{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T16:01:24Z","timestamp":1777910484344,"version":"3.51.4"},"reference-count":34,"publisher":"SAGE Publications","issue":"10","license":[{"start":{"date-parts":[[2018,12,3]],"date-time":"2018-12-03T00:00:00Z","timestamp":1543795200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"funder":[{"DOI":"10.13039\/501100001809","name":"The National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61373104"],"award-info":[{"award-number":["61373104"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"The National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61402330"],"award-info":[{"award-number":["61402330"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"The National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61405143"],"award-info":[{"award-number":["61405143"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"The National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61601324"],"award-info":[{"award-number":["61601324"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"The Natural Science Foundation of Tianjin Municipal Science and Technology Commission","award":["15JCQNJC01500"],"award-info":[{"award-number":["15JCQNJC01500"]}]}],"content-domain":{"domain":["journals.sagepub.com"],"crossmark-restriction":true},"short-container-title":["Transactions of the Institute of Measurement and Control"],"published-print":{"date-parts":[[2019,6]]},"abstract":"<jats:p>Electrical impedance tomography (EIT) is a new medical imaging technology that is used to estimate changes in the internal conductivity based on measurements of the border voltage disturbance. However, the generalized inverse operator of image reconstruction for EIT is ill-posed and ill-conditioned. In order to improve reconstruction quality, the structured sparse representation is integrated into the iterative process of the Symkaczmarz algorithm for EIT image reconstruction in this paper. The sparsity prior and the underlying structure characteristics of conductivity reconstruction are considered in the proposed algorithm. Both simulation and experiment results indicate that the proposed method has feasibility for pulmonary ventilation imaging and great potential for improving the image quality.<\/jats:p>","DOI":"10.1177\/0142331218812563","type":"journal-article","created":{"date-parts":[[2018,12,3]],"date-time":"2018-12-03T11:06:00Z","timestamp":1543835160000},"page":"2803-2815","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":4,"title":["An image reconstruction algorithm for electrical impedance tomography using Symkaczmarz based on structured sparse representation"],"prefix":"10.1177","volume":"41","author":[{"given":"Qi","family":"Wang","sequence":"first","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jing","family":"He","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianming","family":"Wang","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiuyan","family":"Li","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaojie","family":"Duan","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pengcheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaojing","family":"Chen","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yukuan","family":"Sun","sequence":"additional","affiliation":[{"name":"Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin Polytechnic University, China"},{"name":"School of Electronics and Information Engineering, Tianjin Polytechnic University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"179","published-online":{"date-parts":[[2018,12,3]]},"reference":[{"key":"bibr1-0142331218812563","first-page":"196","volume":"3813","author":"Baraniuk RG","year":"1999","journal-title":"Proceedings of SPIE - The International Society for Optical Engineering"},{"key":"bibr2-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2010.2040894"},{"key":"bibr3-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1090\/S0002-9947-03-03136-2"},{"key":"bibr4-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/12\/8\/301"},{"key":"bibr5-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1016\/j.mri.2014.07.016"},{"key":"bibr6-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2002.800572"},{"key":"bibr7-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1118\/1.1995712"},{"key":"bibr8-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"bibr9-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2011.09.035"},{"key":"bibr10-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1016\/B978-012279670-8.50009-4"},{"key":"bibr11-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2006.881518"},{"key":"bibr12-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2011.09.039"},{"key":"bibr13-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/18\/11\/017"},{"key":"bibr14-0142331218812563","first-page":"319","volume":"3","author":"Hong-Sun FU","year":"2011","journal-title":"Journal of Natural Science of Heilongjiang University"},{"issue":"6","key":"bibr15-0142331218812563","first-page":"1578","volume":"89","author":"Hoon KJ","year":"2006","journal-title":"IEICE Transactions on Fundamentals of Electronics Communications & Computer Sciences"},{"issue":"7","key":"bibr16-0142331218812563","first-page":"3371","volume":"12","author":"Huang J","year":"2011","journal-title":"Journal of Machine Learning Research"},{"key":"bibr17-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1118\/1.1455742"},{"key":"bibr18-0142331218812563","first-page":"1","author":"Maihami V","year":"2016","journal-title":"Artificial Intelligence Review"},{"key":"bibr19-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1007\/s10527-012-9292-7"},{"key":"bibr20-0142331218812563","doi-asserted-by":"crossref","unstructured":"Raparia D, Alessi J, Kponou A (1997) In: Proceedings of the Particle Accelerator Conference, Algebraic Reconstruction Technique (ART), Vol. 2, Vancouver, BC, Canada, 16 May 1997, 2023\u20132025. USA: IEEE.","DOI":"10.1109\/PAC.1997.751094"},{"key":"bibr21-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2010.2090538"},{"key":"bibr22-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/004"},{"key":"bibr23-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2040551"},{"key":"bibr24-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/31\/4\/045004"},{"key":"bibr25-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1007\/s00041-008-9030-4"},{"key":"bibr26-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/33\/5\/719"},{"key":"bibr27-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2007.909108"},{"key":"bibr28-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2012.05.027"},{"key":"bibr29-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1063\/1.4760253"},{"key":"bibr30-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1097\/CCM.0b013e3182771516"},{"issue":"4","key":"bibr31-0142331218812563","first-page":"478","volume":"14","author":"Yang WQ","year":"2003","journal-title":"Journal of Southeast University"},{"key":"bibr32-0142331218812563","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2701098"},{"issue":"1","key":"bibr33-0142331218812563","first-page":"89","volume":"64","author":"Ye J","year":"2014","journal-title":"IEEE Transactions on Instrumentation & Measurement"},{"key":"bibr34-0142331218812563","doi-asserted-by":"crossref","unstructured":"Zhou L, Harrach B, Jin KS (2017) Monotonicity-based electrical impedance tomography for lung imaging. 34(4): 045005","DOI":"10.1088\/1361-6420\/aaaf84"}],"container-title":["Transactions of the Institute of Measurement and Control"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/0142331218812563","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/full-xml\/10.1177\/0142331218812563","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/0142331218812563","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T14:58:38Z","timestamp":1777647518000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/0142331218812563"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12,3]]},"references-count":34,"journal-issue":{"issue":"10","published-print":{"date-parts":[[2019,6]]}},"alternative-id":["10.1177\/0142331218812563"],"URL":"https:\/\/doi.org\/10.1177\/0142331218812563","relation":{},"ISSN":["0142-3312","1477-0369"],"issn-type":[{"value":"0142-3312","type":"print"},{"value":"1477-0369","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,12,3]]}}}