Algorithms on the Cray Y-MP Supercomputer"],"prefix":"10.1177","volume":"61","author":[{"given":"Abdulla","family":"Bataineh","sequence":"first","affiliation":[{"name":"Cray Research Inc. Eagan, MN 55121"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F\u00fcsun","family":"\u00d6zg\u00fcner","sequence":"additional","affiliation":[{"name":"Dept. of Electrical Engineering The Ohio State University Columbus, OH 43210"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Imre","family":"Szauter","sequence":"additional","affiliation":[{"name":"AT&T Bell Laboratories Columbus, OH 43213"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"179","published-online":{"date-parts":[[1993,9,1]]},"reference":[{"key":"atypb1","volume-title":"Proc. IEEE Int. Symp. Circuits Syst.; Special Session on ATPG and Fault Simulation, June","author":"Brglez, F."},{"key":"atypb2","unstructured":"Levendel, Y. and P.R. Menon, \"Fault simulation,\" in Fault-Tolerant Computing: Theory and Techniques (D. K. Pradhan, ed.), pp. 184-264, Prentice-Hall, 1986."},{"key":"atypb3","doi-asserted-by":"publisher","DOI":"10.1109\/54.43078"},{"key":"atypb4","volume-title":"Proceedings of the 19th DAC","author":"Denneau, M."},{"key":"atypb5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1984.5005647"},{"key":"atypb6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270276"},{"key":"atypb7","doi-asserted-by":"publisher","DOI":"10.1109\/43.44516"},{"key":"atypb8","volume-title":"in Proceedings of the 17th DAC, June","author":"Ulrich, E."},{"key":"atypb9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-95424-5"},{"key":"atypb10","first-page":"2","author":"Greer, D.L.","year":"1987","journal-title":"VLSI Systems Design"}],"container-title":["SIMULATION"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/003754979306100304","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/003754979306100304","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T11:09:03Z","timestamp":1777633743000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/003754979306100304"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,9]]},"references-count":10,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1993,9]]}},"alternative-id":["10.1177\/003754979306100304"],"URL":"https:\/\/doi.org\/10.1177\/003754979306100304","relation":{},"ISSN":["0037-5497","1741-3133"],"issn-type":[{"value":"0037-5497","type":"print"},{"value":"1741-3133","type":"electronic"}],"subject":[],"published":{"date-parts":[[1993,9]]}}}